Cited by 86Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesLow-power high-performance VLSI design

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

29.1 A 40nm 64Kb 56.67TOPS/W Read-Disturb-Tolerant Compute-in-Memory/Digital RRAM Macro with Active-Feedback-Based Read and In-Situ Write Verification

Yoon, Jong-Hyeok, Chang, Muya, Khwa, Win-San, Chih, Yu-Der, Chang, Meng-Fan, Raychowdhury, Arijit·2021·2021 IEEE International Solid- State Circuits Conference (ISSCC)

Abstract

As memory-centric workloads (AI, graph-analytics) continue to gain momentum, technology solutions that provide higher on-die memory capacity/bandwidth can provide scalability beyond SRAM. Resistive RAM (RRAM) owing to (1) higher bit-density (2-4× of SRAM), (2) CMOS process/voltage compatibility, (3) nano-second read (RD) and (4) non-volatility has emerged as a promising candidate [1]. In spite of early prototypes, several technology challenges remain, and need to be addressed through circuit-technology co-design [1]. This paper presents a 64Kb RRAM macro supporting: (1) a programmable (1 to 9) number of row-accesses (N) to enable vector-matrix multiplication (referred to as compute-in-memory, or CIM) for a target algorithm-level inference-accuracy [2] -[8], (2) voltage-based RD with active feedback, advancing the state-of-the-art current-based RD, targeted for the low ratio between the high-resistance-state (HRS) and low-resistance-state (LRS) in typical RRAM, (3) RD-disturb tolerance under RRAM drift, through embedded RD-disturb monitor and write (WR)-back and (4) in-situ WR verification to enable a tight resistance distribution.

Overview

Integrity signals

Registry

Crossref · 10.1109/isscc42613.2021.9365926

Cites

1 of 1 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Most compute-in-memory or near-memory approaches based on SRAMs and digital compute do not address the energy and time costs of reloading weights, making direct side-by-side comparisons against NVM-based weight-stationary approaches difficult; several NVM compute-in-memory studies have focused on the macro-level without accounting for data transport, control or chip infrastructure costs, and are,

    “Although several compute-in-memory or near-memory approaches based on SRAMs and digital compute35–38 have been presented in the literature, most of these do not address the energy and time costs of reloading weights, thus making direct side-by-side comparisons against NVM-based weight-stationary approaches difficult.”

Citations

Cites

Flagged first, then by citations

Research works printed but not linked: 7

  1. 10.1109/ISSCC.2019.8662395 · DOI
  2. 10.1109/ISSCC.2019.8662419 · DOI
  3. 10.1109/ISSCC19947.2020.9062979 · DOI
  4. 10.1109/MDAT.2020.3016587 · DOI
  5. 10.1109/VLSICircuits18222.2020.9162878 · DOI
  6. 10.1109/ISSCC.2018.8310400 · DOI
  7. 10.1109/IEDM.2016.7838346 · DOI

Cited by

Sorted by citations

Metadata

Authors
Yoon, J.-H., Chang, M., Khwa, W.-S., Chih, Y.-D., Chang, M.-F., & Raychowdhury, A.
Affiliations
  • Georgia Institute of Technology (US)
  • Taiwan Semiconductor Manufacturing Company (Taiwan) (TW)
Venue
2021 IEEE International Solid- State Circuits Conference (ISSCC)
Publisher
IEEE
Published
2021-02-13
Pages
404-406
ISSN
0193-6530 (ISSN-L)
OpenAlex
W3135839634
Cited by
86
References
1
Citations by year
2026: 3 · 2025: 13 · 2024: 15 · 2023: 16 · 2022: 29 · 2021: 10
FWCI
27.47
Type
conference paper
Language
en
Open access
closed
Locations
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference (publishedVersion)
Funders
Semiconductor Research Corporation
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
Keywords
resistive random access memory, in-memory computing, write-back, memory-centric computing, matrix-vector multiplication, 40-nm CMOS, resistance distribution

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review