Physical random number generator based on MOS structure after soft breakdown
Open accessAbstract
We present a novel physical random number generator (RNG) that uses a metal-oxide semiconductor (MOS) capacitor after soft breakdown (SBD) as a random source. It is known that the electrical properties of MOS capacitors after SBD show large fluctuation. When the resistor in an astable multivibrator is replaced with an MOS capacitor after SBD, the multivibrator converts the noise signal into a rectangular wave whose period fluctuates randomly. A 1-bit counter and a flip-flop are used to generate random numbers from the fluctuating rectangular wave. Some high-level tests indicate that the generated random numbers have excellent quality for cryptographic applications. Even though our circuit is small and can be constructed using about 20 complementary-MOS logic gates and several passive devices, high-quality random numbers such as those generated by large physical RNGs can be obtained.
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All prior true random number generators have suffered from drawbacks in scalability, circuit complexity, or reliance on post-processing such as a Von Neumann corrector to remove bias.
“However, all prior TRNGs have suffered from drawbacks in scalability, circuit complexity, or relied on post-processing such as a “Von Neumann corrector” to remove bias from the generated bit sequences4–13.”
From A novel true random number generator based on a stochastic diffusive memristor (2017) · cites this paper as [8]
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A novel true random number generator based on a stochastic diffusive memristor
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- Authors
- Yasuda, S., Satake, H., Tanamoto, T., Ohba, R., Uchida, K., & Fujita, S.
- Affiliations
- Toshiba (Japan) (JP)
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 2004-08
- Volume
- 39
- Issue
- 8
- Pages
- 1375-1377
- ISSN
- 0018-9200 (ISSN-L)
- OpenAlex
- W2031590600
- Cited by
- 46
- References
- 8
- Citations by year
- 2025: 5 · 2024: 3 · 2023: 5 · 2022: 5 · 2021: 3 · 2020: 3 · 2019: 3 · 2018: 1 · 2017: 4 · 2016: 3 · 2014: 2 · 2012: 2
- FWCI
- 1.57
- Type
- journal article
- Language
- en
- Open access
- Locations
- IEEE Journal of Solid-State Circuits (publishedVersion)
- Institutional Repositories DataBase (IRDB) (submittedVersion, cc-by-nc-nd)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Keywords
- physical random number generators, MOS capacitors, soft breakdown, astable multivibrator, random number quality, cryptographic applications, CMOS circuit design, flip-flops
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