A high-speed oscillator-based truly random number source for cryptographic applications on a smartcard IC
Abstract
The design of a high-speed IC random number source macro-cell, suitable for integration in a smart card microcontroller, is presented. The oscillator sampling technique is exploited and a jittered oscillator which features an amplified thermal noise source has been designed in order to increase the output throughput and the statistical quality of the generated bit sequences. The oscillator feedback loop acts as an offset compensation for the noise amplifier, thus solving one of the major issues in this kind of circuit. A numerical model for the proposed system has been developed which allows us to carry out an analytical expression for the transition probability between successive bits in the output stream. A prototype chip has been fabricated in a standard digital 0.18 /spl mu/m n-well CMOS process which features a 10 Mbps throughput and fulfills the NIST FIPS and correlation-based tests for randomness. The macro-cell area, excluding pads, is 0.0016 mm/sup 2/ (184 /spl mu/m /spl times/ 86 /spl mu/m) and a 2.3 mW power consumption has been measured.
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Coupled-oscillator TRNGs can be designed purely digital and without an amplifier, but precisely matching the period of coupled oscillators is hard and frequency drift makes them not robust.
“TRNGs based on coupled oscillator can be designed purely digital and without amplifier.Subsequently, some researches realized it and provided some methods to enhance its performance [23], [37], [51].However, precisely matching the period of coupled oscillators is quite hard and two signals of frequency oscillators may drift relative to one another.These don't make for very robust TRNG designs.”
From True Random Number Generators Using Electrical Noise (2019) · cites this paper as [37]
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“Subsequently, some researches realized it and provided some methods to enhance its performance [23], [37], [51].”
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- Authors
- Bucci, M., Germani, L., Luzzi, R., Trifiletti, A., & Varanonuovo, M.
- Affiliations
- Infineon Technologies (Austria) (AT)
- Sapienza University of Rome (IT)
- ORCID
- Trifiletti, A.
- Venue
- IEEE Transactions on Computers
- Published
- 2003-04
- Volume
- 52
- Issue
- 4
- Pages
- 403-409
- ISSN
- 0018-9340 (ISSN-L)
- OpenAlex
- W2098543956
- Cited by
- 403
- References
- 0
- Citations by year
- 2026: 12 · 2025: 16 · 2024: 15 · 2023: 12 · 2022: 16 · 2021: 19 · 2020: 17 · 2019: 31 · 2018: 23 · 2017: 40 · 2016: 22 · 2015: 21 · 2014: 17 · 2013: 17 · 2012: 16
- FWCI
- 10.52
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEEE Transactions on Computers (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Physical Sciences › Computer Science › Artificial Intelligence › Cryptographic Implementations and Security
- Keywords
- random number generation, thermal noise, offset cancellation, smart cards, cryptographic hardware, randomness testing
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