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NVSim: A Circuit-Level Performance, Energy, and Area Model for Emerging Nonvolatile Memory

Xiangyu Dong, Cong Xu, Yuan Xie, Jouppi, N. P.·2012·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Abstract

Various new nonvolatile memory (NVM) technologies have emerged recently. Among all the investigated new NVM candidate technologies, spin-torque-transfer memory (STT-RAM, or MRAM), phase-change random-access memory (PCRAM), and resistive random-access memory (ReRAM) are regarded as the most promising candidates. As the ultimate goal of this NVM research is to deploy them into multiple levels in the memory hierarchy, it is necessary to explore the wide NVM design space and find the proper implementation at different memory hierarchy levels from highly latency-optimized caches to highly density- optimized secondary storage. While abundant tools are available as SRAM/DRAM design assistants, similar tools for NVM designs are currently missing. Thus, in this paper, we develop NVSim, a circuit-level model for NVM performance, energy, and area estimation, which supports various NVM technologies, including STT-RAM, PCRAM, ReRAM, and legacy NAND Flash. NVSim is successfully validated against industrial NVM prototypes, and it is expected to help boost architecture-level NVM-related studies.

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Metadata

Authors
Dong, X., Xu, C., Xie, Y., & Jouppi, N. P.
Venue
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
2012-07
Volume
31
Issue
7
Pages
994-1007
ISSN
  • 0278-0070 (ISSN-L)
  • 1937-4151
OpenAlex
W2010202670
Cited by
1,217
References
2
FWCI
41.51
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: NVSim: A Circuit-Level Performance, Energy, and Area Model for Emerging Nonvolatile Memory. https://app.cochat.ai/papers/10.1109/tcad.2012.2185930
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Dong, X., Xu, C., Xie, Y., & Jouppi, N. P. (2012). NVSim: A Circuit-Level Performance, Energy, and Area Model for Emerging Nonvolatile Memory. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. https://doi.org/10.1109/tcad.2012.2185930

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