Cited by 3,885Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesPhase-change materials and chalcogenides

Memristive devices for computing

Yang, J. Joshua, Strukov, Dmitri B., Stewart, Duncan R.·2013·Nature Nanotechnology

Abstract

Memristive devices are electrical resistance switches that can retain a state of internal resistance based on the history of applied voltage and current. These devices can store and process information, and offer several key performance characteristics that exceed conventional integrated circuit technology. An important class of memristive devices are two-terminal resistance switches based on ionic motion, which are built from a simple conductor/insulator/conductor thin-film stack. These devices were originally conceived in the late 1960s and recent progress has led to fast, low-energy, high-endurance devices that can be scaled down to less than 10 nm and stacked in three dimensions. However, the underlying device mechanisms remain unclear, which is a significant barrier to their widespread application. Here, we review recent progress in the development and understanding of memristive devices. We also examine the performance requirements for computing with memristive devices and detail how the outstanding challenges could be met.

Integrity signals

Registry

Crossref · 10.1038/nnano.2012.240

Cites

167 of 167 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Related challenges for in-memory computing are achieving higher computational precision, inherent stochastic switching of devices and their impacts on reliability, and levels of parallelism.

    “Related challenges are achieving higher computational precision [50, 51], inherent stochastic switching of devices and their impacts on reliability [52, 53], and levels of parallelism [54].”
  • The results obtained with memristive devices based on cation migration inside a solid-state electrolyte can be generalized to other cation or anion based memristive systems.

    “but the results can be generalized to other cation (5) or anion (e.g. oxygen vacancy in oxides) (6) based memristive systems as well.”

Cites

Flagged first, then by citations

1 of the 168 references couldn’t be matched to a known paper.

Cited by

Sorted by citations

Authors
Yang, J. J., Strukov, D. B., & Stewart, D. R.
Affiliations
  • Hewlett-Packard (United States) (US)
  • University of California, Santa Barbara (US)
  • National Research Council Canada (CA)
Corresponding author
  • Yang, J. Joshua
  • Strukov, Dmitri B.
  • Stewart, Duncan R.
Venue
Nature Nanotechnology
Published
2012-12-27
Volume
8
Issue
1
Pages
13-24
ISSN
  • 1748-3387 (ISSN-L)
  • 1748-3395
OpenAlex
W2018774711
Cited by
3,885
References
168
Citations by year
2026: 259 · 2025: 245 · 2024: 248 · 2023: 290 · 2022: 307 · 2021: 331 · 2020: 390 · 2019: 336 · 2018: 338 · 2017: 314 · 2016: 299 · 2015: 226 · 2014: 200 · 2013: 99 · 2012: 1
FWCI
107.49
Type
journal article
Language
en
Open access
closed
Locations
  • Nature Nanotechnology (publishedVersion)
  • PubMed (publishedVersion)
  • NPARC (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
  • Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
Keywords
memristors, ion dynamics, in-memory computing, device scaling, endurance, energy-efficient computing

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review