Modeling CMOS Ring Oscillator Performance<newline/> as a Randomness Source
Abstract
In order to maximize randomness of CMOS Ring Oscillators (RO) used in Random Number Generators (RNG), possibility of weak inversion operation of CMOS transistors is investigated. To predict weak inversion noise performance of RO, phase noise and jitter models of a CMOS RO in weak inversion operating region are obtained. Differential Ring Oscillator (DRO) and Inverter-based Ring Oscillator (IbRO) cases are both investigated. For each case, the model covers the flicker and the white noise component of phase noise and jitter. The derived models are verified by measurement results. 0.25$\mu$m standard CMOS process has been used with a supply voltage of 0.7 V for DRO and 0.5 V for IbRO. Furthermore, phase noise and jitter behavior of a CMOS RO in strong and weak inversion region are compared through analytical models, simulations, and measurements. Even though white noise component of phase noise uses two different models for weak and strong inversion regions of operation, these two models exhibit continuity. Flicker noise component in weak inversion is much lower than the one in strong inversion, which also reduces the corner frequency. For a fair comparison of randomness performances, a randomness parameter is defined and randomness equations are derived for each case.
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Some researches manifest flicker noise has an effect on random number generation, but these researches are insufficient to make an interpretation confidently.
“And some researches manifest flicker noise has effect on random number generation [38], [39], while these researches are insufficient to make an interpretation confidently.”
From True Random Number Generators Using Electrical Noise (2019) · cites this paper as [38]
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True Random Number Generators Using Electrical Noise
Gong, L., Zhang, J., Liu, H., Sang, L., & Wang, Y. (2019) · IEEE Access · doi:10.1109/access.2019.2939027 · Cited by 77 · see citing works
“based TRNGs, Ülkühan Güler derived randomness equations and defined randomness parameter [38].”
BackgroundMethodGuler, U., Pusane, A. E., & Dundar, G. (2014) · 2014 International Conference on Information Science, Electronics and Electrical Engineering · doi:10.1109/infoseee.2014.6947786 · Cited by 9 · see citing works
- Authors
- Guler, U., & Dundar, G.
- Venue
- IEEE Transactions on Circuits and Systems I: Regular Papers
- Published
- 2014-03
- Volume
- 61
- Issue
- 3
- Pages
- 712-724
- ISSN
- 1549-8328 (ISSN-L)
- 1558-0806
- OpenAlex
- W2104004623
- Cited by
- 25
- References
- 20
- Citations by year
- 2026: 1 · 2024: 2 · 2023: 1 · 2022: 1 · 2021: 2 · 2020: 4 · 2019: 2 · 2018: 1 · 2017: 5 · 2016: 3 · 2015: 1 · 2014: 2
- FWCI
- 1.20
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEEE Transactions on Circuits and Systems I Regular Papers (publishedVersion)
- Funders
- International Brain Research Organization
- ExxonMobil Research and Engineering Company
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in PLL and VCO Technologies
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Radio Frequency Integrated Circuit Design
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Keywords
- CMOS ring oscillator, random number generators, weak inversion, phase noise, jitter, differential ring oscillator, 1/f noise, white noise, low-voltage operation, strong inversion
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