Jitter in ring oscillators
Abstract
Jitter in ring oscillators is theoretically described, and predictions are experimentally verified. A design procedure is developed in the context of time domain measures of oscillator jitter in a phase-locked loop (PLL). A major contribution is the identification of a design figure of merit /spl kappa/, which is independent of the number of stages in the ring. This figure of merit is used to relate fundamental circuit-level noise sources (such as thermal and shot noise) to system-level jitter performance. The procedure is applied to a ring oscillator composed of bipolar differential pair delay stages. The theoretical predictions are tested on 155 and 622 MHz clock-recovery PLL's which have been fabricated in a dielectrically isolated, complementary bipolar process. The measured closed-loop jitter is within 10% of the design procedure prediction.
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- Authors
- McNeill, J. A.
- Affiliations
- Worcester Polytechnic Institute (US)
- Corresponding author
- McNeill, J.A.
- ORCID
- McNeill, J.A.
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 1997-06
- Volume
- 32
- Issue
- 6
- Pages
- 870-879
- ISSN
- 0018-9200 (ISSN-L)
- OpenAlex
- W2119123494
- Cited by
- 342
- References
- 40
- Citations by year
- 2026: 3 · 2025: 1 · 2024: 9 · 2023: 11 · 2022: 10 · 2021: 11 · 2020: 3 · 2019: 12 · 2018: 10 · 2017: 10 · 2016: 5 · 2015: 8 · 2014: 15 · 2013: 15 · 2012: 10
- FWCI
- 8.51
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEEE Journal of Solid-State Circuits (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in PLL and VCO Technologies
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Radio Frequency Integrated Circuit Design
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Keywords
- ring oscillator, jitter, phase-locked loop, clock recovery, thermal noise, shot noise, bipolar integrated circuits
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