Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 220

The DOI matches its Crossref record.

Improving SiC JFET Switching Behavior Under Influence of Circuit Parasitics

Josifovic, Ivan, Popovic-Gerber, Jelena, Ferreira, Jan Abraham·2012·IEEE Transactions on Power Electronics

Abstract

This paper investigates the switching behavior of normally OFF silicon carbide (SiC) JFETs in an inverter for a motor drive. The parasitic ringing caused by different parasitic effects is analyzed. Two different methods, the use of an RC snubber and the use of suppression ferrite component, are investigated for dampening the parasitic oscillations. It is found that applying a ferrite bead not only dampens the parasitic oscillations, but also results in significantly lower switching losses. Furthermore, it is shown that the capacitive coupling between SiC devices in the bridge leg and heat sinks significantly deteriorates the JFETs’ switching performance. The effect of two substrates, an insulated metal substrate and a printed circuit board, on the capacitive coupling is investigated. A method in which the use of two separate heat spreaders minimizes the capacitive coupling, thus, exploiting the full potential of fast SiC JFETs is proposed.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1109/tpel.2012.2185951

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 220

Metadata

Authors
Josifovic, I., Popovic-Gerber, J., & Ferreira, J. A.
Venue
IEEE Transactions on Power Electronics
Published
2012-08
Volume
27
Issue
8
Pages
3843-3854
ISSN
  • 0885-8993 (ISSN-L)
  • 1941-0107
OpenAlex
W1989151762
Cited by
220
References
0
FWCI
12.41
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Improving SiC JFET Switching Behavior Under Influence of Circuit Parasitics. https://app.cochat.ai/papers/10.1109/tpel.2012.2185951
The paper
Josifovic, I., Popovic-Gerber, J., & Ferreira, J. A. (2012). Improving SiC JFET Switching Behavior Under Influence of Circuit Parasitics. IEEE Transactions on Power Electronics. https://doi.org/10.1109/tpel.2012.2185951

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.