The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
An experimental study of data retention behavior in modern DRAM devices: implications for retention time profiling mechanisms
Abstract
DRAM cells store data in the form of charge on a capacitor. This charge leaks off over time, eventually causing data to be lost. To prevent this data loss from occurring, DRAM cells must be periodically refreshed. Unfortunately, DRAM refresh operations waste energy and also degrade system performance by interfering with memory requests. These problems are expected to worsen as DRAM density increases.
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Citations
Cites
RAIDR: Retention-Aware Intelligent DRAM Refresh
Liu, J., Jaiyen, B., Veras, R., & Mutlu, O. (2012) · ACM SIGARCH Computer Architecture News · doi:10.1145/2366231.2337161 · Cited by 444
Self-citationOn the retention time distribution of dynamic random access memory (DRAM)
Hamamoto, T., Sugiura, S., & Sawada, S. (1998) · IEEE Transactions on Electron Devices · doi:10.1109/16.678551 · Cited by 242
Retention-Aware Placement in DRAM (RAPID): Software Methods for Quasi-Non-Volatile DRAM
Venkatesan, R. K., Herr, S., & Rotenberg, E. (2006) · The Twelfth International Symposium on High-Performance Computer Architecture, 2006. · doi:10.1109/hpca.2006.1598122 · Cited by 215
RAIDR: Retention-aware intelligent DRAM refresh
Liu, J., Jaiyen, B., Veras, R., & Mutlu, O. (2012) · 2012 39th Annual International Symposium on Computer Architecture (ISCA) · doi:10.1109/isca.2012.6237001 · Cited by 180
Self-citationDRAM Circuit Design: Fundamental and High-Speed Topics
Keeth, B., Baker, R. J., Johnson, B., & Lin, F. (2007) · Cited by 118
Restle, Park, & Lloyd (1992) · Technical digest - International Electron Devices Meeting/Technical digest · doi:10.1109/iedm.1992.307481 · Cited by 115
Optimizing the DRAM refresh count for merged DRAM/logic LSIs
Ohsawa, T., Kai, K., & Murakami, K. J. (1998) · International Symposium on Low Power Electronics and Design (ISLPED) · doi:10.1145/280756.280792 · Cited by 91
A meta-stable leakage phenomenon in DRAM charge storage —Variable hold time
Yaney, D. S., Lu, C., Kohler, R. A., Kelly, M. J., & Nelson, J. T. (1987) · Technical digest - International Electron Devices Meeting/Technical digest · doi:10.1109/iedm.1987.191425 · Cited by 76
Horiguchi, M., & Itoh, K. (2011) · Integrated circuits and systems · doi:10.1007/978-1-4419-7958-2 · Cited by 74
An investigation into crosstalk noise in DRAM structures
Redeker, M., Cockburn, B. F., & Elliott, D. G. (2003) · Records of the IEEE International Workshop on Memory Technology, Design, and Testing · doi:10.1109/mtdt.2002.1029773 · Cited by 59
Cited by
Flipping bits in memory without accessing them: An experimental study of DRAM disturbance errors
Kim, Y., Daly, R., Kim, J., Fallin, C., Lee, J. H., Lee, D., Wilkerson, C., Lai, K., & Mutlu, O. (2014) · 2014 ACM/IEEE 41st International Symposium on Computer Architecture (ISCA) · doi:10.1109/isca.2014.6853210 · Cited by 465
Self-citationOpportunities for Nonvolatile Memory Systems in Extreme-Scale High-Performance Computing
Vetter, J. S., & Mittal, S. (2015) · Computing in Science & Engineering · doi:10.1109/mcse.2015.4 · Cited by 95
Buddy-RAM: Improving the Performance and Efficiency of Bulk Bitwise Operations Using DRAM
Seshadri, V., Lee, D., Mullins, T., Hassan, H., Boroumand, A., Kim, J., Kozuch, M. A., Mutlu, O., Gibbons, P. B., & Mowry, T. C. (2016) · arXiv · doi:10.48550/arxiv.1611.09988 · Cited by 54
Self-citation
Metadata
- Authors
- Liu, J., Jaiyen, B., Kim, Y., Wilkerson, C., & Mutlu, O.
- Venue
- Proceedings of the 40th Annual International Symposium on Computer Architecture
- Publisher
- ACM
- Published
- 2013-06-23
- Pages
- 60-71
- ISSN
- 1063-6897 (ISSN-L)
- OpenAlex
- W1970426108
- Cited by
- 279
- References
- 11
- FWCI
- 19.72
- Type
- conference paper
- Language
- en
- Open access
- closed
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- Liu, J., Jaiyen, B., Kim, Y., Wilkerson, C., & Mutlu, O. (2013). An experimental study of data retention behavior in modern DRAM devices: implications for retention time profiling mechanisms. Proceedings of the 40th Annual International Symposium on Computer Architecture. https://doi.org/10.1145/2485922.2485928
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
