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A sub-constant error-probability low-degree test, and a sub-constant error-probability PCP characterization of NP

Raz, Ran, Safra, Shmuel·1997·Proceedings of the twenty-ninth annual ACM symposium on Theory of computing - STOC '97

Abstract

We introduce a new low-degree--test, one that uses the restriction of low-degree polynomials to planes (i.e., affine sub-spaces of dimension 2), rather than the restriction to lines (i.e., affine sub-spaces of dimension 1). We prove the new test to be of a very small errorprobability (in particular, much smaller than constant). The new test enables us to prove a low-error characterization of NP in terms of PCP. Specifically, our theorem states that, for any given ffl ? 0, membership in any NP language can be verified with O(1) accesses, each reading logarithmic number of bits, and such that the error-probability is 2 \\Gamma log 1\\Gammaffl n . Our results are in fact stronger, as stated below. One application of the new characterization of NP is that approximating SET-COVER to within a logarithmic factors is NP-hard. Previous analysis for low-degree-tests, as well as previous characterizations of NP in terms of PCP, have managed to achieve, with constant number of accesses, error...

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Metadata

Authors
Raz, R., & Safra, S.
Venue
Proceedings of the twenty-ninth annual ACM symposium on Theory of computing - STOC '97
Publisher
ACM Press
Published
1997
Pages
475-484
OpenAlex
W2003159902
Cited by
834
References
22
FWCI
14.13
Type
conference paper
Language
en
Open access
closed

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Raz, R., & Safra, S. (1997). A sub-constant error-probability low-degree test, and a sub-constant error-probability PCP characterization of NP. Proceedings of the twenty-ninth annual ACM symposium on Theory of computing - STOC '97. https://doi.org/10.1145/258533.258641

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