The DOI matches its Crossref record; 140 of the 140 references it cites were found in a registry or an index.
Limitations and Advances in Optical Thermal Transport Measurements: Extremes in Properties, Length Scales, and Temperature
Open accessAbstract
Conductive and radiative thermal transport play a critical role in the design, development, and performance of a wide array of technologies and applications. In this review, we focus on the challenges associated with nano- and microscale thermal measurements and the strategies developed thus far to overcome them. For measurements below ∼1,000°C, numerous thermoreflectance techniques are already in wide use; however, uncertainty and measurement error may limit the measurement of samples in certain regimes. These regimes include materials of high thermal conductivity (≳2,000 W/m·K), thin films (≲100 nm), or interfaces located well below the sample surface. A rigorous treatment of uncertainty and error is thus required for measuring these samples and for the development of future metrology tools. At higher temperatures, pyrometry techniques are being developed; however, several physical and experimental limitations exist. Some methods rely on a known emissivity for the measurement of temperature, and significant radiative transport can introduce error in modeling. Both of these mean that knowledge of spectrally dependent and temperature-dependent emissivity properties may be required.
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Metadata
- Authors
- Pfeifer, T. W., Schonfeld, H. B., Scott, E. A., Aller, H. T., Gaskins, J. T., Olson, D. H., Braun, J. L., Graham, S., & Hopkins, P. E.
- Affiliations
- University of Virginia (US)
- University of Maryland, College Park (US)
- 3Laser Thermal, Charlottesville, Virginia, USA
- Corresponding author
- Pfeifer, Thomas W.
- Schonfeld, Hunter B.
- ORCID
- Venue
- Annual Review of Materials Research
- Publisher
- Annual Reviews
- Published
- 2025-07-01
- Volume
- 55
- Issue
- 1
- Pages
- 37-70
- ISSN
- 1531-7331 (ISSN-L)
- 1545-4118
- OpenAlex
- W4409632845
- Semantic Scholar
- c96bc846970c8d5764cd9e578e9f4295679ab7f1
- Cited by
- 16
- References
- 140
- Citations by year
- 2026: 14 · 2025: 2
- FWCI
- 0.72
- Type
- journal article
- Language
- en
- Open access
- hybrid
- doi.org
- Locations
- Annual Review of Materials Research (publishedVersion, cc-by)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- thermoreflectance, pyrometry, high thermal conductivity materials, thin films, interfaces, measurement uncertainty, emissivity, radiative transfer, high-temperature measurement
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