Cited by 16Thermal properties of materialsThermal Radiation and Cooling TechnologiesThermography and Photoacoustic Techniques

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Limitations and Advances in Optical Thermal Transport Measurements: Extremes in Properties, Length Scales, and Temperature

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Pfeifer, Thomas W., Schonfeld, Hunter B., Scott, Ethan A., Aller, Henry T., Gaskins, John T., Olson, David H., Braun, Jeffrey L., Graham, Samuel, Hopkins, Patrick E.·2025·Annual Review of Materials Research

DOI 10.1146/annurev-matsci-080423-010435

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Abstract

Conductive and radiative thermal transport play a critical role in the design, development, and performance of a wide array of technologies and applications. In this review, we focus on the challenges associated with nano- and microscale thermal measurements and the strategies developed thus far to overcome them. For measurements below ∼1,000°C, numerous thermoreflectance techniques are already in wide use; however, uncertainty and measurement error may limit the measurement of samples in certain regimes. These regimes include materials of high thermal conductivity (≳2,000 W/m·K), thin films (≲100 nm), or interfaces located well below the sample surface. A rigorous treatment of uncertainty and error is thus required for measuring these samples and for the development of future metrology tools. At higher temperatures, pyrometry techniques are being developed; however, several physical and experimental limitations exist. Some methods rely on a known emissivity for the measurement of temperature, and significant radiative transport can introduce error in modeling. Both of these mean that knowledge of spectrally dependent and temperature-dependent emissivity properties may be required.

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Authors: Pfeifer, T. W., Schonfeld, H. B., Scott, E. A., Aller, H. T., Gaskins, J. T., Olson, D. H., Braun, J. L., Graham, S., & Hopkins, P. E.
Affiliations: University of Virginia (US)
University of Maryland, College Park (US)
3Laser Thermal, Charlottesville, Virginia, USA
Corresponding author: Pfeifer, Thomas W.
Schonfeld, Hunter B.
ORCID: Pfeifer, Thomas W.
Schonfeld, Hunter B.
Scott, Ethan A.
Aller, Henry T.
Gaskins, John T.
Olson, David H.
Braun, Jeffrey L.
Graham, Samuel
Hopkins, Patrick E.
Venue: Annual Review of Materials Research
Publisher: Annual Reviews
Published: 2025-07-01
Volume: 55
Issue: 1
Pages: 37-70
ISSN: 1531-7331 (ISSN-L)
1545-4118
DOI: 10.1146/annurev-matsci-080423-010435
OpenAlex: W4409632845
Semantic Scholar: c96bc846970c8d5764cd9e578e9f4295679ab7f1
Cited by: 16
References: 140
Citations by year: 2026: 14 · 2025: 2
FWCI: 0.72
Type: journal article
Language: en
Open access: hybrid
doi.org
Licence: cc-by
creativecommons.org/licenses/by/4.0/ (unspecified)
Locations: Annual Review of Materials Research (publishedVersion, cc-by)
Topics: Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
Keywords: thermoreflectance, pyrometry, high thermal conductivity materials, thin films, interfaces, measurement uncertainty, emissivity, radiative transfer, high-temperature measurement

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Limitations and Advances in Optical Thermal Transport Measurements: Extremes in Properties, Length Scales, and Temperature

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