A High Speed IC Truly Random Number Generator Based on Chaotic Sampling of Regular Waveform
Abstract
A novel random number generation method based on chaotic sampling of regular waveform is proposed. A high speed IC truly random number generator based on this method is also presented. Simulation and experimental results, verifying the feasibility of the circuit, are given. Numerical binary data obtained according to the proposed method pass the four basic tests of FIPS-140-2, while experimental data pass the full NIST-800-22 random number test suite without post-processing.
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True Random Number Generators Using Electrical Noise
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“noise on the metastable behavior [9]–[12] and amplify noise based on chaos circuits [1], [13], [14].”
Background
- Authors
- ERGÜN, S., GÜLER, Ü., & ASADA, K.
- Affiliations
- Türkiye Bilimsel ve Teknolojik Araştırma Kurumu (TR)
- The University of Tokyo (JP)
- Venue
- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
- Published
- 2011
- Volume
- E94-A
- Issue
- 1
- Pages
- 180-190
- ISSN
- 0916-8508 (ISSN-L)
- 1745-1337
- OpenAlex
- W2024167332
- Cited by
- 53
- References
- 29
- Citations by year
- 2022: 1 · 2021: 5 · 2020: 7 · 2019: 13 · 2018: 8 · 2017: 8 · 2016: 4 · 2015: 6 · 2014: 1
- FWCI
- 0.45
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Chaos-based Image/Signal Encryption
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Keywords
- integrated circuits, high-speed random number generation, NIST SP 800-22 tests, FIPS 140-2, randomness testing
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