Yang, Fei

Degradation Assessment and Precursor Identification for SiC MOSFETs Under High Temp Cycling

Ugur, E., Yang, F., Pu, S., Zhao, S., & Akin, B. (2019) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 159

A New Complete Condition Monitoring Method for SiC Power MOSFETs

Ugur, E., Xu, C., Yang, F., Pu, S., & Akin, B. (2021) · IEEE Transactions on Industrial Electronics

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 126

Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets

Yang, F., Ugur, E., & Akin, B. (2020) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 121

Temperature-Independent Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances

Farhadi, M., Yang, F., Pu, S., Vankayalapati, B. T., & Akin, B. (2021) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices

Cited by 93

A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection

Pu, S., Yang, F., Vankayalapati, B. T., Ugur, E., Xu, C., & Akin, B. (2020) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 75

Characterization of Threshold Voltage Instability Under Off-State Drain Stress and Its Impact on p-GaN HEMT Performance

Yang, F., Xu, C., & Akin, B. (2021) · IEEE Journal of Emerging and Selected Topics in Power Electronics

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Cited by 53

Development of a low-inductance SiC trench MOSFET power module for high-frequency application

Wang, Z. J., Yang, F., Campbell, S., & Chinthavali, M. (2018) · 2018 IEEE Applied Power Electronics Conference and Exposition (APEC)

Silicon Carbide Semiconductor TechnologiesElectromagnetic Compatibility and Noise Suppression

Cited by 16