Grischkowsky, D.
Oklahoma State University
18 papers on CoChatORCID 0000-0001-6460-7512
Most cited papers
- Verified
Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors
Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990) · Journal of the Optical Society of America B
Terahertz technology and applicationsLaser-Matter Interactions and Applications
Cited by 2,239
- Verified
Terahertz time-domain spectroscopy of water vapor
van Exter, M., Fattinger, C., & Grischkowsky, D. (1989) · Optics Letters
Terahertz technology and applicationsSpectroscopy and Laser Applications
Cited by 862
- Verified
Terahertz time-domain spectroscopy characterization of the far-infrared absorption and index of refraction of high-resistivity, float-zone silicon
Dai, J., Zhang, J., Zhang, W., & Grischkowsky, D. (2004) · Journal of the Optical Society of America B
Terahertz technology and applicationsLaser-Matter Interactions and Applications
Cited by 499
- Verified
Characterization of an optoelectronic terahertz beam system
van Exter, M., & Grischkowsky, D. R. (1990) · IEEE Transactions on Microwave Theory and Techniques
Terahertz technology and applicationsSuperconducting and THz Device Technology
Cited by 486
- Verified
Undistorted guided-wave propagation of subpicosecond terahertz pulses
Mendis, R., & Grischkowsky, D. (2001) · Optics Letters
Terahertz technology and applicationsSuperconducting and THz Device Technology
Cited by 456
- Verified
Terahertz beams
Fattinger, C., & Grischkowsky, D. (1989) · Applied Physics Letters
Terahertz technology and applicationsLaser-Matter Interactions and Applications
Cited by 417
- Verified
Optical and electronic properties of doped silicon from 0.1 to 2 THz
van Exter, M., & Grischkowsky, D. (1990) · Applied Physics Letters
Terahertz technology and applicationsSemiconductor materials and interfaces
Cited by 306
- Verified
Carrier dynamics of electrons and holes in moderately doped silicon
van Exter, M., & Grischkowsky, D. (1990) · Physical Review B
Terahertz technology and applicationsSemiconductor materials and interfaces
Cited by 302
- Verified
Measurements of the THz absorption and dispersion of ZnTe and their relevance to the electro-optic detection of THz radiation
Gallot, G., Zhang, J., McGowan, R. W., Jeon, T.-I., & Grischkowsky, D. (1999) · Applied Physics Letters
Terahertz technology and applicationsAdvanced Semiconductor Detectors and Materials
Cited by 241
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Nature of Conduction in Doped Silicon
Jeon, T.-I., & Grischkowsky, D. (1997) · Physical Review Letters
Terahertz technology and applicationsSemiconductor materials and interfaces
Cited by 231
- Verified
Waveguide terahertz time-domain spectroscopy of nanometer water layers
Zhang, J., & Grischkowsky, D. (2004) · Optics Letters
Terahertz technology and applicationsMicrowave and Dielectric Measurement Techniques
Cited by 221
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Characterization of optically dense, doped semiconductors by reflection THz time domain spectroscopy
Jeon, T.-I., & Grischkowsky, D. (1998) · Applied Physics Letters
Terahertz technology and applicationsAdvanced Semiconductor Detectors and Materials
Cited by 162
- Verified
Terahertz spectroscopy of optically thick multilayered semiconductor structures
Ralph, S. E., Perkowitz, S., Katzenellenbogen, N., & Grischkowsky, D. (1994) · Journal of the Optical Society of America B
Terahertz technology and applicationsAdvanced Semiconductor Detectors and Materials
Cited by 44
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Far infrared spectroscopy with subpicosecond electrical pulses on transmission lines
Sprik, R., Duling, I. N., Chi, C.-C., & Grischkowsky, D. (1987) · Applied Physics Letters
Terahertz technology and applicationsLaser-Matter Interactions and Applications
Cited by 42
- Verified
Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor
Theuer, M., Beigang, R., & Grischkowsky, D. (2010) · Applied Physics Letters
Terahertz technology and applicationsMicrowave and Dielectric Measurement Techniques
Cited by 38
- Verified
Adiabatic compression of parallel-plate metal waveguides for sensitivity enhancement of waveguide THz time-domain spectroscopy
Zhang, J., & Grischkowsky, D. (2005) · Applied Physics Letters
Terahertz technology and applicationsSuperconducting and THz Device Technology
Cited by 36
- Verified
Adiabatic compression of terahertz waves using metal flares
Theuer, M., Beigang, R., & Grischkowsky, D. R. (2010) · Applied Physics Letters
Terahertz technology and applicationsMetamaterials and Metasurfaces Applications
Cited by 24
- Verified
Sensitivity increase for coating thickness determination using THz waveguides
Theuer, M., Beigang, R., & Grischkowsky, D. (2010) · Optics Express
Terahertz technology and applicationsMicrowave and Dielectric Measurement Techniques
Cited by 16
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