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“However, most of the conventional thermal conductivity measurement techniques lack the spatial resolution to measure the temperature gradient/difference or the heat flux across a length scale below tens of microns.”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [19]
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Metadata
- Authors
- Cooper, M. G., Mikic, B. B., & Yovanovich, M. M.
- Venue
- International Journal of Heat and Mass Transfer
- Publisher
- Elsevier BV
- Published
- 1969-03
- Volume
- 12
- Issue
- 3
- Pages
- 279-300
- ISSN
- 0017-9310 (ISSN-L)
- OpenAlex
- W2014771237
- Cited by
- 1,069
- References
- 16
- Citations by year
- 2026: 62 · 2025: 50 · 2024: 45 · 2023: 47 · 2022: 51 · 2021: 43 · 2020: 53 · 2019: 53 · 2018: 42 · 2017: 42 · 2016: 44 · 2015: 42 · 2014: 28 · 2013: 25 · 2012: 24
- FWCI
- 20.33
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- International Journal of Heat and Mass Transfer (publishedVersion)
- Topics
- Physical Sciences › Engineering › Mechanics of Materials › Adhesion, Friction, and Surface Interactions
- Physical Sciences › Engineering › Computational Mechanics › Heat Transfer and Numerical Methods
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Keywords
- thermal contact conductance, vacuum heat transfer, surface height distribution, multiple contacts, describing function method, Gaussian height distribution
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