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Self-assembled monolayers as inhibitors for area-selective deposition: A novel approach towards resist-less EUV lithography
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“Directed self-assembly (DSA) has been around for many years 125 .”
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Extreme ultraviolet lithography
Kazazis, D., Santaclara, J. G., van Schoot, J., Mochi, I., & Ekinci, Y. (2024) · Nature Reviews Methods Primers · doi:10.1038/s43586-024-00361-z · Cited by 149
Resistless EUV lithography: Photon-induced oxide patterning on silicon
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Metadata
- Authors
- Lodha, J. K., Pollentier, I., Conard, T., Vallat, R., De Gendt, S., & Armini, S.
- Affiliations
- IMEC (BE)
- Corresponding author
- Armini, Silvia
- Venue
- Applied Surface Science
- Publisher
- Elsevier BV
- Published
- 2022-12
- Volume
- 606
- Pages
- 154657
- ISSN
- 0169-4332 (ISSN-L)
- OpenAlex
- W4293879836
- Cited by
- 16
- References
- 59
- Citations by year
- 2026: 2 · 2025: 3 · 2024: 6 · 2023: 5
- FWCI
- 0.96
- Type
- journal article
- Language
- en
- Open access
- bronze
- doi.org
- Licence
- Locations
- Applied Surface Science (publishedVersion)
- Lirias (submittedVersion, other-oa)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Photolithography Techniques
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Nanofabrication and Lithography Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
- Keywords
- self-assembled monolayers, area-selective deposition, EUV lithography, titanium oxide, photocatalysis, organosilane monolayers, chain length effects, atomic layer deposition, bottom-up nanofabrication
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