Cited by 16Advancements in Photolithography TechniquesNanofabrication and Lithography TechniquesSemiconductor materials and devices

The DOI matches its Crossref record; 59 of the 59 references it cites were found in a registry or an index.

Self-assembled monolayers as inhibitors for area-selective deposition: A novel approach towards resist-less EUV lithography

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Lodha, Jayant K., Pollentier, Ivan, Conard, Thierry, Vallat, Remi, De Gendt, Stefan, Armini, Silvia·2022·Applied Surface Science

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Crossref · 10.1016/j.apsusc.2022.154657

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Metadata

Authors
Lodha, J. K., Pollentier, I., Conard, T., Vallat, R., De Gendt, S., & Armini, S.
Affiliations
IMEC (BE)
Corresponding author
Armini, Silvia
Venue
Applied Surface Science
Publisher
Elsevier BV
Published
2022-12
Volume
606
Pages
154657
ISSN
0169-4332 (ISSN-L)
OpenAlex
W4293879836
Cited by
16
References
59
Citations by year
2026: 2 · 2025: 3 · 2024: 6 · 2023: 5
FWCI
0.96
Type
journal article
Language
en
Open access
Locations
  • Applied Surface Science (publishedVersion)
  • Lirias (submittedVersion, other-oa)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Photolithography Techniques
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Nanofabrication and Lithography Techniques
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
Keywords
self-assembled monolayers, area-selective deposition, EUV lithography, titanium oxide, photocatalysis, organosilane monolayers, chain length effects, atomic layer deposition, bottom-up nanofabrication

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