The DOI matches its Crossref record; 25 of the 25 references it cites were found in a registry or an index.
Review of recent developments in amorphous oxide semiconductor thin-film transistor devices
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Nomura, K., Ohta, H., Takagi, A., Kamiya, T., Hirano, M., & Hosono, H. (2004) · Nature · doi:10.1038/nature03090 · Cited by 7,504
Two-dimensional charge transport in self-organized, high-mobility conjugated polymers
Sirringhaus, H., Brown, P. J., Friend, R. H., Nielsen, M. M., Bechgaard, K., Langeveld-Voss, B. M. W., Spiering, A. J. H., Janssen, R. A. J., Meijer, E. W., Herwig, P., et al. (1999) · Nature · doi:10.1038/44359 · Cited by 4,624
Organic-Inorganic Hybrid Materials as Semiconducting Channels in Thin-Film Field-Effect Transistors
Kagan, C. R., Mitzi, D. B., & Dimitrakopoulos, C. D. (1999) · Science · doi:10.1126/science.286.5441.945 · Cited by 2,110
Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor
Nomura, K., Ohta, H., Ueda, K., Kamiya, T., Hirano, M., & Hosono, H. (2003) · Science · doi:10.1126/science.1083212 · Cited by 1,884
ZnO-based transparent thin-film transistors
Hoffman, R. L., Norris, B. J., & Wager, J. F. (2003) · Applied Physics Letters · doi:10.1063/1.1542677 · Cited by 1,397
Banger, K. K., Yamashita, Y., Mori, K., Peterson, R. L., Leedham, T., Rickard, J., & Sirringhaus, H. (2011) · Nature Materials · doi:10.1038/nmat2914 · Cited by 1,054
High-Performance Semiconducting Polythiophenes for Organic Thin-Film Transistors
Ong, B. S., Wu, Y., Liu, P., & Gardner, S. (2004) · Journal of the American Chemical Society · doi:10.1021/ja039772w · Cited by 1,041
Masuda, S., Kitamura, K., Okumura, Y., Miyatake, S., Tabata, H., & Kawai, T. (2003) · Journal of Applied Physics · doi:10.1063/1.1534627 · Cited by 534
Park, J.-S., Kim, T.-W., Stryakhilev, D., Lee, J.-S., An, S.-G., Pyo, Y.-S., Lee, D.-B., Mo, Y. G., Jin, D.-U., & Chung, H. K. (2009) · Applied Physics Letters · doi:10.1063/1.3159832 · Cited by 474
Self-citationHigh mobility bottom gate InGaZnO thin film transistors with SiOx etch stopper
Kim, M. K., Jeong, J. H., Lee, H. J., Ahn, T. K., Shin, H. S., Park, J., Jeong, J. K., Mo, Y., & Kim, H. D. (2007) · Applied Physics Letters · doi:10.1063/1.2742790 · Cited by 454
Self-citation
Cited by
Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances
Fortunato, E., Barquinha, P., & Martins, R. (2012) · Advanced Materials · doi:10.1002/adma.201103228 · Cited by 3,197
Recent Advances in Wearable Sensors for Health Monitoring
Rodgers, M. M., Pai, V. M., & Conroy, R. S. (2015) · IEEE Sensors Journal · doi:10.1109/jsen.2014.2357257 · Cited by 325
Fukuda, K., & Someya, T. (2017) · Advanced Materials · doi:10.1002/adma.201602736 · Cited by 317
Jang, H.-J., Gu, J.-G., & Cho, W.-J. (2013) · Sensors and Actuators B: Chemical · doi:10.1016/j.snb.2013.02.056 · Cited by 76
Ok, K.-C., Oh, S., Jeong, H.-J., Bae, J. U., & Park, J.-S. (2015) · IEEE Electron Device Letters · doi:10.1109/led.2015.2461003 · Cited by 45
Self-citation
Metadata
- Authors
- Park, J. S., Maeng, W.-J., Kim, H.-S., & Park, J.-S.
- Venue
- Thin Solid Films
- Publisher
- Elsevier BV
- Published
- 2012-01
- Volume
- 520
- Issue
- 6
- Pages
- 1679-1693
- ISSN
- 0040-6090 (ISSN-L)
- OpenAlex
- W2010540469
- Cited by
- 1,074
- References
- 25
- FWCI
- 43.23
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Review of recent developments in amorphous oxide semiconductor thin-film transistor devices. https://app.cochat.ai/papers/10.1016/j.tsf.2011.07.018
- The paper
- Park, J. S., Maeng, W.-J., Kim, H.-S., & Park, J.-S. (2012). Review of recent developments in amorphous oxide semiconductor thin-film transistor devices. Thin Solid Films. https://doi.org/10.1016/j.tsf.2011.07.018
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.