Analyzing sub-100-μm samples with transmission terahertz time domain spectroscopy
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The complex refractive index of silicon is frequency dependent around 192.5-197.5 THz.
“The complex refractive index of silicon is frequency dependent around 192.5-197.5 THz 40 .”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [40]
Because these behaviors are consistent with the literature 40, it is proven that the evaluation method is valid.
“Because these behaviors are consistent with the literature 40 , it is proven that our evaluation method is valid.”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [40]
The value of n(ω) is consistent with the literature value within the previously reported uncertainty.
“Moreover, the value of n ( ω ) is consistent with the literature value within the previously reported uncertainty.”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [40]
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Zhang, T., Zhang, Z., & Arnold, M. A. (2018) · Applied Spectroscopy · doi:10.1177/0003702818815177 · Cited by 24 · see citing works
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Im, J., Goo, T., Kim, J., Choi, S., Hong, S. J., & Bahk, Y. (2021) · Sensors · doi:10.3390/s21093161 · Cited by 23 · see citing works
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Zhu, P., Zhang, H., Pivarčiová, E., Сфарра, С., & Maldague, X. (2023) · NDT & E International · doi:10.1016/j.ndteint.2023.102938 · Cited by 23 · see citing works
Terahertz time-domain spectroscopy for monitoring the curing of dental composites
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Self-citationNie, H., Mu, K., Zhang, Z., Ding, Y., Zhao, S., Wang, K., Dang, W., Ren, J., Liang, X., & Ma, W. (2024) · Infrared Physics & Technology · doi:10.1016/j.infrared.2024.105300 · Cited by 22 · see citing works
Characterization of Micro-Powders for the Fabrication of Compression Molded THz Lenses
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Self-citationProbing the momentum relaxation time of charge carriers in ultrathin layers with terahertz radiation
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Terahertz Spectroscopy of Polymers
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Spectrum to space transformed fast terahertz imaging
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Self-citationTerahertz spectroscopy: A powerful tool for the characterization of plastic materials
Wietzke, S., Jansen, C., Krumbholz, N., Peters, O., Vieweg, N., Jördens, C., Scheller, M., Romeike, D., Jung, T., Reuter, M., et al. (2010) · IEEE International Conference on Solid Dielectrics · doi:10.1109/icsd.2010.5567915 · Cited by 19 · see citing works
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Chen, X., & Pickwell-MacPherson, E. (2019) · Sensors · doi:10.3390/s19194118 · Cited by 18 · see citing works
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Handheld terahertz spectrometer for the detection of liquid explosives
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Self-citation
- Authors
- Scheller, M., Jansen, C., & Koch, M.
- Affiliations
- Technische Universität Braunschweig (DE)
- Corresponding author
- Scheller, Maik
- Venue
- Optics Communications
- Publisher
- Elsevier BV
- Published
- 2009-04
- Volume
- 282
- Issue
- 7
- Pages
- 1304-1306
- ISSN
- 0030-4018 (ISSN-L)
- OpenAlex
- W2055974620
- Semantic Scholar
- cec9d890378f48c55c2ac81bb3608d71f550ce43
- Cited by
- 194
- References
- 14
- Citations by year
- 2026: 3 · 2025: 8 · 2024: 7 · 2023: 11 · 2022: 8 · 2021: 18 · 2020: 10 · 2019: 12 · 2018: 8 · 2017: 11 · 2016: 12 · 2015: 8 · 2014: 7 · 2013: 9 · 2012: 13
- FWCI
- 15.46
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Optics Communications (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Keywords
- refractive index, absorption coefficient, Fabry-Perot oscillations, multiple reflections, Fourier transform, material parameter identification
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