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Cited by 256

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Si/a-Si Core/Shell Nanowires as Nonvolatile Crossbar Switches

Dong, Yajie, Yu, Guihua, McAlpine, Michael C., Lu, Wei, Lieber, Charles M.·2008·Nano Letters
DOI 10.1021/nl073224p
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Abstract

Radial core/shell nanowires (NWs) represent an important class of nanoscale building blocks with substantial potential for exploring fundamental electronic properties and realizing novel device applications at the nanoscale. Here, we report the synthesis of crystalline silicon/amorphous silicon (Si/a-Si) core/shell NWs and studies of crossed Si/a-Si NW metal NW (Si/a-Si x M) devices and arrays. Room-temperature electrical measurements on single Si/a-Si x Ag NW devices exhibit bistable switching between high (off) and low (on) resistance states with well-defined switching threshold voltages, on/off ratios greater than 10(4), and current rectification in the on state. Temperature-dependent switching experiments suggest that rectification can be attributed to barriers to electric field-driven metal diffusion. Systematic studies of Si/a-Si x Ag NW devices show that (i) the bit size can be at least as small as 20 nm x 20 nm, (ii) the writing time is <100 ns, (iii) the retention time is >2 weeks, and (iv) devices can be switched >10(4) times without degradation in performance. In addition, studies of dense one-dimensional and two-dimensional Si/a-Si x Ag NW devices arrays fabricated on crystalline and plastic substrates show that elements within the arrays can be independently switched and read, and moreover that bends with radii of curvature as small as 0.3 cm cause little change in device characteristics. The Si/a-Si x Ag NW devices represent a highly scalable and promising nanodevice element for assembly and fabrication of dense nonvolatile memory and programmable nanoprocessors.

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Citations

Cites

Research works printed but not linked: 34

  1. International technology roadmap for semiconductors (2005 edition).http://www.itrs.net.
  2. Lieber C. M., 2001, Sci. Am., 285, 58, 10.1038/scientificamerican0901-58 · DOI · Paper page
  3. Lieber C. M., 2003, MRS Bull., 28, 486, 10.1557/mrs2003.144 · DOI · Paper page
  4. Lu W., 2007, Nat. Mater., 6, 841, 10.1038/nmat2028 · DOI · Paper page
  5. Huang Y., 2001, Science, 294, 1313, 10.1126/science.1066192 · DOI · Paper page
  6. Rueckes T., 2000, Science, 289, 94, 10.1126/science.289.5476.94 · DOI · Paper page
  7. Bachtold A., 2001, Science, 294, 1317, 10.1126/science.1065824 · DOI · Paper page
  8. Heath J. R., 1998, Science, 280, 1716, 10.1126/science.280.5370.1716 · DOI · Paper page
  9. DeHon A., 2005, IEEE Trans. Nanotechnol., 4, 215, 10.1109/TNANO.2004.837849 · DOI
  10. Strukov D. B., 2005, Nanotechnology, 16, 888, 10.1088/0957-4484/16/6/045 · DOI · Paper page
  11. Wang W., 2006, J. Comput. Sci. Technol., 21, 871, 10.1007/s11390-006-0871-5 · DOI
  12. Snider G. S., 2007, Nanotechnology, 18, 035204, 10.1088/0957-4484/18/3/035204 · DOI · Paper page
  13. Collier C. P., 2000, Science, 289, 1172, 10.1126/science.289.5482.1172 · DOI · Paper page
  14. Chen Y., 2003, Nanotechnology, 14, 462, 10.1088/0957-4484/14/4/311 · DOI · Paper page
  15. Green J. E., 2007, Nature, 445, 414, 10.1038/nature05462 · DOI · Paper page
  16. Seminario J. M., 2000, J. Am. Chem. Soc., 122, 3015, 10.1021/ja992936h · DOI · Paper page
  17. Di Ventra M., 2000, Phys. Rev. Lett., 84, 979, 10.1103/PhysRevLett.84.979 · DOI · Paper page
  18. Chen J., 2000, Appl. Phys. Lett., 77, 1224, 10.1063/1.1289650 · doi:10.1063/1.1289650
  19. Flood A. H., 2004, Science, 306, 2055, 10.1126/science.1106195 · doi:10.1126/science.1106195
  20. Lau C. N., 2004, Nano Lett., 4, 569, 10.1021/nl035117a · DOI · Paper page
  21. Huang Y., 2001, Science, 291, 630, 10.1126/science.291.5504.630 · DOI · Paper page
  22. Whang D., 2003, Nano Lett., 3, 1255, 10.1021/nl0345062 · DOI · Paper page
  23. Lauhon L. J., 2002, Nature, 420, 57, 10.1038/nature01141 · DOI · Paper page
  24. Wu Y., 2004, Nature, 430, 61, 10.1038/nature02674 · DOI · Paper page
  25. Scott J. C., 2004, Science, 304, 62, 10.1126/science.1095520 · DOI · Paper page
  26. Owen A. E., 1992, Int. J. Electron., 73, 897, 10.1080/00207219208925733 · DOI
  27. Jafar M., 1994, Phys. Rev. B, 49, 13611, 10.1103/PhysRevB.49.13611 · DOI
  28. Chen A., 2005, Tech. Dig. Int. Electron Devices Meet.
  29. Measurement, endurance cycles, and retention times test of the device were carried out in air with a probe station (TTP-4
  30. Lecomber P. G., 1985, J. Non-Cryst. Solids, 77, 1373, 10.1016/0022-3093(85)90912-3 · DOI
  31. Owen A. E., 1983, J. Non-Cryst. Solids, 59, 1273, 10.1016/0022-3093(83)90398-8 · DOI
  32. Katz R., 1998, IEEE Trans. Nucl. Sci., 45, 2600, 10.1109/23.736503 · doi:10.1109/23.736503
  33. Javey A., 2007, Nano Lett., 7, 773, 10.1021/nl063056l · DOI · Paper page
  34. McAlpine M. C., 2003, Nano Lett., 3, 1531, 10.1021/nl0346427 · DOI · Paper page

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Metadata

Authors
Dong, Y., Yu, G., McAlpine, M. C., Lu, W., & Lieber, C. M.
Venue
Nano Letters
Publisher
American Chemical Society (ACS)
Published
2008-01-26
Volume
8
Issue
2
Pages
386-391
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
DOI
10.1021/nl073224p
OpenAlex
W1967670695
Cited by
256
References
2
FWCI
24.50
Type
journal article
Language
en
Open access
closed

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