The DOI matches its Crossref record; 20 of the 20 references it cites were found in a registry or an index.
Where Does the Current Flow in Two-Dimensional Layered Systems?
Abstract
In this Letter, we map for the first time the current distribution among the individual layers of multilayer two-dimensional systems. Our findings suggest that in a multilayer MoS2 field-effect transistor the "HOT-SPOT" of the current flow migrates dynamically between the layers as a function of the applied back gate bias and manifests itself in a rather unusual "contact resistance" that cannot be explained using the conventional models for metal-to-semiconductor contacts. To interpret this unique contact resistance, extracted from a channel length scaling study, we employed a resistor network model based on Thomas-Fermi charge screening and interlayer coupling. By modeling our experimental data we have found that the charge screening length for MoS2 is rather large (λMoS2 = 7 nm) and translates into a current distribution in multilayer MoS2 systems, which is distinctly different from the current distribution in multilayer graphene (λgraphene = 0.6 nm). In particular, our experimental results allow us to retrieve for the first time fundamental information about the carrier transport in two-dimensional layered systems that will likely play an important role in the implementation of future electronics components but that have not been evaluated in the past.
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Cites
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Self-citation
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Recent Advances in Two-Dimensional Materials beyond Graphene
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Self-citationImproved Contacts to MoS2 Transistors by Ultra-High Vacuum Metal Deposition
English, C. D., Shine, G., Dorgan, V. E., Saraswat, K. C., & Pop, E. (2016) · Nano Letters · doi:10.1021/acs.nanolett.6b01309 · Cited by 554
Ambipolar Phosphorene Field Effect Transistor
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Self-citationElectronic Transport in Two-Dimensional Materials
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Metadata
- Authors
- Das, S., & Appenzeller, J.
- Venue
- Nano Letters
- Publisher
- American Chemical Society (ACS)
- Published
- 2013-06-28
- Volume
- 13
- Issue
- 7
- Pages
- 3396-3402
- ISSN
- 1530-6984 (ISSN-L)
- 1530-6992
- OpenAlex
- W2019063764
- Cited by
- 268
- References
- 20
- FWCI
- 12.28
- Type
- journal article
- Language
- en
- Open access
- closed
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