Chemical identification in the specular and off-specular rough-surface scattered terahertz spectra using wavelet shrinkage
Open accessAbstract
We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from α-lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities.
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When applied to THz absorption or reflection coefficients, wavelet transform can separate characteristic resonant signatures from scattering-induced spectral artifacts.
“We have shown that because wavelet transform provides spectral localization at multiple resolution scales, when applied to THz absorption or reflection coefficients, it can separate the characteristic resonant signatures from the scattering-induced spectral artifacts [15,16,17,44].”
From Translation-Invariant Zero-Phase Wavelet Methods for Feature Extraction in Terahertz Time-Domain Spectroscopy (2022) · cites this paper as [16]
The Materials and Methods section reports that wavelet shrinkage separates resonant features from scattering artifacts in the derivative of THz reflectivity. It does not demonstrate the method on THz absorption coefficients, or on reflection coefficients without taking their derivative, so the claim is broader than this source supports. (LLM, conf=0.84)
Experimental — accuracy not yet measuredWavelet transform provides spectral localization at multiple resolution scales.
“We have shown that because wavelet transform provides spectral localization at multiple resolution scales, when applied to THz absorption or reflection coefficients, it can separate the characteristic resonant signatures from the scattering-induced spectral artifacts [15,16,17,44].”
From Translation-Invariant Zero-Phase Wavelet Methods for Feature Extraction in Terahertz Time-Domain Spectroscopy (2022) · cites this paper as [16]
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Cutting-edge terahertz technology
Tonouchi, M. (2007) · Nature Photonics · doi:10.1038/nphoton.2007.3 · Cited by 6,332 · see citing works
Wavelet Methods for Time SeriesAnalysis
Percival, D. B., & Walden, A. T. (2000) · Cambridge University Press eBooks · doi:10.1017/cbo9780511841040 · Cited by 3,120 · see citing works
The scattering of electromagnetic waves from rough surfaces
Beckmann, P., & Spizzichino, A. (1963) · Virtual Defense Library (Ministerio de Defensa) · Cited by 2,863 · see citing works
A Wavelet Tour of Signal Processing : The Sparse Way
Mallat, S., & Peyré, G. (2008) · Cited by 2,759 · see citing works
Terahertz spectroscopy and imaging - Modern techniques and applications
Jepsen, P. U., Cooke, D. G., & Koch, M. (2011) · Laser & Photonics Reviews · doi:10.1002/lpor.201000011 · Cited by 2,091 · see citing works
The scattering of electromagnetic waves from rough surfaces
Katzin, M. (1964) · Proceedings of the IEEE · doi:10.1109/proc.1964.3413 · Cited by 1,887 · see citing works
Terahertz pulsed spectroscopy and imaging in the pharmaceutical setting - a review
Zeitler, J. A., Taday, P. F., Newnham, D. A., Pepper, M., Gordon, K. C., & Rades, T. (2007) · Journal of Pharmacy and Pharmacology · doi:10.1211/jpp.59.2.0008 · Cited by 409 · see citing works
Scattering Analysis for the Modeling of THz Communication Systems
Piesiewicz, R., Jansen, C., Mittleman, D. M., Kleine‐Ostmann, T., Koch, M., & Kürner, T. (2007) · IEEE Transactions on Antennas and Propagation · doi:10.1109/tap.2007.908559 · Cited by 352 · see citing works
Detection and identification of explosive RDX by THz diffuse reflection spectroscopy.
Liu, H.-B., Chen, Y.-Q., Bastiaans, G., & Zhang, X.-C. (2006) · Optics Express · doi:10.1364/opex.14.000415 · Cited by 333 · see citing works
Walther, M., Płochocka, P., Fischer, B., Helm, H., & Jepsen, P. U. (2002) · Biopolymers · doi:10.1002/bip.10106 · Cited by 326 · see citing works
Zhong, H., Redo-Sanchez, A., & Zhang, X. (2006) · Optics Express · doi:10.1364/oe.14.009130 · Cited by 259 · see citing works
Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology
Krimi, S., Klier, J., Jonuscheit, J., von Freymann, G., Urbansky, R., & Beigang, R. (2016) · Applied Physics Letters · doi:10.1063/1.4955407 · Cited by 218 · see citing works
Diffuse Scattering From Rough Surfaces in THz Communication Channels
Jansen, C., Priebe, S., Möller, C., Jacob, M., Dierke, H., Koch, M., & Kürner, T. (2011) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2011.2153610 · Cited by 217 · see citing works
Nashima, S., Morikawa, O., Takata, K., & Hangyo, M. (2001) · Applied Physics Letters · doi:10.1063/1.1413498 · Cited by 143 · see citing works
Frequency-wavelet domain deconvolution for terahertz reflection imaging and spectroscopy
Chen, Y., Huang, S.-Y., & Pickwell‐MacPherson, E. (2010) · Optics Express · doi:10.1364/oe.18.001177 · Cited by 140 · see citing works
Mickan, S. P., & Zhang, X. (2003) · International Journal of High Speed Electronics and Systems · doi:10.1142/s0129156403001843 · Cited by 119 · see citing works
Phase-sensitive time-domain terahertz reflection spectroscopy
Pashkin, A., Kempa, M., Němec, H., Kadlec, F., & Kužel, P. (2003) · Review of Scientific Instruments · doi:10.1063/1.1614878 · Cited by 114 · see citing works
Surface roughness effects on the terahertz reflectance of pure explosive materials
Ortolani, M., Lee, J. S., Schade, U., et al. (2008) · Applied Physics Letters · doi:10.1063/1.2973403 · Cited by 98 · see citing works
Numerical phase correction method for terahertz time-domain reflection spectroscopy
Vartiainen, E. M., Ino, Y., Shimano, R., Kuwata-Gonokami, M., Svirko, Y. P., & Peiponen, K.-E. (2004) · Journal of Applied Physics · doi:10.1063/1.1786345 · Cited by 79 · cited 8× · see citing works
“Although rigorous experimental and computational techniques have been employed to avoid the phase error in reflection THz-TDS [14]–[19], they have not been proved effective in the presence of rough surface scattering, where the phase error is often a random variable [20], [21].”
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Schecklman, S., Zurk, L. M., Henry, S., & Kniffin, G. P. (2011) · Journal of Applied Physics · doi:10.1063/1.3561806 · Cited by 72 · see citing works
Identification of concealed materials, including explosives, by terahertz reflection spectroscopy
Pałka, N. (2013) · Optical Engineering · doi:10.1117/1.oe.53.3.031202 · Cited by 66 · see citing works
Dong, J., Locquet, A., & Citrin, D. S. (2015) · Journal of Infrared Millimeter and Terahertz Waves · doi:10.1007/s10762-015-0226-9 · Cited by 62 · see citing works
Chemical mapping using reflection terahertz pulsed imaging
Shen, Y., Taday, P. F., Newnham, D. A., & Pepper, M. (2005) · Semiconductor Science and Technology · doi:10.1088/0268-1242/20/7/016 · Cited by 61 · see citing works
Convertible transmission-reflection time-domain terahertz spectrometer
Khazan, M., Meissner, R., & Wilke, I. (2001) · Review of Scientific Instruments · doi:10.1063/1.1384433 · Cited by 54 · see citing works
Effects of surface roughness on reflection spectra obtained by terahertz time-domain spectroscopy.
Dikmelik, Y., Spicer, J., Fitch, M., & Osiander, R. (2006) · Optics Letters · doi:10.1364/ol.31.003653 · Cited by 49 · see citing works
Non-specular scattering modeling for THz propagation simulations
Priebe, S., Jacob, M., Jansen, C., & Kürner, T. (2011) · European Conference on Antennas and Propagation · Cited by 49 · see citing works
Model-Based Material Parameter Estimation for Terahertz Reflection Spectroscopy
Kniffin, G. P., & Zurk, L. M. (2012) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2011.2181921 · Cited by 46 · see citing works
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Harris, Z. B., Khani, M. E., & Arbab, M. H. (2020) · IEEE Access · doi:10.1109/access.2020.3045460 · Cited by 44 · see citing works
Self-citationBernier, M., Garet, F., & Coutaz, J. (2013) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2013.2247793 · Cited by 42 · see citing works
Harris, Z. B., Virk, A. S., Khani, M. E., et al. (2020) · Optics Express · doi:10.1364/oe.398706 · Cited by 35 · see citing works
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Self-citationOsman, O. B., & Arbab, M. H. (2019) · PLOS ONE · doi:10.1371/journal.pone.0216952 · Cited by 27 · see citing works
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Arbab, M. H., Winebrenner, D. P., Thorsos, E. I., & Chen, A. (2010) · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · doi:10.1117/12.845944 · Cited by 26 · see citing works
Self-citationArbab, M. H., Winebrenner, D. P., Thorsos, E. I., & Chen, A. (2010) · Applied Physics Letters · doi:10.1063/1.3507384 · Cited by 24 · see citing works
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Arbab, M. H., Chen, A., Thorsos, E. I., Winebrenner, D. P., & Zurk, L. M. (2008) · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · doi:10.1117/12.769015 · Cited by 24 · see citing works
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Henry, S. C., Zurk, L. M., & Schecklman, S. (2013) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2013.2261065 · Cited by 17 · see citing works
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Priebe, S., Jacob, M., & Kürner, T. (2011) · European Conference on Antennas and Propagation · Cited by 15 · see citing works
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Kaushik, M., Ng, B. W. ‐., Fischer, B. M., & Abbott, D. (2012) · Applied Physics Letters · doi:10.1063/1.4745182 · Cited by 13 · see citing works
Mickan, S. P., & Zhang, X.-C. (2003) · Selected topics in electornics and systems · doi:10.1142/9789812796820_0008 · Cited by 13 · see citing works
Application of time delay spectrometry for rough surface characterization
Pedersen, P. C., & Grebe, A. (2001) · Ultrasonics · doi:10.1016/s0041-624x(00)00044-5 · Cited by 10 · see citing works
Chemical Identification With Information-Weighted Terahertz Spectrometry
Brigada, D. J., & Zhang, X. (2011) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2011.2173269 · Cited by 9 · see citing works
Trofimov, V. A., & Varentsova, S. A. (2018) · PLoS ONE · doi:10.1371/journal.pone.0201297 · Cited by 9 · see citing works
Ebrahimkhani, M., & Arbab, M. H. (2018) · International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) · doi:10.1109/irmmw-thz.2018.8509945 · Cited by 7 · see citing works
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Khani, M. E., Harris, Z. B., & Arbab, M. H. (2020) · Conference on Lasers and Electro-Optics · doi:10.1364/cleo_si.2020.sm2f.5 · Cited by 5 · see citing works
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Markelz, A. G., & Mittleman, D. M. (2022) · ACS Photonics · doi:10.1021/acsphotonics.2c00228 · Cited by 178 · see citing works
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Khani, M. E., Osman, O. B., & Arbab, M. H. (2021) · Scientific Reports · doi:10.1038/s41598-021-02068-7 · Cited by 28 · see citing works
Self-citationKhani, M. E., & Arbab, M. H. (2022) · Sensors · doi:10.3390/s22062305 · Cited by 22 · see citing works
“Furthermore, the wavelet coefficient levels associated with resonant signatures can be identified using total variation in reflection spectroscopy [16], or bimodality coefficient [17] and principal component analysis [45] in the transmission geometry.”
BackgroundMethodSelf-citationHarris, Z. B., Khani, M. E., & Arbab, M. H. (2021) · 2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) · doi:10.1109/irmmw-thz50926.2021.9567071 · Cited by 1 · see citing works
Self-citation
- Authors
- Khani, M. E., & Arbab, M. H.
- Affiliations
- Stony Brook University (US)
- Venue
- IEEE Access
- Published
- 2021
- Volume
- 9
- Pages
- 29746-29754
- ISSN
- 2169-3536 (ISSN-L)
- PMC
- PMC9009754
- OpenAlex
- W3132565123
- Cited by
- 29
- References
- 44
- Citations by year
- 2026: 1 · 2025: 4 · 2024: 2 · 2023: 4 · 2022: 15 · 2021: 3
- FWCI
- 1.76
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Locations
- IEEE Access (publishedVersion, cc-by)
- PubMed (publishedVersion)
- PubMed Central (acceptedVersion, cc-by)
- DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion, cc-by-sa)
- Funders
- National Institute of General Medical Sciences of the National Institutes of Health (R01GM112693)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Chemistry › Spectroscopy › Spectroscopy and Laser Applications
- Physical Sciences › Chemistry › Analytical Chemistry › Spectroscopy and Chemometric Analyses
- Keywords
- terahertz reflectivity, rough surface scattering, wavelet thresholding, hard thresholding, total variation, alpha-lactose monohydrate, p-aminobenzoic acid, Kirchhoff approximation
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