Real-time and calibration-free generalized terahertz time-domain spectroscopic ellipsometry
Open accessAbstract
Spectroscopic ellipsometry is a high-precision and powerful optical characterization technique, which can be categorized into two fundamental types of standard and generalized ellipsometry. The latter can obtain the complete Jones matrix to investigate various anisotropic samples. However, terahertz generalized ellipsometry has traditionally relied on frequency-domain instrumentation, which is limited in bandwidth, complicated in polarization manipulation, and slow in operation. In this study, we propose a highly accurate and efficient terahertz time-domain generalized ellipsometer based on a polarization beam coupler-splitter configuration. It measures four independent complex spectra in real-time without mechanical movement, providing ultrahigh data throughput. Each polarizer-antenna unit constructively superimposes their filtering effect, resulting in a 45–65 dB extinction ratio that approaches the system dynamic range. The superb illumination and detection linearity provides an outstanding polarization accuracy and eliminates the need for complicated calibration. Reflection characterization of the magneto-optical properties of an InAs wafer demonstrates the generalized ability to simultaneously obtain multiple dielectric functions. Transmission ellipsometric imaging of liquid crystals subjected to an inhomogeneous electric field further highlights the excellent efficiency. The proposed technique significantly expands the capabilities of terahertz spectroscopy, paving ways to anisotropic materials, in situ monitoring, and polarization-sensitive devices.
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Generalized THz ellipsometry used two photoconductive antennas to generate two orthogonally polarized THz beams, which were combined, reflected, split into orthogonal polarizations, and detected by two photoconductive detectors.
“In generalized THz ellipsometry,10 two photoconductive antennas were used to generate two orthogonally polarized THz beams, which were then combined with a THz polarizer, reflected from a sample, split into orthogonal polarizations, and detected by two photoconductive detectors.”
From Dual-Beam THz Spectrometer with Low-Aberration Optics and Off-Axis Multipixel Photoconductive Emitters for Reduced Systematic Errors (2025) · cites this paper as [10]
The generalized THz ellipsometry system had roughly double the components compared to a standard THz time-domain spectrometer, adding to the system's cost and complexity.
“While an important step forward, compared to a standard THz time-domain spectrometer, the system had roughly double the components,10 adding to the system’s cost and complexity.”
From Dual-Beam THz Spectrometer with Low-Aberration Optics and Off-Axis Multipixel Photoconductive Emitters for Reduced Systematic Errors (2025) · cites this paper as [10]
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Flagged first, then by citations
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Cited by
Sorted by citations
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- Authors
- Chen, H., Wang, K., Chen, X., & Fang, G.
- Affiliations
- Chinese Academy of Sciences (CN)
- Corresponding author
- Chen, Xuequan
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2024-03-11
- Volume
- 124
- Issue
- 11
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W4392708429
- Cited by
- 11
- References
- 40
- Citations by year
- 2026: 5 · 2025: 4 · 2024: 2
- FWCI
- 1.14
- Type
- journal article
- Language
- en
- Open access
- hybrid
- doi.org
- Licence
- Locations
- Applied Physics Letters (publishedVersion, cc-by)
- Funders
- National Natural Science Foundation of China (61988102, 62305069)
- Key research and development program of Guangdong Province (2019B090917007)
- Science and Technology Planning Project of Guangdong Province (2019B090909011)
- Guangzhou Municipal Science and Technology Project (2023A04J0339)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Biomedical Engineering › Optical Polarization and Ellipsometry
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Metamaterials and Metasurfaces Applications
- Keywords
- generalized ellipsometry, Jones matrix, calibration-free measurement, real-time measurement, magneto-optical properties, InAs, liquid crystals, anisotropic materials, dielectric function
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