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Assessment of channel temperature in β-(AlxGa1−x)2O3/Ga2O3 heterostructure field-effect transistors using visible wavelength thermoreflectance thermal imaging

Lundh, J. S., Pavlidis, G., Sasaki, K., Centrone, A., Spencer, J. A., Masten, H. N., Currie, M., Jacobs, A. G., Konishi, K., Kuramata, A., et al. (2024) · Applied Physics Letters · doi:10.1063/5.0177609 · Cited by 7 · see citing works

Comparison of SiNx Dielectric Layer Grown by Plasma‐Enhanced Chemical Vapor Deposition, Low‐Pressure Chemical Vapor Deposition, and Metal‐Organic Chemical Vapor Deposition in Diamond‐ and GaN‐Based Integrated Devices

Sun, H., Wu, M., Wang, P., Yuan, C., Ma, G., Yang, L., Ma, X., & Hao, Y. (2024) · physica status solidi (b) · doi:10.1002/pssb.202400052 · Cited by 6 · see citing works

Hot carrier dynamics in a dispersionless plasmonic system

Nayak, B. K., Prabhu, S. S., & Achanta, V. G. (2019) · Journal of Applied Physics · doi:10.1063/1.5119943 · Cited by 6 · see citing works

Mn2+-exchanged USY zeolites derived glass for wide-range optical thermometry

Xu, Z., Lin, H. X., Hong, R., Zhang, D., & Zhou, S. (2021) · Journal of Luminescence · doi:10.1016/j.jlumin.2021.118664 · Cited by 6 · see citing works

Ultra-fast Thermoreflectance Imaging for Electronic, Optoelectronic, and Thermal Devices

Bahk, J., & Shakouri, A. (2019) · IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) · doi:10.1109/bcicts45179.2019.8972732 · Cited by 6 · see citing works

Visualizing electrothermal dynamics in ovonic threshold switches via in-situ thermoreflectance for enhanced reliability

Park, J. H., Kim, H. W., Seo, H. K., Kendig, D., Shakouri, M. S., Kim, G. H., Jang, J. H., Yang, M., & Choi, B. J. (2025) · Materials Today Advances · doi:10.1016/j.mtadv.2025.100602 · Cited by 5 · see citing works

Putting fatigue to rest via solute-pinned boundaries

Jain, M., Vizoso, D. E., Hinojos, A., Barrios, A., Dorman, K. R., Yang, Y., Adams, D. P., Hattar, K., Medlin, D. L., Pierron, O. N., et al. (2026) · Materials Today · doi:10.1016/j.mattod.2026.103187 · Cited by 5 · see citing works

Thermoreflectance imaging to characterize Joule heating, current, and junction resistance in silver-nanowire networks

Sugihara, Y., Tamai, K., Wakamatsu, Y., Kuriyama, R., & Tatsumi, K. (2026) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2026.128426 · Cited by 5 · see citing works

Rapid Electro‐Thermal Micro‐Actuation of Flat Optics Enabled by Laser‐Induced Graphene on Colorless Polyimide Substrates

Kim, B., Lee, Y. G., Yang, D., Fushinobu, K., Kim, Y., & Nomura, M. (2025) · Advanced Optical Materials · doi:10.1002/adom.202500498 · Cited by 5 · see citing works

Full-field pump-probe thermoreflectance imaging for characterization of thin films and 3D integrated circuits

Alajlouni, S., Maize, K., & Shakouri, A. (2022) · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · doi:10.1109/itherm54085.2022.9899513 · Cited by 5 · see citing works

Quantum Sensing of Thermoreflectivity in Electronics

Ather, H., An, H., Owens, H., Alajlouni, S., Shakouri, A., & Hosseini, M. (2023) · Physical Review Applied · doi:10.1103/physrevapplied.19.044040 · Cited by 5 · see citing works

Accelerated thermal property mapping of TRISO advanced nuclear fuel

Moorehead, M. J., Hua, Z., Vallejo, K. D., Beausoleil, G., Khanolkar, A., Gerczak, T. J., Khafizov, M., & Hurley, D. H. (2023) · Materials Today Advances · doi:10.1016/j.mtadv.2023.100455 · Cited by 5 · see citing works

Thermoreflectance-based thermometry of silicon thin films with resonantly enhanced temperature sensitivity

Shi, C., Wang, X., Zheng, Q., Maroske, J., & Thompson, D. (2023) · Optics Express · doi:10.1364/oe.511938 · Cited by 5 · see citing works

Temperature dependence of the thermoreflectance coefficient of gold by the use of a phase-locked single-point measurement approach

Helou, A. E., Raad, P. E., & Komarov, P. L. (2018) · Annual IEEE Semiconductor Thermal Measurement and Management Symposium/Proceedings · doi:10.1109/semi-therm.2018.8357368 · Cited by 5 · see citing works

Thermal Characterization of Field Plated AlGaN/GaN HEMTs

Dundar, C., & Donmezer, F. N. (2019) · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · doi:10.1109/itherm.2019.8757323 · Cited by 5 · see citing works

Resonant enhancement of the thermoreflectance response of silicon nanodisks

Wang, X., Shi, C., Zheng, Q., & Thompson, D. (2025) · Applied Physics Letters · doi:10.1063/5.0276240 · Cited by 5 · see citing works

Wafer-level metal thin film thickness scanning based on multiple probe wavelengths nanosecond transient thermoreflectance

Ma, G., Meng, B., Zhou, S., Mao, Y., Ma, Y., Xiao, X., & Yuan, C. (2024) · Measurement · doi:10.1016/j.measurement.2024.116247 · Cited by 4 · see citing works

Sub-micrometer pyroelectric tomography of AlScN films

Tappertzhofen, S., Bette, S., Sievers, F., Fichtner, S., Bröker, S., & Schmitz-Kempen, T. (2021) · Applied Physics Letters · doi:10.1063/5.0047002 · Cited by 4 · see citing works

High-sensitive dual-mode thermoreflectance microscopy for the stationary and transient thermal analysis of microelectronic devices

Jeong, C. B., Kim, D. U., Han, I., Kim, D., Hur, H., Kim, I. J., Lee, K., Kim, J.-D., Choi, W. J., & Chang, K. S. (2024) · Journal of Physics D Applied Physics · doi:10.1088/1361-6463/ad9612 · Cited by 3 · see citing works

Anisotropic Thermal Transport in Quasi-2D Ruddlesden-Popper Hybrid Perovskite Superlattices

Chen, D., Chu, T. T. M., Li, Y., Li, S., Hu, Q., Park, J. Y., Wang, T., Dai, L., Lu, M., Liu, M., et al. (2025) · Physical Review X · doi:10.1103/kh5d-jrxw · Cited by 3 · see citing works

In-plane thermal conductivity measurements of Si μ-cantilevers using the suspended thermo-reflectance (STR) technique

Sarkar, D., Singh, G., Yilbaş, B. S., Mansoor, S. B., Al-Qahtani, H. M., & Leseman, Z. C. (2024) · Review of Scientific Instruments · doi:10.1063/5.0203391 · Cited by 3 · see citing works

Investigating thermal effects on void formation in electromigration using thermoreflectance imaging

ARAKI, K., Tamai, K., Kuriyama, R., & Tatsumi, K. (2025) · Journal of Thermal Science and Technology · doi:10.1299/jtst.25-00096 · Cited by 3 · see citing works

Ultrathin Fluorescent Nanodiamond Films for Nanoscale Quantum Sensing in Operando Semiconductor Devices

Hui, Y. Y., Tsui, Y., Tang, Y., & Chang, H. (2025) · Advanced Functional Materials · doi:10.1002/adfm.202513406 · Cited by 3 · see citing works

Wavelength dependence of thermoreflectance coefficient of TiNi thin film

Murakami, T., Shimofuri, M., Tsuchiya, T., & Miyake, S. (2025) · Japanese Journal of Applied Physics · doi:10.35848/1347-4065/adb299 · Cited by 3 · see citing works

Using noise to stochastically enhance the resolution of charge coupled device based thermoreflectance imaging

Koskelo, E., Radunskaya, A., & Hudgings, J. A. (2020) · Journal of Applied Physics · doi:10.1063/5.0017231 · Cited by 3 · see citing works

Multi-modal thermography-calibrated barrier in vertical β-Ga2O3 Schottky barrier diodes

Xie, Y., Wu, A., Zhai, Y., He, Y., Liu, Y., Li, H., Liu, W., Yan, D., & Sun, H. (2025) · Cell Reports Physical Science · doi:10.1016/j.xcrp.2025.103016 · Cited by 2 · see citing works

Time-resolved self-heating temperature measurements of AlInN/GaN HEMTs using CeO2 Raman micro-thermometers

Strenaer, R., Guhel, Y., Gaquière, C., & Boudart, B. (2023) · Microelectronics Reliability · doi:10.1016/j.microrel.2023.115156 · Cited by 2 · see citing works

Thermoreflectance property of gallium nitride

Chen, Y., Wu, M., Mo, J., Liu, Y., Zhai, Y., Wu, W., Wu, A., & Liang, F. (2024) · Microelectronics Journal · doi:10.1016/j.mejo.2024.106468 · Cited by 2 · see citing works

Temperature measurements of metal-free GaN using a thermoreflectance-based approach depending on excitation wavelength

Jeon, D.-M., Han, D., Shim, J., & Shin, D. (2025) · Japanese Journal of Applied Physics · doi:10.35848/1347-4065/ada904 · Cited by 2 · see citing works

Optical birefringence imaging of x-ray excited lithium tantalate

Durbin, S. M., Landcastle, A., DiChiara, A. D., Wen, H., Walko, D. A., & Adams, B. W. (2017) · APL Photonics · doi:10.1063/1.4997414 · Cited by 2 · see citing works

Monitoring laser conditioning effect by real-time thermo-reflectance measurement

Wu, J., Ling, X., Chen, X., & Liu, X. (2021) · Physica Scripta · doi:10.1088/1402-4896/ac33fb · Cited by 2 · see citing works

Highly sensitive lock-in thermoreflectance temperature measurement using thermochromic liquid crystal

Takahagi, A., Iguchi, R., Nagano, H., & Uchida, K. (2023) · Applied Physics Letters · doi:10.1063/5.0142754 · Cited by 2 · see citing works

Evaluating the thermal performance of perovskite SrSnO3 field effect transistors

Bista, B., Golani, P., Liu, F., Truttmann, T. K., Pavlidis, G., Centrone, A., Jalan, B., & Koester, S. J. (2023) · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · doi:10.1109/itherm55368.2023.10177570 · Cited by 1 · see citing works

Surface wetting to enhance thermoreflectance characterization of integrated circuits

Alajlouni, S., & Shakouri, A. (2022) · Review of Scientific Instruments · doi:10.1063/5.0101963 · Cited by 1 · see citing works

Thermoreflectance Study of GaAs and GaAs Passivated by the Method of Plasma Enhanced Chemical Vapor Deposition

Chen, Y., Jin, S.-X., Lin, G., Kang, T., Hu, S.-Y., Liu, Y., Zhai, Y., Li, L.-Y., Sun, H., Wu, W., et al. (2022) · Science of Advanced Materials · doi:10.1166/sam.2022.4370 · Cited by 1 · see citing works

Temperature dependence of the thermoreflectance coefficient of gold by the use of a phase-locked single-point measurement approach

Helou, A. E., Raad, P. E., & Komarov, P. L. (2018) · Annual IEEE Semiconductor Thermal Measurement and Management Symposium/Proceedings · doi:10.1109/semi-therm.2018.8357368 · Cited by 5 · see citing works

Quantitative study on thermoreflectance linear relation

Meng, B., Ma, Y., Wang, X., & Yuan, C. (2023) · Journal of Applied Physics · doi:10.1063/5.0164110 · Cited by 36 · see citing works

Precision determination of thermoreflectance coefficients for localised thermometry

Schlag, R., Ras, M. A., Arlt, V., May, D., Winkler, T., & Wunderle, B. (2015) · International Workshop on Thermal Investigations of ICs and Systems · doi:10.1109/therminic.2015.7389633 · Cited by 4 · see citing works

Characterization of thin metal films via frequency-domain thermoreflectance

Schmidt, A. J., Cheaito, R., & Chiesa, M. (2010) · Journal of Applied Physics · doi:10.1063/1.3289907 · Cited by 159 · see citing works

The thermoreflectance approach in Dynamic Thermometry and Thermophysical Property Measurement for Thermal Design of Electronics

Raad, P. E., & Komarov, P. L. (2012) · International Workshop on Thermal Investigations of ICs and Systems