Cited by 160Thermography and Photoacoustic TechniquesThermal properties of materialsThermal Radiation and Cooling Technologies

Thermoreflectance of metal transducers for optical pump-probe studies of thermal properties

Open access
Wilson, R. B., Apgar, Brent A., Martin, Lane W., Cahill, David G.·2012·Optics Express

Abstract

We report measurements of the temperature dependence of the optical reflectivity, dR/dT of fifteen metallic elements at a wavelength of λ = 1.03 μm by time-domain thermoreflectance (TDTR); and the thermoreflectance of thin-films of Pt, Ta, Al, Au, SrRuO(3), and LaNiO(3) over the wavelength range 0.4 < λ < 1.6 μm using variable angle spectroscopic ellipsometry. At λ = 1.03 μm, Al, Ta, Re, Ru, have high values of thermoreflectance, dR/dT > 6∙10(-5) K(-1), and are good choices as optical transducers for TDTR experiments using a Yb:fiber laser oscillator. If low optical reflectivity and the associated high degree of steady-state heating are not a concern, LaNiO(3) provides an exceptionally sensitive thermometer in the infrared; (1/R)(dR/dT) > 2.5∙10(-4) K(-1) in the wavelength range 0.85 < λ < 1.3 μm. This compilation of data will assist in the design and interpretation of optical pump-probe studies of thermal properties.

Integrity signals

Registry

Crossref · 10.1364/oe.20.028829

Cites

23 of 23 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • For a Ti:sapphire oscillator centered around 800 nm, an Al thin layer with thickness about 100 nm is a common choice as the transducer layer due to its strong absorption (99% absorption depth <60 nm) and exceptionally large thermoreflectance coefficient dR/dT ~10−4 K−1 at 800 nm.

    “For a Ti:sapphire oscillator centered around 800 nm, an Al thin layer with a thickness of ~100 nm is a common choice as the transducer layer due to its strong absorption (the 99% absorption depth is <60 nm) 104 and an exceptionally large thermoreflectance coefficient d R /d T ~ 10 -4 K -1 at the 800-nm wavelength. 98, 105, 106”

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Wilson, R. B., Apgar, B. A., Martin, L. W., & Cahill, D. G.
Affiliations
University of Illinois Urbana-Champaign (US)
Venue
Optics Express
Published
2012-12-12
Volume
20
Issue
27
Pages
28829
ISSN
1094-4087 (ISSN-L)
OpenAlex
W1985630444
Cited by
160
References
23
Citations by year
2026: 16 · 2025: 19 · 2024: 11 · 2023: 15 · 2022: 12 · 2021: 21 · 2020: 16 · 2019: 6 · 2018: 8 · 2017: 11 · 2016: 6 · 2015: 6 · 2014: 8 · 2013: 5
FWCI
8.03
Type
journal article
Language
en
Open access
Locations
  • Optics Express (publishedVersion)
  • PubMed (publishedVersion)
  • eScholarship (California Digital Library) (submittedVersion)
Topics
  • Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
Keywords
thermoreflectance, time-domain thermoreflectance, optical reflectivity, thin metal films, infrared thermometry, LaNiO3, SrRuO3, platinum, tantalum, aluminum, gold, optical transducers, thermal properties, optical pump-probe, spectroscopic ellipsometry
MeSH terms
Equipment Design, Lasers, Lenses, Light, Metals, Scattering, Radiation, Temperature, Thermal Conductivity, Transducers, Equipment Failure Analysis

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review