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Cited by 187

The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.

X-ray scattering characterisation of nanoparticles

Ingham, Bridget·2015·Crystallography Reviews

Abstract

This article provides, in tutorial style, a review of X-ray scattering methods commonly used to characterise nanoparticles and gives numerous case studies of basic science and industrial applications right up to the present. It is divided into two major sections, broadly covering X-ray diffraction and small-angle X-ray scattering. Each section begins with a brief introduction to the technique and the information that can be obtained by using it, followed by a discussion on experimental considerations, with a particular focus on nanoparticle characterisation. The techniques and analysis methods are demonstrated by way of examples of a wide variety of nanoparticle materials and synthesis methods. Recent advances in related techniques such as anomalous scattering and pair distribution function analysis are also described and discussed.

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Metadata

Authors
Ingham, B.
Venue
Crystallography Reviews
Published
2015-06-02
Volume
21
Issue
4
Pages
229-303
ISSN
  • 0889-311X (ISSN-L)
  • 1476-3508
OpenAlex
W2169262812
Cited by
187
References
9
FWCI
5.46
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: X-ray scattering characterisation of nanoparticles. https://app.cochat.ai/papers/10.1080/0889311x.2015.1024114
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Ingham, B. (2015). X-ray scattering characterisation of nanoparticles. Crystallography Reviews. https://doi.org/10.1080/0889311x.2015.1024114

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.