The DOI matches its Crossref record; 21 of the 21 references it cites were found in a registry or an index.
Measuring the switching dynamics and energy efficiency of tantalum oxide memristors
Abstract
We measured the real-time switching of metal-oxide memristors with sub-nanosecond resolution and recorded the evolution of the current and voltage during both ON (set) and OFF (reset) events. From these we determined the dynamical behavior of the conductivity for different applied bias amplitudes. Quantitative analysis of the energy cost and switching dynamics showed 115 fJ for ON-switching and 13 pJ for OFF-switching when resistance change was limited to 200%. Results are presented that show a favorable scaling with speed in terms of energy cost and reducing unnecessary damage to the devices.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Citations
Cites
Strukov, D. B., Snider, G. S., Stewart, D. R., & Williams, R. S. (2008) · Nature · doi:10.1038/nature06932 · Cited by 11,828
Self-citationMemristor—The Missing Circuit Element
Chua, L. (1971) · IEEE Transactions on Circuit Theory · doi:10.1109/tct.1971.1083337 · Cited by 10,268
Nanoionics-based resistive switching memories
Waser, R., & Aono, M. (2007) · Nature Materials · doi:10.1038/nmat2023 · Cited by 4,923
Lee, M.-J., Lee, C. B., Lee, D., Lee, S. R., Chang, M., Hur, J. H., Kim, Y.-B., Kim, C.-J., Seo, D. H., Seo, S., et al. (2011) · Nature Materials · doi:10.1038/nmat3070 · Cited by 2,228
Ikeda, S., Hayakawa, J., Ashizawa, Y., Lee, Y. M., Miura, K., Hasegawa, H., Tsunoda, M., Matsukura, F., & Ohno, H. (2008) · Applied Physics Letters · doi:10.1063/1.2976435 · Cited by 1,599
Resistance switching memories are memristors
Chua, L. (2011) · Applied Physics A · doi:10.1007/s00339-011-6264-9 · Cited by 1,434
Reproducible switching effect in thin oxide films for memory applications
Beck, A., Bednorz, J. G., Gerber, C., Rossel, C., & Widmer, D. (2000) · Applied Physics Letters · doi:10.1063/1.126902 · Cited by 1,129
Sawa, A., Fujii, T., Kawasaki, M., & Tokura, Y. (2004) · Applied Physics Letters · doi:10.1063/1.1812580 · Cited by 748
Electrical phenomena in amorphous oxide films
Dearnaley, G., Stoneham, A. M., & Morgan, D. V. (1970) · Reports on Progress in Physics · doi:10.1088/0034-4885/33/3/306 · Cited by 731
Sub-nanosecond switching of a tantalum oxide memristor
Torrezan, A. C., Strachan, J. P., Medeiros-Ribeiro, G., & Williams, R. S. (2011) · Nanotechnology · doi:10.1088/0957-4484/22/48/485203 · Cited by 701
Self-citation
Research works printed but not linked: 1
- Miao F, Adv. Mater.
Cited by
Sorted by citations
Memristive devices for computing
Yang, J. J., Strukov, D. B., & Stewart, D. R. (2013) · Nature Nanotechnology · doi:10.1038/nnano.2012.240 · Cited by 3,885
Resistive switching materials for information processing
Wang, Z., Wu, H., Burr, G. W., Hwang, C. S., Wang, K. L., Xia, Q., & Yang, J. J. (2020) · Nature Reviews Materials · doi:10.1038/s41578-019-0159-3 · Cited by 1,214
A comprehensive review on emerging artificial neuromorphic devices
Zhu, J., Zhang, T., Yang, Y., & Huang, R. (2020) · Applied Physics Reviews · doi:10.1063/1.5118217 · Cited by 783
Pattern classification by memristive crossbar circuits using ex situ and in situ training
Alibart, F., Zamanidoost, E., & Strukov, D. B. (2013) · Nature Communications · doi:10.1038/ncomms3072 · Cited by 642
Li‐Ion Synaptic Transistor for Low Power Analog Computing
Fuller, E. J., Gabaly, F. E., Léonard, F., Agarwal, S., Plimpton, S. J., Jacobs-Gedrim, R. B., James, C. D., Marinella, M. J., & Talin, A. A. (2016) · Advanced Materials · doi:10.1002/adma.201604310 · Cited by 612
Metadata
- Authors
- Strachan, J. P., Torrezan, A. C., Medeiros-Ribeiro, G., & Williams, R. S.
- Affiliations
- Hewlett-Packard (United States) (US)
- Venue
- Nanotechnology
- Publisher
- IOP Publishing
- Published
- 2011-11-23
- Volume
- 22
- Issue
- 50
- Pages
- 505402
- ISSN
- 0957-4484 (ISSN-L)
- 1361-6528
- OpenAlex
- W2167205991
- Cited by
- 114
- References
- 21
- Citations by year
- 2026: 2 · 2025: 2 · 2024: 5 · 2023: 8 · 2022: 5 · 2021: 9 · 2020: 7 · 2019: 6 · 2018: 2 · 2017: 10 · 2016: 15 · 2015: 12 · 2014: 12 · 2013: 15 · 2012: 4
- FWCI
- 6.94
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Nanotechnology (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
- Keywords
- tantalum oxide, memristors, switching dynamics, energy efficiency, energy costs
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review