Cited by 557Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesAdvancements in Semiconductor Devices and Circuit Design

The DOI matches its Crossref record; 35 of the 35 references it cites were found in a registry or an index.

High precision tuning of state for memristive devices by adaptable variation-tolerant algorithm

Open access
Alibart, Fabien, Gao, Ligang, Hoskins, Brian D, Strukov, Dmitri B·2012·Nanotechnology

Abstract

Using memristive properties common for titanium dioxide thin film devices, we designed a simple write algorithm to tune device conductance at a specific bias point to 1% relative accuracy (which is roughly equivalent to seven-bit precision) within its dynamic range even in the presence of large variations in switching behavior. The high precision state is nonvolatile and the results are likely to be sustained for nanoscale memristive devices because of the inherent filamentary nature of the resistive switching. The proposed functionality of memristive devices is especially attractive for analog computing with low precision data. As one representative example we demonstrate hybrid circuitry consisting of an integrated circuit summing amplifier and two memristive devices to perform the analog multiply-and-add (dot-product) computation, which is a typical bottleneck operation in information processing.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1088/0957-4484/23/7/075201

Cites

35 of 35 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Research works printed but not linked: 7

  1. Kim K M, 2011, Nanotechnology, 22
  2. Lee J Park J Jung S Hwang H, 2011, Proc. Int. Technology Conf. and Materials for Advanced Metallization, 1
  3. Papandreou N Pozidis H Pantazi A Sebastian A Breitwisch M Lam C Eleftheriou E, 2011, Proc. IEEE Int. Symp. on Circuits and Systems, 329
  4. Prodromakis T Toumazou C, 2010, Proc. IEEE Int. Conf. on Electronics, Circuits, and Systems, 934
  5. Seo K, 2011, Nanotechnology, 22
  6. Snider G S, 2007, Nanotechnology, 18
  7. Strachan J P, 2011, Nanotechnology, 22

Cited by

Sorted by citations

See all 557

Metadata

Authors
Alibart, F., Gao, L., Hoskins, B. D., & Strukov, D. B.
Affiliations
University of California, Santa Barbara (US)
Venue
Nanotechnology
Published
2012-01-20
Volume
23
Issue
7
Pages
075201
ISSN
  • 0957-4484 (ISSN-L)
  • 1361-6528
OpenAlex
W2091777687
Cited by
557
References
35
Citations by year
2026: 9 · 2025: 26 · 2024: 21 · 2023: 37 · 2022: 37 · 2021: 45 · 2020: 56 · 2019: 73 · 2018: 58 · 2017: 43 · 2016: 47 · 2015: 39 · 2014: 27 · 2013: 22 · 2012: 16
FWCI
21.27
Type
journal article
Language
en
Open access
Locations
  • Nanotechnology (publishedVersion)
  • PubMed (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Funders
  • National Science Foundation (1028336, 1121053)
  • Division of Materials Research (DMR 1121053, 1121053)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Semiconductor Devices and Circuit Design
Keywords
memristors, TiO2 thin films, resistive switching, conductance tuning, variation tolerance, filamentary switching, non-volatile memory, analog computing, dot product computation, summing amplifier

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review