Cited by 50Thermal properties of materialsMetal and Thin Film MechanicsAdvanced Thermoelectric Materials and Devices

Phonon and electron contributions to the thermal conductivity of VNx epitaxial layers

Zheng, Qiye, Mei, Antonio B., Tuteja, Mohit, Sangiovanni, Davide G., Hultman, Lars, Petrov, Ivan, Greene, J. E., Cahill, David G.·2017·Physical Review Materials

Abstract

Thermal conductivities of $\mathrm{V}{\mathrm{N}}_{x}/\mathrm{MgO}$(001) ($0.76\ensuremath{\le}x\ensuremath{\le}1.00$) epitaxial layers, grown by reactive magnetron sputter deposition, are measured in the temperature range $300<T<1000\phantom{\rule{0.16em}{0ex}}\mathrm{K}$ using time-domain thermoreflectance (TDTR). Data for the total thermal conductivity are compared to the electronic contribution to the thermal conductivity calculated from the measured electrical conductivity, the Wiedemann-Franz law, and an estimate of the temperature dependence of the Lorenz number $L$($T$). The total thermal conductivity is dominated by electron contribution and varies between $13\phantom{\rule{0.16em}{0ex}}\mathrm{W}\phantom{\rule{0.16em}{0ex}}{\mathrm{m}}^{\ensuremath{-}1}\phantom{\rule{0.16em}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$ at $x=0.76$ and $20\phantom{\rule{0.16em}{0ex}}\mathrm{W}\phantom{\rule{0.16em}{0ex}}{\mathrm{m}}^{\ensuremath{-}1}\phantom{\rule{0.16em}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$ at $x=1.00$ for $T=300\phantom{\rule{0.16em}{0ex}}\mathrm{K}$ and between 25 and $35\phantom{\rule{0.16em}{0ex}}\mathrm{W}\phantom{\rule{0.16em}{0ex}}{\mathrm{m}}^{\ensuremath{-}1}\phantom{\rule{0.16em}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$ for $T=1000\phantom{\rule{0.16em}{0ex}}\mathrm{K}$. The lattice thermal conductivity vs $x$ ranges from 5 to $7\phantom{\rule{0.16em}{0ex}}\mathrm{W}\phantom{\rule{0.16em}{0ex}}{\mathrm{m}}^{\ensuremath{-}1}\phantom{\rule{0.16em}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$ at 300 K and decreases by 20% at 500 K. The low magnitude and weak temperature dependence of the lattice thermal conductivity are attributed to strong electron-phonon coupling in VN.

Integrity signals

Registry

Crossref · 10.1103/physrevmaterials.1.065002

Cites

60 of 60 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Researchers are looking for alternative metal transducers for TDTR measurements at higher temperatures (with Pt and HfN as potential candidates) or attempting to perform TDTR measurements without metal transducers at high temperatures.

    “Researchers are looking for alternative metal transducers for TDTR measurements at higher temperatures (with Pt and HfN 229 as two examples of the potential candidates) or attempting to perform TDTR measurements without metal transducers at high temperatures. 142”

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Zheng, Q., Mei, A. B., Tuteja, M., Sangiovanni, D. G., Hultman, L., Petrov, I., Greene, J. E., & Cahill, D. G.
Affiliations
  • University of Illinois Urbana-Champaign (US)
  • Linköping University (SE)
Venue
Physical Review Materials
Published
2017-11-20
Volume
1
Issue
6
ISSN
2475-9953 (ISSN-L)
OpenAlex
W2769758651
Cited by
50
References
60
Citations by year
2026: 1 · 2025: 8 · 2024: 3 · 2023: 2 · 2022: 5 · 2021: 8 · 2020: 9 · 2019: 6 · 2018: 8
FWCI
2.66
Type
journal article
Language
en
Open access
closed
Locations
  • Physical Review Materials (publishedVersion)
  • Rare & Special e-Zone (The Hong Kong University of Science and Technology) (submittedVersion)
Funders
Vetenskapsrådet (2009-00971, 2013-4018, 2014-5790)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Mechanics of Materials › Metal and Thin Film Mechanics
  • Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
Keywords
thermal conductivity, vanadium nitride, electronic thermal conductivity, lattice thermal conductivity, Lorenz number, Wiedemann-Franz law, MgO(001) substrate, time-domain thermoreflectance, nitridation, epitaxial growth

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review