Cited by 486Thermal properties of materialsThermography and Photoacoustic TechniquesSemiconductor materials and interfaces

Thermal conductance of epitaxial interfaces

Costescu, Ruxandra M., Wall, Marcel A., Cahill, David G.·2003·Physical Review B

Abstract

The thermal conductance of interfaces between epitaxial TiN and single crystal oxides is measured at temperatures between 79.4 and 294 K using time-domain thermoreflectance. The analysis method relies on the ratio of the in-phase and out-of-phase signals of the lock-in amplifier for more accurate data analysis. The validity of this approach is tested by measurements on 6.5, 11.8, and 25 nm thick thermally oxidized ${\mathrm{SiO}}_{2}$ on Si. The thermal conductances G of TiN/MgO(001), TiN/MgO(111), and ${\mathrm{T}\mathrm{i}\mathrm{N}/\mathrm{A}\mathrm{l}}_{2}{\mathrm{O}}_{3}(0001)$ interfaces are essentially identical and in good agreement with the predictions of lattice dynamics models and the diffuse mismatch model with a four-atom fcc unit cell. Near room temperature, $G\ensuremath{\approx}700{\phantom{\rule{0ex}{0ex}}\mathrm{M}\mathrm{W}\mathrm{m}}^{\ensuremath{-}2}\phantom{\rule{0ex}{0ex}}{\mathrm{K}}^{\ensuremath{-}1},$ $\ensuremath{\approx}5$ times larger than the highest values reported previously for any individual interface.

Integrity signals

Registry

Crossref · 10.1103/physrevb.67.054302

Cites

26 of 26 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Costescu, R. M., Wall, M. A., & Cahill, D. G.
Affiliations
University of Illinois Urbana-Champaign (US)
Venue
Physical Review B
Published
2003-02-27
Volume
67
Issue
5
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W2056831945
Cited by
486
References
26
Citations by year
2026: 12 · 2025: 17 · 2024: 21 · 2023: 13 · 2022: 23 · 2021: 25 · 2020: 32 · 2019: 31 · 2018: 31 · 2017: 36 · 2016: 35 · 2015: 24 · 2014: 27 · 2013: 21 · 2012: 22
FWCI
8.06
Type
journal article
Language
en
Open access
closed
Locations
Physical review. B, Condensed matter (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Semiconductor materials and interfaces
Keywords
thermal conductance, epitaxial interface, tin, MgO, alumina, time-domain thermoreflectance, diffuse mismatch model, lattice dynamics, interfacial heat transfer

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review