The DOI matches its Crossref record; 37 of the 37 references it cites were found in a registry or an index.
Nanoscale CMOS
Abstract
This paper examines the apparent limits, possible extensions, and applications of CMOS technology in the nanometer regime. Starting from device scaling theory and current industry projections, we analyze the achievable performance and possible limits of CMOS technology from the point of view of device physics, device technology, and power consumption. Various possible extensions to the basic logic and memory devices are reviewed, with emphasis on novel devices that are structurally distinct front conventional bulk CMOS logic and memory devices. Possible applications of nanoscale CMOS are examined, with a view to better defining the likely capabilities of future microelectronic systems. This analysis covers both data processing applications and nondata processing applications such as RF and imaging. Finally, we speculate on the future of CMOS for the coming 15-20 years.
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Cites
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Cited by
Spintronics: Fundamentals and applications
Žutić, I., Fabian, J., & Das Sarma, S. (2004) · Reviews of Modern Physics · doi:10.1103/revmodphys.76.323 · Cited by 11,268
Beyond the conventional transistor
Wong, H.-S. P. (2002) · IBM Journal of Research and Development · doi:10.1147/rd.462.0133 · Cited by 573
Self-citationTwo-dimensional quantum mechanical modeling of nanotransistors
Svizhenko, A., Anantram, M. P., Govindan, T. R., Biegel, B., & Venugopal, R. (2002) · Journal of Applied Physics · doi:10.1063/1.1432117 · Cited by 458
Metadata
- Authors
- Wong, H.-S. P., Frank, D. J., Solomon, P. M., Wann, C. H. J., & Welser, J. J.
- Venue
- Proceedings of the IEEE
- Published
- 1999-04
- Volume
- 87
- Issue
- 4
- Pages
- 537-570
- ISSN
- 0018-9219 (ISSN-L)
- OpenAlex
- W2294398660
- Cited by
- 444
- References
- 37
- FWCI
- 29.81
- Type
- journal article
- Language
- it
- Open access
- closed
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- Wong, H.-S. P., Frank, D. J., Solomon, P. M., Wann, C. H. J., & Welser, J. J. (1999). Nanoscale CMOS. Proceedings of the IEEE. https://doi.org/10.1109/5.752515
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