Cited by 80Industrial Vision Systems and Defect DetectionAnomaly Detection Techniques and ApplicationsInfrastructure Maintenance and Monitoring

Focus Your Distribution: Coarse-to-Fine Non-Contrastive Learning for Anomaly Detection and Localization

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Zheng, Ye, Wang, Xiang, Deng, Rui, Bao, Tianpeng, Zhao, Rui, Wu, Liwei·2022·2022 IEEE International Conference on Multimedia and Expo (ICME)

Abstract

The essence of unsupervised anomaly detection is to learn the compact distribution of normal samples and detect outliers as anomalies in testing. Meanwhile, the anomalies in real-world are usually subtle and fine-grained in a high-resolution image especially for industrial applications. Towards this end, we propose a novel framework for unsupervised anomaly detection and localization. Our method aims at learning dense and compact distribution from normal images with a coarse-to-fine alignment process. The coarse alignment stage standardizes the pixel-wise position of objects in both image and feature levels. The fine alignment stage then densely maximizes the similarity of features among all corresponding locations in a batch. To facilitate the learning with only normal images, we propose a new pretext task called non-contrastive learning for the fine alignment stage. Non-contrastive learning extracts robust and discriminating normal image representations without making assumptions on abnormal samples, and it thus empowers our model to generalize to various anomalous scenarios. Extensive experiments on two typical industrial datasets of MVTec AD and BenTech AD demonstrate that our framework is effective in detecting various real-world defects and achieves a new state-of-the-art in industrial unsupervised anomaly detection.

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Crossref · 10.1109/icme52920.2022.9859925

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17 of 17 references verified0 citation errors · 0 not checkable

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Authors
Zheng, Y., Wang, X., Deng, R., Bao, T., Zhao, R., & Wu, L.
Affiliations
  • Chinese Academy of Sciences (CN)
  • Sensetime (China) (CN)
  • University of California, Los Angeles (US)
Venue
2022 IEEE International Conference on Multimedia and Expo (ICME)
Publisher
IEEE
Published
2022-07-18
Pages
1-6
OpenAlex
W4293519058
Cited by
80
References
18
Citations by year
2026: 5 · 2025: 26 · 2024: 29 · 2023: 16 · 2022: 4
FWCI
28.01
Type
conference paper
Language
en
Open access
Locations
  • IEEE International Conference on Multimedia and Expo (ICME) (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
Keywords
unsupervised anomaly detection, anomaly localization, coarse-to-fine alignment, non-contrastive learning, industrial defect detection, pretext tasks, MVTec AD

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