Focus Your Distribution: Coarse-to-Fine Non-Contrastive Learning for Anomaly Detection and Localization
Open accessAbstract
The essence of unsupervised anomaly detection is to learn the compact distribution of normal samples and detect outliers as anomalies in testing. Meanwhile, the anomalies in real-world are usually subtle and fine-grained in a high-resolution image especially for industrial applications. Towards this end, we propose a novel framework for unsupervised anomaly detection and localization. Our method aims at learning dense and compact distribution from normal images with a coarse-to-fine alignment process. The coarse alignment stage standardizes the pixel-wise position of objects in both image and feature levels. The fine alignment stage then densely maximizes the similarity of features among all corresponding locations in a batch. To facilitate the learning with only normal images, we propose a new pretext task called non-contrastive learning for the fine alignment stage. Non-contrastive learning extracts robust and discriminating normal image representations without making assumptions on abnormal samples, and it thus empowers our model to generalize to various anomalous scenarios. Extensive experiments on two typical industrial datasets of MVTec AD and BenTech AD demonstrate that our framework is effective in detecting various real-world defects and achieves a new state-of-the-art in industrial unsupervised anomaly detection.
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Momentum Contrast for Unsupervised Visual Representation Learning
He, K., Fan, H., Wu, Y., Xie, S., & Girshick, R. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00975 · Cited by 13,347 · see citing works
A simple framework for contrastive learning of visual representations
Chen, T., Kornblith, S., Norouzi, M., & Hinton, G. (2020) · arXiv · doi:10.48550/arxiv.2002.05709 · Cited by 10,857 · see citing works
Jaderberg, M., Simonyan, K., Zisserman, A., & Kavukcuoglu, K. (2015) · arXiv · doi:10.48550/arxiv.1506.02025 · Cited by 5,137 · see citing works
MVTec AD — A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection
Bergmann, P., Fauser, M., Sattlegger, D., & Steger, C. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00982 · Cited by 2,203 · see citing works
Support Vector Method for Novelty Detection
Schölkopf, B., Williamson, R. C., Smola, A. J., Shawe-Taylor, J. S., & Platt, J. C. (1999) · Cited by 2,038 · see citing works
Ruff, L., Vandermeulen, R. A., Görnitz, N., Deecke, L., Siddiqui, S. A., Binder, A., Müller, E., & Kloft, M. (2018) · International Conference on Machine Learning · Cited by 1,719 · see citing works
PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Localization
Defard, T., Setkov, A., Loesch, A., & Audigier, R. (2021) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-68799-1_35 · Cited by 1,415 · see citing works
CutPaste: Self-Supervised Learning for Anomaly Detection and Localization
Li, C.-L., Sohn, K., Yoon, J., & Pfister, T. (2021) · 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr46437.2021.00954 · Cited by 1,107 · see citing works
A Unifying Review of Deep and Shallow Anomaly Detection
Ruff, L., Kauffmann, J., Vandermeulen, R. A., Montavon, G., Samek, W., Kloft, M., Dietterich, T. G., & Muller, K.-R. (2021) · Proceedings of the IEEE · doi:10.1109/jproc.2021.3052449 · Cited by 1,080 · see citing works
Uninformed Students: Student-Teacher Anomaly Detection With Discriminative Latent Embeddings
Bergmann, P., Fauser, M., Sattlegger, D., & Steger, C. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00424 · Cited by 990 · see citing works
Patch SVDD: Patch-Level SVDD for Anomaly Detection and Segmentation
Yi, J., & Yoon, S. (2021) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-69544-6_23 · Cited by 551 · see citing works
Deep Anomaly Detection Using Geometric TransformationsPreprint
Golan, I., & El‐Yaniv, R. (2018) · arXiv (Cornell University) · doi:10.48550/arxiv.1805.10917 · Cited by 479 · see citing works
VT-ADL: A Vision Transformer Network for Image Anomaly Detection and Localization
Mishra, P., Verk, R., Fornasier, D., Piciarelli, C., & Foresti, G. L. (2021) · 2021 IEEE 30th International Symposium on Industrial Electronics (ISIE) · doi:10.1109/isie45552.2021.9576231 · Cited by 462 · cited 2× · see citing works
“We perform experiments on two industrial anomaly detection datastes MVTec AD dataset (Bergmann et al. 2019) and BeanTech AD dataset (Mishra et al. 2021”
MethodSub-Image Anomaly Detection with Deep Pyramid Correspondences
Cohen, N., & Hoshen, Y. (2020) · arXiv · doi:10.48550/arxiv.2005.02357 · Cited by 372 · see citing works
Explainable Deep One-Class Classification
Liznerski, P., Ruff, L., Vandermeulen, R. A., Franks, B. J., Kloft, M., & Müller, K.-R. (2020) · arXiv · doi:10.48550/arxiv.2007.01760 · Cited by 185 · see citing works
Deep Nearest Neighbor Anomaly DetectionPreprint
Bergman, L., Cohen, N., & Hoshen, Y. (2020) · arXiv (Cornell University) · doi:10.48550/arxiv.2002.10445 · Cited by 154 · see citing works
Learning and Evaluating Representations for Deep One-class ClassificationPreprint
Sohn, K., Li, C., Yoon, J., Jin, M., & Pfister, T. (2020) · arXiv (Cornell University) · doi:10.48550/arxiv.2011.02578 · Cited by 138 · see citing works
Flagged first, then by citations
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Deep Industrial Image Anomaly Detection: A Survey
Liu, J., Xie, G., Wang, J., Li, S., Wang, C., Zheng, F., & Jin, Y. (2024) · Machine Intelligence Research · doi:10.1007/s11633-023-1459-z · Cited by 463 · see citing works
Yang, M., Wu, P., & Feng, H. (2023) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2023.105835 · Cited by 257 · see citing works
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey
Tao, X., Gong, X., Zhang, X., Yan, S., & Adak, C. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3196436 · Cited by 228 · see citing works
Registration Based Few-Shot Anomaly Detection
Huang, C., Guan, H., Jiang, A., Zhang, Y., Spratling, M., & Wang, Y.-F. (2022) · Lecture Notes in Computer Science · doi:10.1007/978-3-031-20053-3_18 · Cited by 216 · see citing works
A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images
Cui, Y., Liu, Z., & Lian, S. (2023) · IEEE Access · doi:10.1109/access.2023.3282993 · Cited by 164 · see citing works
A survey of deep learning for industrial visual anomaly detection
Li, Z., Yan, Y., Wang, X., Ge, Y., & Meng, L. (2025) · Artificial Intelligence Review · doi:10.1007/s10462-025-11287-7 · Cited by 145 · see citing works
Self-citationPrototypical Residual Networks for Anomaly Detection and Localization
Zhang, H., Wu, Z., Wang, Z., Chen, Z., & Jiang, Y. (2023) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52729.2023.01562 · Cited by 126 · see citing works
FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction
Fang, Z., Wang, X., Li, H., Liu, J., Hu, Q., & Xiao, J. (2023) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv51070.2023.01603 · Cited by 118 · see citing works
Self-citationExploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection
Luo, W., Cao, Y., Yao, H., Zhang, X., Lou, J., Cheng, Y., Shen, W., & Yu, W. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.00932 · Cited by 65 · see citing works
Template-guided Hierarchical Feature Restoration for Anomaly Detection
Guo, H., Ren, L., Fu, J., Wang, Y., Zhang, Z., Lan, C., Wang, H., & Hou, X. (2023) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv51070.2023.00593 · Cited by 54 · see citing works
MIAD: A Maintenance Inspection Dataset for Unsupervised Anomaly Detection
Bao, T., Chen, J., Li, W., Wang, X., Fei, J., Wu, L., Zhao, R. J., & Ye, Z. (2023) · IEEE International Conference on Computer Vision Workshops · doi:10.1109/iccvw60793.2023.00106 · Cited by 40 · see citing works
Self-citationLi, H., Hu, J., Li, B., Chen, H., Zheng, Y., & Shen, C. (2024) · IEEE Transactions on Image Processing · doi:10.1109/tip.2024.3448263 · Cited by 39 · see citing works
Self-citationREB: Reducing biases in representation for industrial anomaly detection
Lyu, S., Mo, D., & Wong, W. K. (2024) · Knowledge-Based Systems · doi:10.1016/j.knosys.2024.111563 · Cited by 38 · see citing works
U-Flow: A U-Shaped Normalizing Flow for Anomaly Detection with Unsupervised Threshold
Tailanián, M., Pardo, Á., & Musé, P. (2024) · Journal of Mathematical Imaging and Vision · doi:10.1007/s10851-024-01193-y · Cited by 34 · see citing works
Shukla, V., Shukla, A., K, S. P. S., & Shukla, S. (2025) · Frontiers in Robotics and AI · doi:10.3389/frobt.2025.1554196 · Cited by 35 · see citing works
SoftPatch+: Fully unsupervised anomaly classification and segmentation
Wang, C., Jiang, X., Gao, B.-B., Gan, Z., Liu, Y., Zheng, F., & Ma, L. (2024) · Pattern Recognition · doi:10.1016/j.patcog.2024.111295 · Cited by 27 · see citing works
Simple and effective Frequency-aware Image Restoration for industrial visual anomaly detection
Liu, T., Li, B., Du, X., Jiang, B., Geng, L., Wang, F., & Zhao, Z. (2024) · Advanced Engineering Informatics · doi:10.1016/j.aei.2024.103064 · Cited by 63 · see citing works
Anomaly Detection using Score-based Perturbation Resilience
Shin, W., Lee, J., Lee, T.-H., Lee, S., & Yun, J. P. (2023) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv51070.2023.02136 · Cited by 26 · see citing works
FR-PatchCore: An Industrial Anomaly Detection Method for Improving Generalization
Jiang, Z., Zhang, Y., Wang, Y., Li, J., & Gao, X. (2024) · Sensors · doi:10.3390/s24051368 · Cited by 25 · see citing works
A Survey of Methods for Automated Quality Control Based on Images
Diers, J., & Pigorsch, C. (2023) · International Journal of Computer Vision · doi:10.1007/s11263-023-01822-w · Cited by 26 · see citing works
Low-Shot Unsupervised Visual Anomaly Detection via Sparse Feature Representation
Zhang, F., Zhu, H., Cen, Y., Kan, S., Zhang, L., Vadakkepat, P., & Lee, T. H. (2024) · IEEE Transactions on Neural Networks and Learning Systems · doi:10.1109/tnnls.2024.3420818 · Cited by 23 · see citing works
Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples
Pei, M.-J., Liu, N., Zhao, B., & Sun, H. (2023) · International Journal of Computational Intelligence Systems · doi:10.1007/s44196-023-00328-0 · Cited by 22 · see citing works
Few-Shot Anomaly Detection via Category-Agnostic Registration Learning
Huang, C., Guan, H., Jiang, A., Wang, Y.-F., Spratling, M., Wang, X., & Zhang, Y. (2024) · IEEE Transactions on Neural Networks and Learning Systems · doi:10.1109/tnnls.2024.3465446 · Cited by 20 · see citing works
Self-citationNoise-to-Norm Reconstruction for Industrial Anomaly Detection and Localization
Deng, S., Sun, Z., Zhuang, R., & Gong, J. (2023) · Applied Sciences · doi:10.3390/app132212436 · Cited by 17 · see citing works
Discriminative Feature Learning Framework With Gradient Preference for Anomaly Detection
Xu, M., Zhou, X., Gao, X., He, W., & Niu, S. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3228007 · Cited by 15 · see citing works
ToCoAD: Two-Stage Contrastive Learning for Industrial Anomaly Detection
Liang, Y., Hu, Z., Huang, J., Di, D., Su, A., & Fan, L. (2025) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2025.3545987 · Cited by 15 · see citing works
GrainBrain: Multiview Identification and Stratification of Defective Grain Kernels
Fan, L., Fan, D., Ding, Y., Wu, Y. W., Di, D., Pagnucco, M., & Song, Y. (2025) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2025.3528555 · Cited by 13 · see citing works
Ma, Q., Zhang, E., Chen, Y., Duan, J., & Shao, L. (2023) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2023.107131 · Cited by 12 · see citing works
Self-Supervised Autoencoders for Visual Anomaly Detection
Bauer, A., Nakajima, S., & Müller, K. (2024) · Mathematics · doi:10.3390/math12243988 · Cited by 11 · see citing works
WARM: A wavelet adaptive restoration module for surface anomaly detection
Qiao, Z., Lin, M., Lin, J., & Ding, D. (2024) · Measurement · doi:10.1016/j.measurement.2024.114689 · Cited by 9 · see citing works
Few-shot anomaly detection with adaptive feature transformation and descriptor construction
Zhengnan, H. U., Xiangrui, Z. E. N. G., Li, Y., Yin, Z., Meng, E., Zhu, L., & Kong, X. (2024) · Chinese Journal of Aeronautics · doi:10.1016/j.cja.2024.06.007 · Cited by 9 · see citing works
Semi-supervised noise-resilient anomaly detection with feature autoencoder
Zhu, T., Liu, L., Sun, Y., Lü, Z., Zhang, Y., Xu, C., & Chen, J. (2024) · Knowledge-Based Systems · doi:10.1016/j.knosys.2024.112445 · Cited by 9 · see citing works
DC-AD: A Divide-and-Conquer Method for Few-Shot Anomaly Detection
Zhang, J., Yang, Z., & Song, Y. (2025) · Pattern Recognition · doi:10.1016/j.patcog.2025.111360 · Cited by 8 · see citing works
Li, Z., Ge, Y., & Meng, L. (2025) · Information Fusion · doi:10.1016/j.inffus.2025.103356 · Cited by 8 · see citing works
ADFormer: Generalizable Few-Shot Anomaly Detection With Dual CNN-Transformer Architecture
Zhu, B., Gu, Z., Zhu, G., Chen, Y., Tang, M., & Wang, J. (2024) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2024.3522624 · Cited by 8 · see citing works
PNG: an adaptive local-global hybrid framework for unsupervised material surface defect detection
Sun, Q., Xu, K., Zhao, D., Li, H., Jin, L., Liu, C., & Xu, P. (2025) · Expert Systems with Applications · doi:10.1016/j.eswa.2025.128711 · Cited by 7 · see citing works
Zhang, Y., Li, Z., Lai, T., Li, W., & Zheng, X. (2024) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2024.3370756 · Cited by 6 · see citing works
Han, D., Xu, L., Zhou, M., Wan, J., Li, M., & Li, G. (2024) · Neural Networks · doi:10.1016/j.neunet.2024.106906 · Cited by 6 · see citing works
DAS3D: Dual-Modality Anomaly Synthesis for 3D Anomaly Detection
Li, K., Dai, B., Fu, J., & Hou, X. (2025) · Lecture notes in computer science · doi:10.1007/978-3-031-92805-5_10 · Cited by 6 · see citing works
Self-supervised Augmented Patches Segmentation for Anomaly Detection
Long, J., Yang, Y., Hua, L., & Ou, Y. (2023) · Lecture notes in computer science · doi:10.1007/978-3-031-26284-5_6 · Cited by 6 · see citing works
Zhang, R., Wang, H., Feng, M., Liu, Y., & Yang, G. (2023) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2023.3295468 · Cited by 6 · see citing works
Learned Optical Flow-Based Defect Detection With Coarse-to-Fine Nonrigid Image Alignment
Deng, L., Meng, X., Guo, X., Chen, Y., Shan, H., Wu, S., Lin, J., Dong, M., & Zhu, L. (2025) · IEEE Sensors Journal · doi:10.1109/jsen.2025.3530104 · Cited by 5 · see citing works
Efficient visual anomaly detection model with adaptive wavelet transform
Du, X., Li, B., Liu, T., Jin, L., Ding, Y., & Zhao, Z. (2024) · Optics and Lasers in Engineering · doi:10.1016/j.optlaseng.2024.108457 · Cited by 5 · see citing works
Wang, H., He, X., Zhang, C., Liang, X., Zhu, P., Wang, X., Gui, W., Li, X., & Qian, X. (2025) · Measurement · doi:10.1016/j.measurement.2025.116702 · Cited by 5 · see citing works
Self-citationAdapSyn: Anomaly detection based on triplet training with adaptive anomaly synthesis
Zhou, S., Lin, C., Chen, Z., Guo, B., & Zhao, Y. (2024) · Displays · doi:10.1016/j.displa.2024.102885 · Cited by 5 · see citing works
Frequency domain nuances guided parallel transformer model for industrial anomaly localization
Zhao, J., Yu, K., Miao, Y., Wang, Y., Ma, Y., Zhang, J., Zhao, J., Qiang, Y., & Pei, B. (2024) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2024.109852 · Cited by 5 · see citing works
SegLGAD: Local-to-global industrial anomaly detection with visual segmentation model
Du, X., Li, B., Liu, T., Ding, Y., Jin, L., & Zhao, Z. (2025) · Optics & Laser Technology · doi:10.1016/j.optlastec.2025.112633 · Cited by 4 · see citing works
Zero-shot printed circuit board defect detection via optical flow and reconstruction guidance
Yin, X., Wang, S., Wang, Y., Wang, P., Liu, Y., Shen, T., & Qiao, H. (2025) · Computers in Industry · doi:10.1016/j.compind.2025.104355 · Cited by 4 · see citing works
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Guo, J., Yu, X., & Wang, L. (2022) · Future Internet · doi:10.3390/fi14030086 · Cited by 4 · see citing works
LightFlow: Lightweight Unsupervised Defect Detection Based on 2-D Flow
Peng, C., Zhao, L., Wang, S., Abbas, Z., Liang, F., & Islam, M. S. (2024) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2024.3415769 · Cited by 4 · see citing works
Tout, K., Samet, N., & Bouteille, P. (2023) · e-Journal of Nondestructive Testing · doi:10.58286/28510 · Cited by 3 · see citing works
Cross‐class pest and disease vegetation detection based on small sample registration
Liu, J., Linfeng, W., Yunsheng, W., Mingming, A., Wenfei, J., & Xu, S. (2023) · IET Image Processing · doi:10.1049/ipr2.12779 · Cited by 2 · see citing works
Shin, M., Jeong, S.-G., & Heo, Y. S. (2025) · IEEE Access · doi:10.1109/access.2025.3568866 · Cited by 2 · see citing works
Task-oriented semantic communication towards industrial anomaly detection
Lin, C., Zhang, P., Wang, R., & Yang, Z. (2025) · Journal of the Franklin Institute · doi:10.1016/j.jfranklin.2025.107886 · Cited by 2 · see citing works
MemFlow-AD: An anomaly detection and localization model based on memory module and normalizing flow
Xie, X., Li, Z., Xiong, S., Liu, Z., & Cai, T. (2025) · Journal of Visual Communication and Image Representation · doi:10.1016/j.jvcir.2025.104454 · Cited by 2 · see citing works
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Li, S., Na, Z., Yang, G., Hou, Y., & Zhang, X. (2025) · Journal of Imaging · doi:10.3390/jimaging11060190 · Cited by 2 · see citing works
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Cho, Y., Lee, D. H., Hyun, Y., & Kim, W. (2024) · IEEE Access · doi:10.1109/access.2024.3400122 · Cited by 1 · see citing works
SPACE: SPAtial-Aware Consistency rEgularization for Anomaly Detection in Industrial Applications
Kim, D.-H., Kim, H., Jeong, D., Suh, S., & Cho, H. (2025) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv61041.2025.00698 · Cited by 1 · see citing works
DFTGL: Domain Filtered and Target Guided Learning for few-shot anomaly detection
Zhang, J., Song, Y., & Yang, Z. (2025) · Journal of Visual Communication and Image Representation · doi:10.1016/j.jvcir.2025.104457 · Cited by 1 · see citing works
Xiong, J., Zhang, Q., Wang, Q., Yang, J., Dong, X., & Liang, Q. (2025) · The International Journal of Advanced Manufacturing Technology · doi:10.1007/s00170-025-16431-9 · Cited by 1 · see citing works
Prior-Guided Feature Sampling and Restoration for Few-Shot Industrial Anomaly Detection
Hu, X., & Yang, H. (2026) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2026.3670014 · Cited by 1 · see citing works
Registration Based Feature Core-Set Model for Defect Detection
Jing, X. (2023) · China Automation Congress (CAC) · doi:10.1109/cac59555.2023.10450867 · Cited by 1 · see citing works
Zhang, Y., Jiang, Z., Peng, C. X., Zhu, X., & Wang, G. (2024) · Journal of Organizational and End User Computing · doi:10.4018/joeuc.342094 · Cited by 1 · see citing works
FGSNet: A Finer-Grained Siamese Network for Industrial Few-Shot Anomaly Detection
Han, D., Xu, L., Zhou, M., Li, G., & Li, M. (2024) · Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics · doi:10.1109/smc54092.2024.10831932 · Cited by 1 · see citing works
An Anomaly Detection and Localization Method Based on Feature Fusion and Attention
Li, Z., Xie, X., Wu, D., Xiong, S., & Cai, T. (2024) · Lecture notes in computer science · doi:10.1007/978-981-99-9788-6_19
Ban, H., Kim, D.-H., Kim, H., & Cho, H. (2024) · International Conference on Electronics, Information, and Communication (ICEIC) · doi:10.1109/iceic61013.2024.10457237
Adapsyn: Anomaly Detection Based on Triplet Training with Adaptive Anomaly Synthesis (Chinamm2024)Preprint
Zhou, S., Lin, C., Chen, Z., Guo, B., & Zhao, Y. (2024) · SSRN Electronic Journal · doi:10.2139/ssrn.4889011
Real-Time Industrial Anomaly Detection via Sparse Reconstruction
Zhou, C., Wan, J., & Zhao, X. (2024) · IEEE International Conference on Real-time Computing and Robotics (RCAR) · doi:10.1109/rcar61438.2024.10670980
Few-Shot Industrial Anomaly Detection via Proxy Task Learning on Normal Samples
He, S., Xu, R., Huang, W., Chen, Y., & Wang, L. (2024) · IEEE Smart World Congress (SWC) · doi:10.1109/swc62898.2024.00220
NLPA-AD: normal label propagation algorithm for zero-shot texture anomaly detection
Zhang, J., Song, Y., Yang, Z., & Wang, C. (2025) · Applied Intelligence · doi:10.1007/s10489-025-06733-6
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Zheng, Z., Yang, H. S., & Yin, Z. (2025) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2025.3598017 · Cited by 1 · see citing works
Research on Defect Detection of Wire Rope of Mine Hoist Based on Feature Embedding
Ma, T., Wang, J., Zhou, L., Li, J., Li, Y., & Yang, J. (2025) · International Conference on Image, Vision and Computing (ICIVC) · doi:10.1109/icivc66358.2025.11200405
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Koizumi, K., Hayami, T., & WATANABE, H. K. (2025) · IEEE Global Conference on Consumer Electronics (GCCE) · doi:10.1109/gcce65946.2025.11275329
A defect detection method based on feature reconstruction using diffusion models
Chen, X.-F., Fu, F., & Fang, M. (2025) · Signal Image and Video Processing · doi:10.1007/s11760-025-05037-z
Dong, S., Hu, F., Wei, B., & Wu, Y. (2025) · Information Fusion · doi:10.1016/j.inffus.2025.103707
Few-shot anomaly detection via adaptive graph feature registration
Wang, G., Xu, S., Li, K., & Ren, K. (2026) · Knowledge and Information Systems · doi:10.1007/s10115-025-02678-x
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Le, T. (2024) · theses.fr (ABES) · doi:10.70675/19d23228zf030z4df7za3abz596d36577818
Self-Supervised Anomaly Detection via Heatmap-Guided Pseudo-Anomaly GenerationPreprint
Cheng, N., Liu, W., Li, Q. S., & Wu, Y. N. (2026) · Research Square · doi:10.21203/rs.3.rs-9984996/v1
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Li, M., Li, H., Wu, L. Y., Liu, C., & Zhao, X. (2026) · Lecture notes in computer science · doi:10.1007/978-3-032-37225-3_21
Self-citationPTAD: Pose and Texture Agnostic Anomaly Detection
Zhuo, W., Xiang, J., Liu, M., & Lu, H. (2026) · doi:10.1109/cvprf71909.2026.00651
- Authors
- Zheng, Y., Wang, X., Deng, R., Bao, T., Zhao, R., & Wu, L.
- Affiliations
- Chinese Academy of Sciences (CN)
- Sensetime (China) (CN)
- University of California, Los Angeles (US)
- Venue
- 2022 IEEE International Conference on Multimedia and Expo (ICME)
- Publisher
- IEEE
- Published
- 2022-07-18
- Pages
- 1-6
- OpenAlex
- W4293519058
- Semantic Scholar
- e5349e937545d3f3d18d254bd21d695e7350ea8e
- Cited by
- 80
- References
- 18
- Citations by year
- 2026: 5 · 2025: 26 · 2024: 29 · 2023: 16 · 2022: 4
- FWCI
- 28.01
- Type
- conference paper
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- IEEE International Conference on Multimedia and Expo (ICME) (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- arXiv (Cornell University)
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
- Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
- Keywords
- unsupervised anomaly detection, anomaly localization, coarse-to-fine alignment, non-contrastive learning, industrial defect detection, pretext tasks, MVTec AD
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
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