The DOI matches its Crossref record; 19 of the 19 references it cites were found in a registry or an index.
Transfer learning for automated optical inspection
Abstract
One of the challenges in applying convolutional neural networks to automated optical inspection is the lack of sufficient training data. In this paper we show that transfer learning can be successfully applied using image data from an entirely different domain. Focusing on optical inspection of texture images, we transfer weights from a source network trained with arbitrary unrelated images from the ImageNet dataset. Inspection experiments using our method show that one epoch of fine-tuning is sufficient to achieve 99.95% classification accuracy, while conventional transfer learning without fine-tuning achieves only 78.76%. An in-depth analysis of the effects of fine-tuning reveals that after fine-tuning, most of the unnecessary features encoded in the weights of the source network are deactivated, while meaningful features of the target data are amplified to capture new variations in the target domain.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“Author [21] showed that transfer learning can be successfully applied using image data from an entirely different domain.”
From An Improved VGG19 Transfer Learning Strip Steel Surface Defect Recognition Deep Neural Network Based on Few Samples and Imbalanced Datasets (2021) · cites this paper as [21]
In the citing paper
“In the practice of surface inspection [15], a fine-tuned ImageNet pretrained VGG-16 is used as a patch classifier on surface defect inspection. The experiment shows that fine-tuning all layers is the best valid way for models to achieve high accuracy.”
From A Compact Convolutional Neural Network for Surface Defect Inspection (2020) · cites this paper as [15]
In the citing paper
“Rich features learned from ImageNet push the VGG-16 well-fit to the DAGM and get the best mAcc(99.93%) overall.”
From A Compact Convolutional Neural Network for Surface Defect Inspection (2020) · cites this paper as [15]
In the citing paper
“However, the parameters of a VGG-16 are 134.31 M, which causes very large computational cost—9024 M FLOPs in one sub-image, 9 times FLOPs are needed in an entire input image.”
From A Compact Convolutional Neural Network for Surface Defect Inspection (2020) · cites this paper as [15]
Citations
Cites
Very Deep Convolutional Networks for Large-Scale Image Recognition
Simonyan, K., & Zisserman, A. (2014) · arXiv · doi:10.48550/arxiv.1409.1556 · Cited by 114,148
(2008) · Journal of Machine Learning Research · Cited by 33,051
Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation
Girshick, R., Donahue, J., Darrell, T., & Malik, J. (2014) · 2014 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2014.81 · Cited by 32,684
Visualizing and understanding convolutional networks
Zeiler, M. D., & Fergus, R. (2014) · Lecture Notes in Computer Science · doi:10.1007/978-3-319-10590-1_53 · Cited by 15,839
How transferable are features in deep neural networks?
Yosinski, J., Clune, J., Bengio, Y., & Lipson, H. (2014) · arXiv · doi:10.48550/arxiv.1411.1792 · Cited by 6,061
Shin, H.-C., Roth, H. R., Gao, M., Lu, L., Xu, Z., Nogues, I., Yao, J., Mollura, D., & Summers, R. M. (2016) · IEEE Transactions on Medical Imaging · doi:10.1109/tmi.2016.2528162 · Cited by 5,759
CNN Features Off-the-Shelf: An Astounding Baseline for Recognition
Razavian, A. S., Azizpour, H., Sullivan, J., & Carlsson, S. (2014) · 2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops · doi:10.1109/cvprw.2014.131 · Cited by 4,451
DeCAF: A Deep Convolutional Activation Feature for Generic Visual Recognition
Donahue, J., Jia, Y., Vinyals, O., Hoffman, J., Zhang, N., Tzeng, E., & Darrell, T. (2013) · arXiv · doi:10.48550/arxiv.1310.1531 · Cited by 4,019
Learning and Transferring Mid-level Image Representations Using Convolutional Neural Networks
Oquab, M., Bottou, L., Laptev, I., & Sivic, J. (2014) · 2014 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2014.222 · Cited by 3,150
Understanding Neural Networks Through Deep VisualizationPreprint
Yosinski, J., Clune, J., Nguyen, A. M., Fuchs, T. J., & Lipson, H. (2015) · arXiv (Cornell University) · doi:10.48550/arxiv.1506.06579 · Cited by 1,918
Research works printed but not linked: 1
- erhan, 2009, Visualizing Higher-layer Features of Deep Networks, 1341
Cited by
Sorted by citations
Deep Metallic Surface Defect Detection: The New Benchmark and Detection Network
Lv, X., Duan, F., Jiang, J.-J., Fu, X., & Gan, L. (2020) · Sensors · doi:10.3390/s20061562 · Cited by 643
“Therefore, metallic surface defect detection has attracted increasing interest in recent years and has achieved a positive improvement for the quality control in industrial applications [1].”
BackgroundAutomatic Metallic Surface Defect Detection and Recognition with Convolutional Neural Networks
Tao, X., Zhang, D., Ma, W., Liu, X., & Xu, D. (2018) · Applied Sciences · doi:10.3390/app8091575 · Cited by 471
Mixed supervision for surface-defect detection: From weakly to fully supervised learning
Božič, J., Tabernik, D., & Skočaj, D. (2021) · Computers in Industry · doi:10.1016/j.compind.2021.103459 · Cited by 377
MSFT-YOLO: Improved YOLOv5 Based on Transformer for Detecting Defects of Steel Surface
Guo, Z., Wang, C., Yang, G., Huang, Z., & Li, G. (2022) · Sensors · doi:10.3390/s22093467 · Cited by 313
Development of a YOLO-V3-based model for detecting defects on steel strip surface
Kou, X., Liu, S., Cheng, K., & Qian, Y. (2021) · Measurement · doi:10.1016/j.measurement.2021.109454 · Cited by 303
Efficient Detection Model of Steel Strip Surface Defects Based on YOLO-V7
Wang, Y., Wang, H., & Xin, Z. (2022) · IEEE Access · doi:10.1109/access.2022.3230894 · Cited by 229
Solar cell surface defect inspection based on multispectral convolutional neural network
Chen, H., Pang, Y., Hu, Q., & Liu, K. (2018) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-018-1458-z · Cited by 203
Big data analytics for smart factories of the future
Gao, R. X., Wang, L., Helu, M., & Teti, R. (2020) · CIRP Annals · doi:10.1016/j.cirp.2020.05.002 · Cited by 187
Yang, H. S., Chen, Y., Song, K., & Yin, Z. (2019) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2018.2886031 · Cited by 180
Soldering defect detection in automatic optical inspection
Dai, W., Mujeeb, A., Erdt, M., & Sourin, A. (2019) · Advanced Engineering Informatics · doi:10.1016/j.aei.2019.101004 · Cited by 159
Demirci, M. Y., Beșlı, N., & Gümüşçü, A. (2021) · Expert Systems with Applications · doi:10.1016/j.eswa.2021.114810 · Cited by 146
Zhang, J., Su, H., Zou, W., Gong, X., Zhang, Z., & Shen, F. (2020) · Pattern Recognition · doi:10.1016/j.patcog.2020.107571 · Cited by 94
Wan, X., Zhang, X., & Liu, L. (2021) · Applied Sciences · doi:10.3390/app11062606 · Cited by 90
The Recent Applications of Machine Learning in Rail Track Maintenance: A Survey
Nakhaee, M. C., Hiemstra, D., Stoelinga, M. I. A., & van Noort, M. (2019) · Lecture notes in computer science · doi:10.1007/978-3-030-18744-6_6 · Cited by 91
A Review on AI for Smart Manufacturing: Deep Learning Challenges and Solutions
Xu, J., Kovatsch, M., Mattern, D., Mazza, F., Harasic, M., Paschke, A., & Lucia, S. (2022) · Applied Sciences · doi:10.3390/app12168239 · Cited by 95
A Compact Convolutional Neural Network for Surface Defect Inspection
Huang, Y., Qiu, C., Wang, X., Wang, S., & Yuan, K. (2020) · Sensors · doi:10.3390/s20071974 · Cited by 85
ZJU-Leaper: A Benchmark Dataset for Fabric Defect Detection and a Comparative Study
Zhang, C., Feng, S., Wang, X., & Wang, Y. (2020) · IEEE Transactions on Artificial Intelligence · doi:10.1109/tai.2021.3057027 · Cited by 87
End-to-end training of a two-stage neural network for defect detection
Božič, J., Tabernik, D., & Skočaj, D. (2021) · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · doi:10.1109/icpr48806.2021.9412092 · Cited by 77
Kim, H., & Youn, B. D. (2019) · IEEE Access · doi:10.1109/access.2019.2906273 · Cited by 65
Sun, J., Wang, P., Luo, Y., & Li, W. (2019) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2019.2899478 · Cited by 65
Schmedemann, O., Baaß, M., Schoepflin, D., & Schüppstuhl, T. (2022) · Procedia CIRP · doi:10.1016/j.procir.2022.05.115 · Cited by 48
EFC-YOLO: An Efficient Surface-Defect-Detection Algorithm for Steel Strips
Li, Y., Xu, S., Zhu, Z., Wang, P., Li, K., He, Q., & Zheng, Q. (2023) · Sensors · doi:10.3390/s23177619 · Cited by 38
Almalki, F. A., Albraikan, A. A., Soufiene, B. O., & Ali, O. (2022) · Wireless Communications and Mobile Computing · doi:10.1155/2022/7741535 · Cited by 37
Würschinger, H., Mühlbauer, M., Winter, M. R., Engelbrecht, M., & Hanenkamp, N. (2020) · Procedia CIRP · doi:10.1016/j.procir.2020.01.121 · Cited by 36
Two-Stage Evolutionary Neural Architecture Search for Transfer Learning
Wen, Y.-W., Peng, S.-H., & Ting, C.-K. (2021) · IEEE Transactions on Evolutionary Computation · doi:10.1109/tevc.2021.3097937 · Cited by 36
Wu, K., Tan, J., & Liu, C. (2022) · IEEE Sensors Journal · doi:10.1109/jsen.2022.3161331 · Cited by 29
Rački, D., Tomaževič, D., & Skočaj, D. (2021) · Neural Computing and Applications · doi:10.1007/s00521-021-06397-6 · Cited by 30
Strip Surface Defect Detection Algorithm Based on YOLOv5
Wang, H., Yang, X., Zhou, B., Shi, Z., Zhan, D., Huang, R., Lin, J., Wu, Z., & Long, D. (2023) · Materials · doi:10.3390/ma16072811 · Cited by 24
Wu, Y., Chen, R., Li, Z., Ye, M., & Dai, M. (2024) · Metals · doi:10.3390/met14060650 · Cited by 23
Metal Defect Detection Based on Yolov5
Wang, K., Teng, Z., & Zou, T. (2022) · Journal of Physics Conference Series · doi:10.1088/1742-6596/2218/1/012050 · Cited by 23
A Machine Learning Based Approach to Detect False Calls in SMT Manufacturing
Thielen, N., Dominik, W., Schmidt, K., Seidel, R., Reinhardt, A., & Franke, J. E. (2020) · International Spring Seminar on Electronics Technology · doi:10.1109/isse49702.2020.9121044 · Cited by 23
Hong, T.-Y., & Chen, C.-C. (2023) · Applied Soft Computing · doi:10.1016/j.asoc.2023.110904 · Cited by 21
Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks
Lai, Y.-H., Hu, J. S., Tsai, Y.-H., & Chiu, W.-B. (2018) · IEEE/ASME International Conference on Advanced Intelligent Mechatronics · doi:10.1109/aim.2018.8452228 · Cited by 22
Surface Defect Classification in Real-Time Using Convolutional Neural NetworksPreprint
Arikan, S., Varanasi, K., & Stricker, D. (2019) · arXiv (Cornell University) · doi:10.48550/arxiv.1904.04671 · Cited by 21
Towards Automatic Optical Inspection of Soldering Defects
Dai, W., Mujeeb, A., Erdt, M., & Sourin, A. (2018) · International Conference on Cyberworlds (CW) · doi:10.1109/cw.2018.00074 · Cited by 20
YOLO-DD: Improved YOLOv5 for Defect Detection
Wang, J., Wang, W., Zhang, Z., Lin, X., Zhao, J., Chen, M., & Luo, L. (2023) · Computers, materials & continua/Computers, materials & continua (Print) · doi:10.32604/cmc.2023.041600 · Cited by 19
FasterNet-YOLO for real-time detection of steel surface defects algorithm
Yu, S., Liu, Z., Zhang, L., Zhang, X., & Wang, J. (2025) · PLoS ONE · doi:10.1371/journal.pone.0323248 · Cited by 16
Deep Learning Based Classification of Military Cartridge Cases and Defect Segmentation
Tural, S., Samet, R., Aydin, S., & Mali, M. T. (2022) · IEEE Access · doi:10.1109/access.2022.3191328 · Cited by 15
Permute-MAML: exploring industrial surface defect detection algorithms for few-shot learning
Pang, S., Zhao, W., Wang, S., Zhang, L., & Wang, S. (2023) · Complex & Intelligent Systems · doi:10.1007/s40747-023-01219-9 · Cited by 15
STE-YOLO: A Surface Defect Detection Algorithm for Steel Strips
Li, D., Wang, E., Li, Z., Yin, Y., Zhang, L., & Zhao, C. (2024) · Electronics · doi:10.3390/electronics14010054 · Cited by 15
PSIC-Net: Pixel-Wise Segmentation and Image-Wise Classification Network for Surface Defects
Lei, L., Sun, S., Zhang, Y., Liu, H., & Xu, W. (2021) · Machines · doi:10.3390/machines9100221 · Cited by 17
Moon, I. Y., Lee, H. W., Kim, S., Oh, Y., Jung, J., & Kang, S.-H. (2021) · Materials · doi:10.3390/ma14092095 · Cited by 13
Self-citation3-D Vision and Intelligent Online Inspection in SMT Microelectronic Packaging: A Review
Li, T., Wang, S., Luo, Y., Wan, J., Luo, Z., & Chen, M. (2024) · IEEE Journal of Emerging and Selected Topics in Industrial Electronics · doi:10.1109/jestie.2024.3365030 · Cited by 12
CoRe: Contrastive and Restorative Self-Supervised Learning for Surface Defect Inspection
Wu, H., Li, B., Tian, L., Sun, Z., Dong, C., & Liao, W. (2023) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2023.3291776 · Cited by 12
Classification of impinging jet flames using convolutional neural network with transfer learning
Lee, M., Yoon, S., Kim, J., Wang, Y., Lee, K., Park, F. C., & Sohn, C. H. (2022) · Journal of Mechanical Science and Technology · doi:10.1007/s12206-022-0240-5 · Cited by 12
Self-citationChen, S., Zhou, F., Gao, G., Ge, X., & Wang, R. (2024) · PeerJ Computer Science · doi:10.7717/peerj-cs.1727 · Cited by 11
Anomaly detection in formed sheet metals using convolutional autoencoders
Heger, J., Desai, G., & Abdine, M. Z. E. (2020) · Procedia CIRP · doi:10.1016/j.procir.2020.04.106 · Cited by 12
Lightweight-detection: The strip steel surface defect identification based on improved YOLOv5d
Lu, Y., Huang, Z.-C., Jiang, Y., Liu, G., Wang, J., & Ma, Q. (2024) · Materials Today Communications · doi:10.1016/j.mtcomm.2024.109814 · Cited by 10
Yolov4 High-Speed Train Wheelset Tread Defect Detection System Based on Multiscale Feature Fusion
Zhang, C., Hu, X., He, J., & Hou, N. (2022) · Journal of Advanced Transportation · doi:10.1155/2022/1172654 · Cited by 10
Investigating the generation of synthetic data for surface defect detection: A comparative analysis
Monnet, J., Petrović, O., & Herfs, W. (2024) · Procedia CIRP · doi:10.1016/j.procir.2024.10.162 · Cited by 8
Enhanced ore classification through optimized CNN ensembles and feature fusion
Yurdakul, M., Uyar, K., & Taşdemir, Ş. (2025) · Iran Journal of Computer Science · doi:10.1007/s42044-025-00230-2 · Cited by 8
A Method for Surface Defect Detection Based on Multiscale Feature Fusion and Pyramid Attention
Tang, Y., Wang, H., Zhou, Q., & Sun, B. (2024) · IEEE Access · doi:10.1109/access.2024.3374131 · Cited by 7
Segmentation-based Decision Networks for Steel Surface Defect Detection
Bi, Z., Bi, Q. W. Z., Wu, M. S. Q., & Shan, W. Z. M. (2022) · 網際網路技術學刊 · doi:10.53106/160792642022112306022 · Cited by 6
Parameter Identification and Refinement for Parallel PCB Inspection in Cyber–Physical–Social Systems
Cao, Y., Wang, Y., Wang, J., Tian, Y., Wang, X., & Wang, F. (2023) · IEEE Transactions on Computational Social Systems · doi:10.1109/tcss.2023.3330762 · Cited by 6
Dual-Path GAN: A Method for Enhancing Small-scale Defect Detection on Metal Images
Ye, Z., Liu, M., Zhang, S., & Wei, P. (2022) · Chinese Control Conference (CCC) · doi:10.23919/ccc55666.2022.9902599 · Cited by 7
A hybrid deep learning approach to automate industrial quality control
Vinod, K., Sasinthiran, A., Nathezhtha, T., & Gnanasekaran, S. (2025) · International Journal of Computer Integrated Manufacturing · doi:10.1080/0951192x.2025.2531485 · Cited by 5
Zhou, X., Nie, Y., Wang, Y., Cao, P., Ye, M., Tang, Y., & Wang, Z. (2020) · International Symposium on Computational Intelligence and Design · doi:10.1109/iscid51228.2020.00064 · Cited by 5
Automatic Optical Inspection System for Wire Color Sequence Detection
Tsai, T., & Cheng, C.-S. (2022) · Sensors · doi:10.3390/s22155885 · Cited by 5
Li, J., He, X., Chen, X., Kong, D., Huang, T., & Song, P. Y. (2025) · Measurement · doi:10.1016/j.measurement.2025.119390 · Cited by 4
Liu, X., Smeaton, A. F., & Mileo, A. (2022) · IEEE International Conference on Big Data (BigData) · doi:10.1109/bigdata55660.2022.10020525 · Cited by 5
Empowered Optical Inspection by Using Robotic Manipulator in Industrial Applications
Galdelli, A., Pagnotta, D. P., Mancini, A., Freddi, A., Monteriù, A., & Frontoni, E. (2019) · IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) · doi:10.1109/iros40897.2019.8968473 · Cited by 4
A PCB Soldering Joint Defect Recognition System Using Convolutional Neural Network
Tai, K. W., Chuah, J. H., Leong, H., & Kamarudin, N. H. (2021) · Innovations in Power and Advanced Computing Technologies (i-PACT) · doi:10.1109/i-pact52855.2021.9696857 · Cited by 4
Saif, S. S., Aras, K., & Giuseppi, A. (2022) · Mediterranean Conference on Control and Automation (MED) · doi:10.1109/med54222.2022.9837280 · Cited by 4
A Survey of Machine Learning Approaches for Visual Inspection on the DAGM Dataset
Carvalho, P., Durupt, A., & Grandvalet, Y. (2022) · Advances in transdisciplinary engineering · doi:10.3233/atde220600 · Cited by 4
Coupling of unsupervised and supervised deep learning-based approaches for surface anomaly detection
Rački, D., Tomaževič, D., & Skočaj, D. (2024) · Journal of Electronic Imaging · doi:10.1117/1.jei.33.3.031207 · Cited by 3
Relational-based transfer learning for automatic optical inspection based on domain discrepancy
Salgado, E. I. V., Yan, H., Hong, Y., Zhu, P., Zhu, S., Liao, C., Wen, Y., Li, X., Qian, X., Wang, X., et al. (2022) · Optoelectronic Imaging and Multimedia Technology · doi:10.1117/12.2644087 · Cited by 3
The Prior Model-Guided Network for Bearing Surface Defect Detection
Feng, H., Zhuang, J., Chen, X., Song, K., Xiao, J., & Ye, S. (2023) · Electronics · doi:10.3390/electronics12051142 · Cited by 3
Improved Yolov5n strip surface defect detection algorithm
Tang, L., Cai, L. C., Cheng, K., Wang, X., Luo, C., & Zhao, Y. (2023) · CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS) · doi:10.1109/safeprocess58597.2023.10295728 · Cited by 3
Polarimetric imaging for quality control in injection molding
Nagorny, P., Lacombe, T., Muller, T., Favrelière, H., Pairel, É., & Pillet, M. (2019) · International Conference on Quality Control by Artificial Vision (QCAV) · doi:10.1117/12.2522062 · Cited by 3
Kaulen, N., Luipers, D., Strothmann, L., & Richert, A. (2025) · International Electronic Conference on Sensors and Applications (ECSA) · doi:10.3390/ecsa-11-22207 · Cited by 2
Steel Strip Defect Classification Model Based on Convolutional Neural Network Composites
Ye, F., & Bian, L. (2022) · International Conference on Networking Systems of AI (INSAI) · doi:10.1109/insai56792.2022.00024 · Cited by 2
Li, C.-R., Yang, C., Su, Y.-T., Tsai, H., Huang, K., & Lin, Y. (2023) · IEEE International Instrumentation and Measurement Technology Conference · doi:10.1109/i2mtc53148.2023.10176075 · Cited by 2
Aras, K., Saif, S. S., Giuseppi, A., & Coşkun, V. (2024) · International Congress on Human-Computer Interaction, Optimization and Robotic Applications (ICHORA) · doi:10.1109/hora61326.2024.10550768 · Cited by 2
Kim, H. Y., Yi, T. J., & Lee, J. Y. (2025) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2025.3548240 · Cited by 2
Transformer-based Encoder-Decoder Model for Surface Defect Detection
Lu, X., & Fan, W. (2022) · International Conference on Innovation in Artificial Intelligence (ICIAI) · doi:10.1145/3529466.3529471 · Cited by 2
A multi-attention fusion mechanism for collaborative industrial surface defect detection
Yue, X., Zhong, G., & Chu, B. (2023) · International Conference on Graphics and Image Processing (ICGIP) · doi:10.1117/12.2680504 · Cited by 2
Convolutional neural network for sapphire ingots defect detection and classification
Mugisha, E. R., Zhang, X., Gao, K., Gao, Z., Zan, Z., Lui, X., Wang, M., Mi, Y., Chen, H., & Yan, W. (2021) · Optical Materials · doi:10.1016/j.optmat.2021.111292 · Cited by 2
Deep learning for zero-defect inkjet-printing of electronics
Minnette, F., & Zambal, S. (2021) · IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) · doi:10.1109/metroind4.0iot51437.2021.9488493 · Cited by 2
Evaluation of Transfer Learning for Visual Road Condition Assessment
Balada, C., Eisenbach, M., & Groß, H. (2021) · Lecture notes in computer science · doi:10.1007/978-3-030-86383-8_43 · Cited by 2
AOI-OPEN: federated operation and control for DAO-based trustworthy and intelligent AOI ecology
Cao, Y., Wang, Y., Yang, J., Tian, Y., Wang, J., & Wang, F. (2025) · Frontiers of Information Technology & Electronic Engineering · doi:10.1631/fitee.2400975 · Cited by 1
SACNN: Spatial Adversarial Convolutional Neural Network for Textile Defect Detection
Hou, W. S., Tao, X., Ma, W., & Xu, D. (2020) · Fibres and Textiles in Eastern Europe · doi:10.5604/01.3001.0014.3808 · Cited by 1
Penggunaan Pre-trained Model untuk Klasifikasi Kualitas Sekrup
Rafif, M. N., Putri, D. U. K., & Awaludin, L. (2022) · IJEIS (Indonesian Journal of Electronics and Instrumentation Systems) · doi:10.22146/ijeis.78112 · Cited by 1
Knowledge Embedding Relation Network for Small Data Defect Detection
Ruan, J., He, J., Tong, Y., Wang, Y., Fang, Y., & Liang, Q. (2024) · Applied Sciences · doi:10.3390/app14177922 · Cited by 1
Yang, C., Li, Z., & Liu, L. (2023) · International Conference on Graphics and Image Processing (ICGIP) · doi:10.1117/12.2680469 · Cited by 1
Metal Surface Defect Detection Algorithm Based on Improved YOLOv5
Su, X., Zhang, F., Zhang, Y., Xu, H., & Chen, X. (2023) · IEEE Information Technology and Mechatronics Engineering Conference (ITOEC) · doi:10.1109/itoec57671.2023.10291687 · Cited by 1
A Study to Compare YOLO Family Models for Metal Surface Anomaly Detection
Koç, A., Albayrak, Ö., Kurt, Y., & Ünal, P. (2023) · IEEE International Conference on Big Data (BigData) · doi:10.1109/bigdata59044.2023.10386849 · Cited by 1
Free annotated data for deep learning in microscopy? A hitchhiker’s guide
Shajkofci, A., & Liebling, M. (2020) · Photoniques · doi:10.1051/photon/202010430 · Cited by 1
Presswork defect inspection using only defect-free high-resolution images
Guan, Z., Wang, Z., Zhu, Y., & Liu, G. (2022) · The Visual Computer · doi:10.1007/s00371-022-02403-7 · Cited by 1
Classification and Localization of Defects Using Single-Shot Multibox DetectorPreprint
Ihianle, I. K., Kaur, M., Chauhan, K. K., Aggarwal, N., Joshi, G., Vig, R., & Owa, K. (2023) · SSRN Electronic Journal · doi:10.2139/ssrn.4673716 · Cited by 1
An Analysis of Defect Detection on Steel Strip Surface Using Modified Yolo V5Preprint
Deepti Raj, G., & Prabadevi, B. (2022) · Research Square · doi:10.21203/rs.3.rs-1815194/v1 · Cited by 1
A Multi-class Defect Detection Network for Cooker Surface
Zhou, W., Zhang, J., Liu, W., Wan, P., Liu, J., & Zhou, K. (2019) · International Conference on Intelligent Systems and Image Processing (ICISIP) · doi:10.12792/icisip2019.004
김현재 (2020) · Seoul National University Open Repository (Seoul National University)
Convolutional Neural Networks and Deep Learning Techniques for Glass Surface Defect Inspection
Villegas-Jaramillo, E. J., & Orozco‐Alzate, M. (2022) · Advances in computational intelligence and robotics book series · doi:10.4018/978-1-6684-4991-2.ch004 · Cited by 1
Enhancing Collision Learning Practicality
Park, K. M., & Park, F. C. (2023) · Springer tracts in advanced robotics · doi:10.1007/978-3-031-30195-7_5
Self-citationResearch on Quartz Wafer Defect Detection Method Based on Deep Learning Model Pruning
Ye, M., Nie, Y., Wang, Y., Cao, P., Xu, Z., & Li, T. (2023) · International Conference on Intelligent Computing and Signal Processing (ICSP) · doi:10.1109/icsp58490.2023.10248473
An Algorithm for Detecting Surface Defects in Steel Strips Based on an Improved Lightweight Network
Zhan, D., Wang, H., Yang, X. D., Ou, W. C., Huang, R. B., Lin, J., Yi, K., & Zhou, B. (2024) · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum · doi:10.4028/p-foi56w
Pre-training for Industrial Defect Detection
Luo, T. (2023) · International Academic Exchange Conference on Science and Technology Innovation (IAECST) · doi:10.1109/iaecst60924.2023.10503045
Automated surface roughness classification using robot vision
Darvekar, S. K., Venkatesh, J. Y. S., Rao, A. B. K., Sekhar, R., Shah, P., & Ingle, G. (2024) · Science Talks · doi:10.1016/j.sctalk.2024.100395
Mao, X., Qian, M., Li, Y., & Chu, Y. (2024) · International Conference on Control, Automation, Robotics and Vision (ICARCV) · doi:10.1109/icarcv63323.2024.10821704
Metadata
- Authors
- Kim, S., Kim, W., Noh, Y.-K., & Park, F. C.
- Affiliations
- Seoul National University (KR)
- Venue
- 2017 International Joint Conference on Neural Networks (IJCNN)
- Publisher
- IEEE
- Published
- 2017-05
- Pages
- 2517-2524
- ISSN
- 2161-4407 (ISSN-L)
- OpenAlex
- W2735783528
- Cited by
- 101
- References
- 19
- Citations by year
- 2026: 1 · 2025: 7 · 2024: 13 · 2023: 18 · 2022: 23 · 2021: 13 · 2020: 12 · 2019: 10 · 2018: 4
- FWCI
- 10.44
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- International Joint Conference on Neural Networks (IJCNN) (publishedVersion)
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
- Keywords
- transfer learning, automated optical inspection, fine-tuning, convolutional neural networks, ImageNet, texture images, limited training data, domain shift
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review