8.2 8Mb/s 28Mb/mJ robust true-random-number generator in 65nm CMOS based on differential ring oscillator with feedback resistors
Abstract
On-chip true random number generators (TRNG) have been gaining attention as an important component for building secure systems [1]. CMOS TRNGs typically exploit device-level noise, such as thermal or flicker noise to generate random bits [2]. Among various types of CMOS TRNGs, the meta-stability-based TRNG is known to have very high throughput for random bit generation, but it requires sophisticated control and calibration circuits to suppress bias [6]. Another popular type is the ring oscillator (RO)-based TRNG, which utilizes timing jitter [1-5]. Relatively simple circuits make it an attractive option, but there remains a need to improve the tolerance against power supply attacks and process/environmental variations [3]. Recently, selective use of a certain set of inverter chains based on pre-tuning was proposed to mitigate process variation effects [2].
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Si-CMOS-based tRNGs use circuitry with various types of entropy sources, such as timing jitter, chaotic maps, metastability, or noise jitter from SRAM bit-line leakages, for low power consumption.
“In contrast, Si-CMOS–based tRNGs use circuitry that uses various types of entropy sources, such as timing jitter, chaotic maps, metastability, or noise jitter from SRAM bit-line leakages for low power consumption.”
From Cryptographic transistor for true random number generator with low power consumption (2024) · cites this paper as [19]
Those entropy sources rely on operation-induced variations.
“Note that those entropy sources rely on operation-induced variations (19–23).”
From Cryptographic transistor for true random number generator with low power consumption (2024) · cites this paper as [19]
Si-CMOS-based tRNGs show excellent randomness and insensitivity to fabrication-induced variability.
“They show excellent randomness and insensitivity to fabrication-induced variability.”
From Cryptographic transistor for true random number generator with low power consumption (2024) · cites this paper as [19]
Cites
Mathew, S. K., Srinivasan, S., Anders, M. A., Kaul, H., Hsu, S. K., Sheikh, F., Agarwal, A., Satpathy, S., & Krishnamurthy, R. K. (2012) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2012.2217631 · Cited by 195 · see citing works
The Frequency Injection Attack on Ring-Oscillator-Based True Random Number Generators
Markettos, A. T., & Moore, S. W. (2009) · Lecture Notes in Computer Science · doi:10.1007/978-3-642-04138-9_23 · Cited by 192 · see citing works
16.3 A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm CMOS
Yang, K., Fick, D., Henry, M. B., Lee, Y., Blaauw, D., & Sylvester, D. (2014) · 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) · doi:10.1109/isscc.2014.6757434 · Cited by 155 · see citing works
True Random Number Generator circuits based on single- and multi-phase beat frequency detection
Tang, Q., Kim, B., Lao, Y., Parhi, K. K., & Kim, C. H. (2014) · Proceedings of the IEEE 2014 Custom Integrated Circuits Conference · doi:10.1109/cicc.2014.6946136 · Cited by 75 · see citing works
A robust −40 to 120°C all-digital true random number generator in 40nm CMOS
Yang, K., Blaauw, D. T., & Sylvester, D. (2015) · Symposium on VLSI Circuits · doi:10.1109/vlsic.2015.7231275 · Cited by 21 · see citing works
True hardware random number generation implemented in the 32-nm SOI POWER7+ processor
Liberty, J. S., Barrera, A., Boerstler, D., et al. (2013) · IBM Journal of Research and Development · doi:10.1147/jrd.2013.2279599 · Cited by 16 · see citing works
Self-biased high-bandwidth low-jitter 1-to-4096 multiplier clock generator PLL
Maneatis, J. G., Kim, J., McClatchie, I., et al. (2003) · Proceedings - ACM IEEE Design Automation Conference · doi:10.1145/775832.776006 · Cited by 14 · see citing works
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Satpathy, S. K., Mathew, S. K., Kumar, R., Suresh, V., Anders, M. A., Kaul, H., Agarwal, A., Hsu, S., Krishnamurthy, R. K., & De, V. (2019) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2018.2886350 · Cited by 114 · see citing works
Taneja, S., Rajanna, V. K., & Alioto, M. (2021) · 2021 IEEE International Solid-State Circuits Conference (ISSCC) · doi:10.1109/isscc42613.2021.9366019 · Cited by 58 · see citing works
Wieczorek, P. Z., & Golofit, K. (2018) · IEEE Transactions on Circuits and Systems I: Regular Papers · doi:10.1109/tcsi.2017.2751144 · Cited by 53 · see citing works
Cryptographic transistor for true random number generator with low power consumption
Kim, S.-I., You, H.-J., Kim, M.-S., An, U.-S., Kim, M.-S., Lee, D. H., Ryu, S.-T., & Choi, Y.-K. (2024) · Science Advances · doi:10.1126/sciadv.adk6042 · Cited by 33 · see citing works
“This energy consumption outcome by the cryptoristor is comparable to those of other CMOS circuit-based tRNGs ( 19 – 23 ) and to those of non-CMOS–based tRNGs ( 11 – 18 ).”
- Authors
- Kim, E., Lee, M., & Kim, J.-J.
- Affiliations
- Pohang University of Science and Technology (KR)
- Venue
- 2017 IEEE International Solid-State Circuits Conference (ISSCC)
- Publisher
- IEEE
- Published
- 2017-02
- Pages
- 144-145
- ISSN
- 0193-6530 (ISSN-L)
- OpenAlex
- W2594309104
- Cited by
- 79
- References
- 7
- Citations by year
- 2026: 5 · 2025: 6 · 2024: 8 · 2023: 9 · 2022: 12 · 2021: 11 · 2020: 12 · 2019: 7 · 2018: 6 · 2017: 3
- FWCI
- 5.44
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference (publishedVersion)
- Open Access System for Information Sharing (Pohang University of Science and Technology) (submittedVersion)
- Funders
- IC Design Education Center
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Keywords
- true random number generator, ring oscillator, differential ring oscillator, feedback resistor, 65 nm CMOS, timing jitter, process variation tolerance, energy efficiency
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