True Random Number Generator circuits based on single- and multi-phase beat frequency detection
Abstract
A fully-digital True Random Number Generator (TRNG) measures the frequency difference between two free-running ring oscillators, or in other words the beat frequency, to extract random frequency jitter. For generating a continuous stream of random bits with a high entropy level, the lower significant bits meeting the NIST randomness criteria are concatenated. The generation efficiency is further improved by utilizing a multi-phase structure. The proposed circuit fabricated in 65nm achieves an energy efficiency of 15.1Mb/mW at 0.8V. Experimental data collected from eight TRNG test chips passed all 15 NIST tests without the use of any feedback or tracking scheme.
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Cites
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Self-citationTrue Random Number Generator With a Metastability-Based Quality Control
Tokunaga, C., Blaauw, D., & Mudge, T. (2008) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2007.910965 · Cited by 172 · see citing works
16.3 A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm CMOS
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True Random Number Generator with a Metastability-Based Quality Control
Tokunaga, C., Blaauw, D. T., & Mudge, T. (2007) · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · doi:10.1109/isscc.2007.373465 · Cited by 141 · see citing works
A low-power true random number generator using random telegraph noise of single oxide-traps
Brederlow, R., Prakash, R., Paulus, C., & Thewes, R. (2006) · 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers · doi:10.1109/isscc.2006.1696222 · Cited by 137 · see citing works
2.4GHz 7mW all-digital PVT-variation tolerant True Random Number Generator in 45nm CMOS
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Mathew, S. K., Johnston, D., Satpathy, S., Suresh, V., Newman, P., Anders, M. A., Kaul, H., Agarwal, A., Hsu, S. K., Chen, G., et al. (2016) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2016.2558490 · Cited by 102 · see citing works
Kim, E., Lee, M., & Kim, J.-J. (2017) · 2017 IEEE International Solid-State Circuits Conference (ISSCC) · doi:10.1109/isscc.2017.7870302 · Cited by 79 · see citing works
True Random Number Generators Using Electrical Noise
Gong, L., Zhang, J., Liu, H., Sang, L., & Wang, Y. (2019) · IEEE Access · doi:10.1109/access.2019.2939027 · Cited by 77 · see citing works
“These TRNGs extract entropy from edge-jitter of oscillator and sample jitter events using phasedetector, including ring oscillators [7], coupled oscillators [2], [22], [23] and Fibonacci/Galois ring oscillators [24], [25].”
Method
- Authors
- Tang, Q., Kim, B., Lao, Y., Parhi, K. K., & Kim, C. H.
- Affiliations
- University of Minnesota (US)
- Venue
- Proceedings of the IEEE 2014 Custom Integrated Circuits Conference
- Publisher
- IEEE
- Published
- 2014-09
- Pages
- 1-4
- ISSN
- 0886-5930 (ISSN-L)
- OpenAlex
- W2092798673
- Cited by
- 75
- References
- 7
- Citations by year
- 2025: 4 · 2024: 3 · 2023: 9 · 2022: 6 · 2021: 10 · 2020: 9 · 2019: 8 · 2018: 8 · 2017: 9 · 2016: 7 · 2015: 2
- FWCI
- 3.94
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- Custom Integrated Circuits Conference (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in PLL and VCO Technologies
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Keywords
- true random number generator, beat frequency detection, ring oscillator, frequency jitter, 65 nm CMOS, energy efficiency, NIST randomness tests, hardware randomness
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