Cited by 2,692Advanced Frequency and Time StandardsAdvanced Electrical Measurement TechniquesScientific Measurement and Uncertainty Evaluation

Statistics of atomic frequency standards

Allan, D.W.·1966·Proceedings of the IEEE

Abstract

A theoretical development is presented which results in a relationship between the expectation value of the standard deviation of the frequency fluctuations for any finite number of data samples and the infinite time average value of the standard deviation, which provides an invariant measure of an important quality factor of a frequency standard. A practical and straightforward method of determining the power spectral density of the frequency fluctuations from the variance of the frequency fluctuations, the sampling time, the number of samples taken, and the dependence on system bandwidth is also developed. Additional insight is also given into some of the problems that arise from the presence of "flicker noise" (spectrum proportional to |ω|-1) modulation of the frequency of an oscillator. The theory is applied in classifying the types of noise on the signals of frequency standards made available at NBS, Boulder Laboratories, such as: masers (both H and N15H3), the cesium beam frequency standard employed as the U. S. Frequency Standard, and rubidium gas cells. "Flicker noise" frequency modulation was not observed on the signals of masers for sampling times ranging from 0.1 second to 4 hours. In a comparison between the NBS hydrogen maser and the NBS III cesium beam, uncorrelated random noise was observed on the frequency fluctuations for sampling times extending to 4 hours; the fractional standard deviations of the frequency fluctuations were as low as 5 parts in 1014.

Integrity signals

Registry

Crossref · 10.1109/proc.1966.4634

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Cited by

Sorted by citations

Authors
Allan, D. W.
Affiliations
National Institute of Standards and Technology (US)
Corresponding author
Allan, D.W.
Venue
Proceedings of the IEEE
Published
1966
Volume
54
Issue
2
Pages
221-230
ISSN
0018-9219 (ISSN-L)
OpenAlex
W2159012223
Cited by
2,692
References
0
Citations by year
2026: 72 · 2025: 113 · 2024: 103 · 2023: 122 · 2022: 105 · 2021: 110 · 2020: 101 · 2019: 106 · 2018: 104 · 2017: 99 · 2016: 118 · 2015: 114 · 2014: 111 · 2013: 106 · 2012: 115
FWCI
6.45
Type
journal article
Language
en
Open access
closed
Locations
Proceedings of the IEEE (publishedVersion)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Advanced Frequency and Time Standards
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Electrical Measurement Techniques
  • Social Sciences › Decision Sciences › Statistics, Probability and Uncertainty › Scientific Measurement and Uncertainty Evaluation
Keywords
atomic clocks, frequency variation, power spectral density, 1/f noise, frequency modulation, hydrogen maser, cesium frequency standard, oscillator noise

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review