The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow
Abstract
Pressure-assisted low-temperature sintering of silver paste is shown to be a viable alternative to solder reflow as a die-attachment solution. A quasihydrostatic pressure is used to lower the sintering temperature. The effect of parameters such as temperature and pressure are investigated. Characterization of the silver-attached samples shows a significant improvement in electrical conductivity, thermal conductivity and mechanical strength of the joint. Given that silver deforms with little accumulation of inelastic strains, and given the absence of large voids in the attachment layer, it is also expected that the joint to be more resistant to fatigue failure than a solder attached junction. Due to the high melting temperature of silver, this alternative process is also suitable for high temperature packages.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity
Parker, W. J., Jenkins, R. J., Butler, C. P., & Abbott, G. L. (1961) · Journal of Applied Physics · doi:10.1063/1.1728417 · Cited by 3,978 · cited 1×
“The thermal diffusivity was obtained by Parker’s flash-light method [6].”
Method
Cited by
Bai, J. G., Zhang, Z. Z., Calata, J. N., & Lu, G.-Q. (2006) · IEEE Transactions on Components and Packaging Technologies · doi:10.1109/tcapt.2005.853167 · Cited by 375
Self-citationJoining of Silver Nanomaterials at Low Temperatures: Processes, Properties, and Applications
Peng, P., Hu, A., Gerlich, A. P., Zou, G., Liu, L., & Zhou, Y. N. (2015) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.5b02134 · Cited by 364
Are Sintered Silver Joints Ready for Use as Interconnect Material in Microelectronic Packaging?
Siow, K. S. (2014) · Journal of Electronic Materials · doi:10.1007/s11664-013-2967-3 · Cited by 317
Kim, D., Nagao, S., Chen, C., Wakasugi, N., Yamamoto, Y., Suetake, A., Takemasa, T., Sugahara, T., & Suganuma, K. (2021) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2020.3031670 · Cited by 87
Review of Die-Attach Materials for SiC High-Temperature Packaging
Hou, F., Sun, Z., Su, M., Fan, J., You, X., Li, J., Wang, Q., Cao, L., & Zhang, G. (2024) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2024.3417529 · Cited by 52
Metadata
- Authors
- Zhang, Z., & Lu, G.-Q.
- Venue
- IEEE Transactions on Electronics Packaging Manufacturing
- Published
- 2002-10
- Volume
- 25
- Issue
- 4
- Pages
- 279-283
- ISSN
- 1521-334X (ISSN-L)
- OpenAlex
- W2133314170
- Cited by
- 221
- References
- 1
- FWCI
- 1.05
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow. https://app.cochat.ai/papers/10.1109/tepm.2002.807719
- The paper
- Zhang, Z., & Lu, G.-Q. (2002). Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow. IEEE Transactions on Electronics Packaging Manufacturing. https://doi.org/10.1109/tepm.2002.807719
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.