Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 624

The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.

Evolution of Block Copolymer Lithography to Highly Ordered Square Arrays

Tang, Chuanbing, Lennon, Erin M., Fredrickson, Glenn H., Kramer, Edward J., Hawker, Craig J.·2008·Science

Abstract

The manufacture of smaller, faster, more efficient microelectronic components is a major scientific and technological challenge, driven in part by a constant need for smaller lithographically defined features and patterns. Traditional self-assembling approaches based on block copolymer lithography spontaneously yield nanometer-sized hexagonal structures, but these features are not consistent with the industry-standard rectilinear coordinate system. We present a modular and hierarchical self-assembly strategy, combining supramolecular assembly of hydrogen-bonding units with controlled phase separation of diblock copolymers, for the generation of nanoscale square patterns. These square arrays will enable simplified addressability and circuit interconnection in integrated circuit manufacturing and nanotechnology.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1126/science.1162950

Cites

23 of 23 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 23 references

Cited by

See all 624

Metadata

Authors
Tang, C., Lennon, E. M., Fredrickson, G. H., Kramer, E. J., & Hawker, C. J.
Venue
Science
Published
2008-10-17
Volume
322
Issue
5900
Pages
429-432
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2066350682
Cited by
624
References
23
FWCI
28.29
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Evolution of Block Copolymer Lithography to Highly Ordered Square Arrays. https://app.cochat.ai/papers/10.1126/science.1162950
The paper
Tang, C., Lennon, E. M., Fredrickson, G. H., Kramer, E. J., & Hawker, C. J. (2008). Evolution of Block Copolymer Lithography to Highly Ordered Square Arrays. Science. https://doi.org/10.1126/science.1162950

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.