Cited by 114Advanced Memory and Neural ComputingElectrodeposition and Electroless CoatingsCopper Interconnects and Reliability

Electrochemical metallization cells—blending nanoionics into nanoelectronics?

Lu, Wei, Jeong, Doo Seok, Kozicki, Michael, Waser, Rainer·2012·MRS Bulletin

Integrity signals

Registry

Crossref · 10.1557/mrs.2012.5

Cites

59 of 59 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Filament formation involves oxidation, ion transport and reduction processes, all of which are thermodynamically driven and require overcoming specific activation energies.

    “Filament formation involves oxidation, ion transport and reduction processes, all of which are thermodynamically driven (5,18) and require overcoming specific activation energies.”

Cites

Flagged first, then by citations

1 of the 60 references couldn’t be matched to a known paper.

Cited by

Sorted by citations

Authors
Lu, W., Jeong, D. S., Kozicki, M., & Waser, R.
Affiliations
  • University of Michigan (US)
  • Korean Association Of Science and Technology Studies (KR)
  • Arizona State University (US)
  • Forschungszentrum Jülich (DE)
Corresponding author
Lu, Wei
Venue
MRS Bulletin
Published
2012-02
Volume
37
Issue
2
Pages
124-130
ISSN
  • 0883-7694 (ISSN-L)
  • 1938-1425
OpenAlex
W2152435892
Cited by
113
References
60
Citations by year
2026: 2 · 2025: 2 · 2024: 1 · 2023: 5 · 2022: 6 · 2021: 9 · 2020: 6 · 2019: 3 · 2018: 5 · 2017: 12 · 2016: 14 · 2015: 10 · 2014: 13 · 2013: 18 · 2012: 7
FWCI
9.26
Type
journal article
Language
en
Open access
closed
Locations
  • MRS Bulletin (publishedVersion)
  • JuSER (Forschungszentrum Jülich) (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrodeposition and Electroless Coatings
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Copper Interconnects and Reliability
Keywords
electrochemical metallization, nanoionics, nanoelectronics, resistive switching, memory devices

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

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