Akin, Bilal

Degradation Assessment and Precursor Identification for SiC MOSFETs Under High Temp Cycling

Ugur, E., Yang, F., Pu, S., Zhao, S., & Akin, B. (2019) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 159

A New Complete Condition Monitoring Method for SiC Power MOSFETs

Ugur, E., Xu, C., Yang, F., Pu, S., & Akin, B. (2021) · IEEE Transactions on Industrial Electronics

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 126

Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets

Yang, F., Ugur, E., & Akin, B. (2020) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 121

A Stray Magnetic Flux-Based Robust Diagnosis Method for Detection and Location of Interturn Short Circuit Fault in PMSM

Gurusamy, V., Bostanci, E., Li, C., Qi, Y., & Akin, B. (2021) · IEEE Transactions on Instrumentation and Measurement

Electric Motor Design and AnalysisMachine Fault Diagnosis Techniques

Cited by 93

Temperature-Independent Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances

Farhadi, M., Yang, F., Pu, S., Vankayalapati, B. T., & Akin, B. (2021) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices

Cited by 93

Real-Time Aging Detection of SiC MOSFETs

Erturk, F., Ugur, E., Olson, J., & Akin, B. (2019) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 85

A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection

Pu, S., Yang, F., Vankayalapati, B. T., Ugur, E., Xu, C., & Akin, B. (2020) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 75

Characterization of Threshold Voltage Instability Under Off-State Drain Stress and Its Impact on p-GaN HEMT Performance

Yang, F., Xu, C., & Akin, B. (2021) · IEEE Journal of Emerging and Selected Topics in Power Electronics

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Cited by 53

A Simple Plug-In Circuit for IGBT Gate Drivers to Monitor Device Aging: Toward Smart Gate Drivers

Ali, S. H., Li, X., Kamath, A. S., & Akin, B. (2018) · IEEE Power Electronics Magazine

Silicon Carbide Semiconductor TechnologiesMultilevel Inverters and Converters

Cited by 36

Effect of Magnets Asymmetry on Stray Magnetic Flux Based Bearing Damage Detection in PMSM

Gurusamy, V., Baruti, K. H., Zafarani, M., Lee, W., & Akin, B. (2021) · IEEE Access

Machine Fault Diagnosis TechniquesElectric Motor Design and Analysis

Cited by 28

AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters

Farhadi, M., Vankayalapati, B. T., Sajadi, R., & Akin, B. (2023) · IEEE Transactions on Vehicular Technology

Silicon Carbide Semiconductor TechnologiesMultilevel Inverters and Converters

Cited by 24

Gate Leakage Current Characterization and Remaining Useful Lifetime Prediction in Silicon Carbide MOSFETs

Murat Sezer, M., Akici, F., Afshar, M., Teja Vankayalapati, B., & Akin, B. (2025) · IEEE Transactions on Transportation Electrification

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 8