Sigov, Alexander S.

Dead Layer Thickness Estimation at the Ferroelectric Film-Metal Interface in PZT

Podgorny, Y. V., Vorotilov, K. A., Sigov, A. S., & Scott, J. F. (2019) · Applied Physics Letters

Ferroelectric and Piezoelectric MaterialsFerroelectric and Negative Capacitance Devices

Cited by 21

Microstructure Analysis of Porous Lead Zirconate–Titanate Films

Atanova, A. V., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Seregin, D. S., Sigov, A. S., & Vorotilov, K. A. (2022) · Journal of the American Ceramic Society

Ferroelectric and Piezoelectric MaterialsDielectric materials and actuators

Cited by 15

Leakage currents in porous PZT films

Podgorny, Y., Vorotilov, K., Lavrov, P., & Sigov, A. (2016) · Ferroelectrics

Ferroelectric and Piezoelectric MaterialsFerroelectric and Negative Capacitance Devices

Cited by 14

Effect of Metal Electrodes on the Steady-State Leakage Current in PZT Thin Film Capacitors

Podgorny, Y. V., Antonovich, A. N., Petrushin, A. A., Sigov, A. S., & Vorotilov, K. A. (2022) · Journal of Electroceramics

Ferroelectric and Piezoelectric MaterialsFerroelectric and Negative Capacitance Devices

Cited by 10

Influence of Crystallization Process on Structural State of CSD BST Thin Films

Zhigalina, O. M., Vorotilov, K. A., Sigov, A. S., & Kumskov, A. S. (2006) · Ferroelectrics

Ferroelectric and Piezoelectric MaterialsMultiferroics and related materials

Cited by 8

Control of Columnar Grain Microstructure in CSD LaNiO3 Films

Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules

Electronic and Structural Properties of OxidesFerroelectric and Piezoelectric Materials

Cited by 5