Cited by 375Thermal properties of materialsThermal Radiation and Cooling TechnologiesAdvanced Thermoelectric Materials and Devices

Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers

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Pernot, G., Stoffel, M., Savic, I., Pezzoli, F., Chen, P., Savelli, G., Jacquot, A., Schumann, J. +10 more·2010·Nature Materials

Abstract

The ability to precisely control the thermal conductivity (kappa) of a material is fundamental in the development of on-chip heat management or energy conversion applications. Nanostructuring permits a marked reduction of kappa of single-crystalline materials, as recently demonstrated for silicon nanowires. However, silicon-based nanostructured materials with extremely low kappa are not limited to nanowires. By engineering a set of individual phonon-scattering nanodot barriers we have accurately tailored the thermal conductivity of a single-crystalline SiGe material in spatially defined regions as short as approximately 15 nm. Single-barrier thermal resistances between 2 and 4 x 10(-9) m(2) K W(-1) were attained, resulting in a room-temperature kappa down to about 0.9 W m(-1) K(-1), in multilayered structures with as little as five barriers. Such low thermal conductivity is compatible with a totally diffuse mismatch model for the barriers, and it is well below the amorphous limit. The results are in agreement with atomistic Green's function simulations.

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  • ASOPS-TDTR has approximately 10 times faster data acquisition speed and is free of artefacts associated with the moving delay stage.

    “This ASOPS-TDTR technique, with its ~10 times faster data acquisition speed and free of artefacts associated with the moving delay stage, has been successfully employed in several studies”

    From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [174]

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Authors
Pernot, G., Stoffel, M., Savic, I., Pezzoli, F., Chen, P., Savelli, G., Jacquot, A., Schumann, J., Denker, U., Mönch, I., Deneke, C., Schmidt, O. G., Rampnoux, J. M., Wang, S., Plissonnier, M., Rastelli, A., Dilhaire, S., & Mingo, N.
Affiliations
  • Centre National de la Recherche Scientifique (FR)
  • Leibniz Institute for Solid State and Materials Research (DE)
  • Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
  • Fraunhofer Institute for Physical Measurement Techniques (DE)
  • Max Planck Institute for Solid State Research (DE)
  • University of California, Santa Cruz (US)
Corresponding author
  • Rastelli, A.
  • Dilhaire, S.
  • Mingo, N.
Venue
Nature Materials
Published
2010-05-02
Volume
9
Issue
6
Pages
491-495
ISSN
  • 1476-1122 (ISSN-L)
  • 1476-4660
OpenAlex
W2017969431
Cited by
375
References
42
Citations by year
2026: 4 · 2025: 11 · 2024: 19 · 2023: 11 · 2022: 21 · 2021: 18 · 2020: 29 · 2019: 20 · 2018: 28 · 2017: 31 · 2016: 34 · 2015: 31 · 2014: 25 · 2013: 31 · 2012: 31
FWCI
14.62
Type
journal article
Language
en
Open access
Locations
  • Nature Materials (publishedVersion)
  • PubMed (publishedVersion)
  • HAL (submittedVersion, cc-by-nc-sa)
  • Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) (submittedVersion)
  • Oskar-Bordeaux (Universite de Bordeaux) (submittedVersion, cc-by-nc-sa)
  • Fraunhofer-Publica (Fraunhofer-Gesellschaft) (submittedVersion)
Funders
Agence Nationale de la Recherche (ANR-06-NANO-0020, ANR-06-NANO-0054, ANR-06-BLAN-0129)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
  • Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
Keywords
thermal conductivity control, phonon scattering, SiGe, silicon nanowires, nanostructuring, thermal resistance, diffuse mismatch model, low thermal conductivity

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