Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers
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The ability to precisely control the thermal conductivity (kappa) of a material is fundamental in the development of on-chip heat management or energy conversion applications. Nanostructuring permits a marked reduction of kappa of single-crystalline materials, as recently demonstrated for silicon nanowires. However, silicon-based nanostructured materials with extremely low kappa are not limited to nanowires. By engineering a set of individual phonon-scattering nanodot barriers we have accurately tailored the thermal conductivity of a single-crystalline SiGe material in spatially defined regions as short as approximately 15 nm. Single-barrier thermal resistances between 2 and 4 x 10(-9) m(2) K W(-1) were attained, resulting in a room-temperature kappa down to about 0.9 W m(-1) K(-1), in multilayered structures with as little as five barriers. Such low thermal conductivity is compatible with a totally diffuse mismatch model for the barriers, and it is well below the amorphous limit. The results are in agreement with atomistic Green's function simulations.
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ASOPS-TDTR has approximately 10 times faster data acquisition speed and is free of artefacts associated with the moving delay stage.
“This ASOPS-TDTR technique, with its ~10 times faster data acquisition speed and free of artefacts associated with the moving delay stage, has been successfully employed in several studies”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [174]
The main text (p. 5) says the heterodyne thermoreflectance setup eliminates the mechanical translation stage to avoid associated artefacts. Neither that passage nor the setup description (p. 11) reports an approximately tenfold increase in data-acquisition speed. (LLM, conf=0.86)
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- Authors
- Pernot, G., Stoffel, M., Savic, I., Pezzoli, F., Chen, P., Savelli, G., Jacquot, A., Schumann, J., Denker, U., Mönch, I., Deneke, C., Schmidt, O. G., Rampnoux, J. M., Wang, S., Plissonnier, M., Rastelli, A., Dilhaire, S., & Mingo, N.
- Affiliations
- Centre National de la Recherche Scientifique (FR)
- Leibniz Institute for Solid State and Materials Research (DE)
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- Fraunhofer Institute for Physical Measurement Techniques (DE)
- Max Planck Institute for Solid State Research (DE)
- University of California, Santa Cruz (US)
- Corresponding author
- Rastelli, A.
- Dilhaire, S.
- Mingo, N.
- ORCID
- Venue
- Nature Materials
- Published
- 2010-05-02
- Volume
- 9
- Issue
- 6
- Pages
- 491-495
- ISSN
- 1476-1122 (ISSN-L)
- 1476-4660
- OpenAlex
- W2017969431
- Cited by
- 375
- References
- 42
- Citations by year
- 2026: 4 · 2025: 11 · 2024: 19 · 2023: 11 · 2022: 21 · 2021: 18 · 2020: 29 · 2019: 20 · 2018: 28 · 2017: 31 · 2016: 34 · 2015: 31 · 2014: 25 · 2013: 31 · 2012: 31
- FWCI
- 14.62
- Type
- journal article
- Language
- en
- Open access
- green
- hal.science
- Licence
- Locations
- Nature Materials (publishedVersion)
- PubMed (publishedVersion)
- HAL (submittedVersion, cc-by-nc-sa)
- Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) (submittedVersion)
- Oskar-Bordeaux (Universite de Bordeaux) (submittedVersion, cc-by-nc-sa)
- Fraunhofer-Publica (Fraunhofer-Gesellschaft) (submittedVersion)
- Funders
- Agence Nationale de la Recherche (ANR-06-NANO-0020, ANR-06-NANO-0054, ANR-06-BLAN-0129)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
- Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
- Keywords
- thermal conductivity control, phonon scattering, SiGe, silicon nanowires, nanostructuring, thermal resistance, diffuse mismatch model, low thermal conductivity
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