The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
Parallel beam approximation for V-shaped atomic force microscope cantilevers
Abstract
Due to its simplicity, the parallel beam approximation (PBA) is commonly used in the analytical evaluation of the spring constant of V-shaped atomic force microscope (AFM) cantilevers. However, the point of contention regarding the validity of the PBA is as yet an unresolved issue, which has been exacerbated by some recent contradictory reports. In this paper, we present a detailed investigation of the deflection properties of the V-shaped AFM cantilever, and in so doing, show that the PBA is in fact a valid and accurate approximation, provided the width and length of the parallel rectangular arms are chosen appropriately. As a direct consequence of this finding, we obtain exceedingly simple yet accurate formulas for the V-shaped cantilever, which will be of value to the users of the AFM.
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Cites
Timoshenko, S. P., & Goodier, J. N. (1934) · Virtual Defense Library (Ministerio de Defensa) · Cited by 13,717
Method for the calibration of atomic force microscope cantilevers
Sader, J. E., Larson, I., Mulvaney, P., & White, L. R. (1995) · Review of Scientific Instruments · doi:10.1063/1.1145439 · Cited by 1,000
Self-citationMicrofabrication of cantilever styli for the atomic force microscope
Albrecht, T. R., Akamine, S., Carver, T. E., & Quate, C. F. (1990) · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · doi:10.1116/1.576520 · Cited by 747
Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers
Neumeister, J. M., & Ducker, W. A. (1994) · Review of Scientific Instruments · doi:10.1063/1.1144646 · Cited by 334
The Bending and Stretching of Plates
Mansfield, E. H., Bisplinghoff, R. L., & Hemp, W. S. (1964) · Elsevier eBooks · doi:10.1016/c2013-0-07848-6 · Cited by 316
Theoretical analysis of the static deflection of plates for atomic force microscope applications
Sader, J. E., & White, L. (1993) · Journal of Applied Physics · doi:10.1063/1.354137 · Cited by 268
Self-citationScan speed limit in atomic force microscopy
BUTT, H. ‐., SIEDLE, P., SEIFERT, K., FENDLER, K., SEEGER, T., BAMBERG, E., WEISENHORN, A. L., GOLDIE, K., & ENGEL, A. (1993) · Journal of Microscopy · doi:10.1111/j.1365-2818.1993.tb03280.x · Cited by 233
Cited by
Calibration of rectangular atomic force microscope cantilevers
Sader, J. E., Chon, J. W. M., & Mulvaney, P. (1999) · Review of Scientific Instruments · doi:10.1063/1.1150021 · Cited by 2,145
Self-citationNoy, A., Vezenov, D. V., & Lieber, C. M. (1997) · Annual Review of Materials Science · doi:10.1146/annurev.matsci.27.1.381 · Cited by 478
Ziegler, C. (2004) · Analytical and Bioanalytical Chemistry · doi:10.1007/s00216-004-2694-y · Cited by 414
Elastic Modulus Determination of Normal and Glaucomatous Human Trabecular Meshwork
Last, J. A., Pan, T., Ding, Y., Reilly, C. M., Keller, K., Acott, T. S., Fautsch, M. P., Murphy, C. J., & Russell, P. (2011) · Investigative Opthalmology & Visual Science · doi:10.1167/iovs.10-6342 · Cited by 386
AFM: a versatile tool in biophysics
Alessandrini, A., & Facci, P. (2005) · Measurement Science and Technology · doi:10.1088/0957-0233/16/6/r01 · Cited by 384
Metadata
- Authors
- Sader, J. E.
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 1995-09-01
- Volume
- 66
- Issue
- 9
- Pages
- 4583-4587
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2017803183
- Cited by
- 260
- References
- 7
- FWCI
- 4.88
- Type
- journal article
- Language
- en
- Open access
- closed
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
