Cited by 228Thermal properties of materialsGaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Accurate dependence of gallium nitride thermal conductivity on dislocation density

Mion, C., Muth, J. F., Preble, E. A., Hanser, D.·2006·Applied Physics Letters

Abstract

The authors experimentally find that the thermal conductivity of gallium nitride depends critically on dislocation density using the 3-omega technique. For GaN with dislocation densities lower than 106cm−2, the thermal conductivity is independent with dislocation density. The thermal conductivity decreases with a logarithmic dependence for material with dislocation densities in the range of 107–1010cm−2. These results are in agreement with theoretical predictions. This study indicates that the hydride vapor phase epitaxy method offers an attractive route for the formation of semi-insulating gallium nitride with optimal thermal conductivity values around 230W∕mK and very low dislocation density near 5×104cm−2.

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Crossref · 10.1063/1.2335972

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Authors
Mion, C., Muth, J. F., Preble, E. A., & Hanser, D.
Affiliations
  • North Carolina State University (US)
  • Kyma Technologies (United States) (US)
Venue
Applied Physics Letters
Published
2006-08-28
Volume
89
Issue
9
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2046280597
Cited by
228
References
21
Citations by year
2026: 8 · 2025: 19 · 2024: 12 · 2023: 9 · 2022: 17 · 2021: 19 · 2020: 25 · 2019: 19 · 2018: 12 · 2017: 10 · 2016: 8 · 2015: 9 · 2014: 8 · 2013: 13 · 2012: 13
FWCI
3.06
Type
journal article
Language
en
Open access
closed
Locations
Applied Physics Letters (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › GaN-based semiconductor devices and materials
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
Keywords
gallium nitride, thermal conductivity, dislocation density, semi-insulating GaN, hydride vapor phase epitaxy, logarithmic dependence, crystal defects

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