Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 642

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices

Ielmini, Daniele, Zhang, Yuegang·2007·Journal of Applied Physics

Abstract

Chalcogenide materials are receiving increasing interest for their many applications as active materials in emerging memories, such as phase-change memories, programmable metallization cells, and cross-point devices. The great advantage of these materials is the capability to appear in two different phases, the amorphous and the crystalline phases, with rather different electrical properties. The aim of this work is to provide a physically based model for conduction in the amorphous chalcogenide material, able to predict the current-voltage (I−V) characteristics as a function of phase state, temperature, and cell geometry. First, the trap-limited transport at relatively low currents (subthreshold regime) is studied, leading to a comprehensive model for subthreshold conduction accounting for (a) the shape of the I−V characteristics, (b) the measured temperature dependence, (c) the dependence of subthreshold slope on the thickness of the amorphous phase, and (d) the voltage dependence of the activation energy. The threshold switching mechanism is then explained by the nonequilibrium population in high-mobility shallow traps at high electric field and by the nonuniform field distribution along the amorphous layer thickness. A single analytical model is then shown which is able to account for subthreshold conduction, threshold switching, negative differential resistance region, and ON regime. The model can be applied for fast yet physically based computation of the current in chalcogenide-based devices (e.g., phase change memory cells and arrays) as a function of applied voltage, temperature, and programmed state.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1063/1.2773688

Cites

1 of 1 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 1 references

Research works printed but not linked: 35

  1. 2003, Tech. Dig. - Int. Electron Devices Meet., 2003, 255
  2. 2001, Tech. Dig. - Int. Electron Devices Meet., 2001, 803
  3. 2006, Solid-State Electron., 50, 24, 10.1016/j.sse.2005.10.046 · doi:10.1016/j.sse.2005.10.046
  4. 2003, Tech. Dig. - Int. Electron Devices Meet., 2003, 905
  5. 1968, Phys. Rev. Lett., 21, 1450, 10.1103/PhysRevLett.21.1450 · DOI · Paper page
  6. 1996, Mater. Res. Soc. Symp. Proc., 21, 48
  7. 2004, IEEE Trans. Electron Devices, 51, 452, 10.1109/TED.2003.823243 · DOI · Paper page
  8. 2005, Solid-State Electron., 49, 1826, 10.1016/j.sse.2005.10.013 · doi:10.1016/j.sse.2005.10.013
  9. 2007, IEEE Trans. Electron Devices, 54, 308, 10.1109/TED.2006.888752 · DOI · Paper page
  10. 2003, Tech. Dig. - Int. Electron Devices Meet., 2003, 893
  11. 2004, IEEE Electron Device Lett., 25, 507, 10.1109/LED.2004.831219 · DOI
  12. 2005, IEEE Electron Device Lett., 26, 799, 10.1109/LED.2005.857719 · DOI
  13. 2004, IEEE Electron Device Lett., 25, 684, 10.1109/LED.2004.836032 · DOI
  14. 2004, Tech. Dig. - Int. Electron Devices Meet., 2004, 911, 10.1109/IEDM.2004.1419330 · doi:10.1109/iedm.2004.1419330
  15. 2006, Tech. Dig. - Int. Electron Devices Meet., 2006, 401
  16. 2005, J. Appl. Phys., 97, 093509, 10.1063/1.1884248 · doi:10.1063/1.1884248
  17. 1976, J. Phys. D, 9, 2587, 10.1088/0022-3727/9/18/008 · doi:10.1088/0022-3727/9/18/008
  18. 1973, J. Vac. Sci. Technol., 10, 728, 10.1116/1.1318423 · doi:10.1116/1.1318423
  19. 1969, Phys. Rev. Lett., 22, 1065, 10.1103/PhysRevLett.22.1065 · DOI · Paper page
  20. 1991, IEE Proc., 138, 127
  21. 1971, Thin Solid Films, 8, R21, 10.1016/0040-6090(71)90115-5 · DOI
  22. 2006, IEEE Trans. Electron Devices, 53, 3032, 10.1109/TED.2006.885527 · DOI
  23. 2006, IEEE Trans. Electron Devices, 53, 3040, 10.1109/TED.2006.885525 · DOI
  24. 2004, IEEE Trans. Electron Devices, 51, 714, 10.1109/TED.2004.825805 · DOI · Paper page
  25. 2007, Appl. Phys. Lett., 90, 192102, 10.1063/1.2737137 · DOI · Paper page
  26. 1973, IEEE Trans. Electron Devices, 20, 123, 10.1109/T-ED.1973.17618 · doi:10.1109/t-ed.1973.17618
  27. 1980, J. Appl. Phys., 51, 3289, 10.1063/1.328036 · DOI · Paper page
  28. 1978, Rev. Mod. Phys., 50, 209, 10.1103/RevModPhys.50.209 · DOI · Paper page
  29. 1971, J. Phys. C, 4, 1331, 10.1088/0022-3719/4/11/008 · DOI
  30. 1971, J. Phys. C, 4, 1341, 10.1088/0022-3719/4/11/009 · doi:10.1088/0022-3719/4/11/009
  31. 1973, J. Phys. C, 6, 3491, 10.1088/0022-3719/6/23/023 · doi:10.1088/0022-3719/6/23/023
  32. 1969, J. Appl. Phys., 40, 278, 10.1063/1.1657043 · DOI · Paper page
  33. 2005, Jpn. J. Appl. Phys., Part 1, 44, 7340, 10.1143/JJAP.44.7340 · DOI · Paper page
  34. 1974, Phys. Rev. Lett., 32, 1429, 10.1103/PhysRevLett.32.1429 · doi:10.1103/physrevlett.32.1429
  35. 2005, Nat. Mater., 4, 347, 10.1038/nmat1350 · DOI · Paper page

Cited by

See all 642

Metadata

Authors
Ielmini, D., & Zhang, Y.
Venue
Journal of Applied Physics
Published
2007-09-01
Volume
102
Issue
5
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2070339839
Cited by
642
References
1
FWCI
13.89
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices. https://app.cochat.ai/papers/10.1063/1.2773688
The paper
Ielmini, D., & Zhang, Y. (2007). Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices. Journal of Applied Physics. https://doi.org/10.1063/1.2773688

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.