The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.
A frequency-domain thermoreflectance method for the characterization of thermal properties
Abstract
A frequency-domain thermoreflectance method for measuring the thermal properties of homogenous materials and submicron thin films is described. The method can simultaneously determine the thermal conductivity and heat capacity of a sample, provided the thermal diffusivity is ≳3×10−6 m2/s, and can also simultaneously measure in-plane and cross-plane thermal conductivities, as well the thermal boundary conductance between material layers. Two implementations are discussed, one based on an ultrafast pulsed laser system and one based on continuous-wave lasers. The theory of the method and an analysis of its sensitivity to various thermal properties are given, along with results from measurements of several standard materials over a wide range of thermal diffusivities. We obtain specific heats and thermal conductivities in good agreement with literature values, and also obtain the in-plane and cross-plane thermal conductivities for crystalline quartz.
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In the citing paper
“The transient thermoreflectance technique can be implemented as both the TDTR method 22, 24, 25 and the frequency-domain thermoreflectance (FDTR) method 93, 94 (see Section III(A) for more details of FDTR).”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [93]
In the citing paper
“By holding the delay stage at a fixed location, an ultrafast-laser-based TDTR can also be implemented as FDTR. 93”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [93]
In the citing paper
“With the advancement of pico-and femtosecond pulsed laser after 1980, this technique has been widely used for studying non-equilibrium electron-phonon interaction [89,90], detecting coherent phonon transport [91][92][93] and thermal transport across interfaces [94][95][96] .”
From Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016) · cites this paper as [96]
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Metadata
- Authors
- Schmidt, A. J., Cheaito, R., & Chiesa, M.
- Affiliations
- Masdar Institute of Science and Technology (AE)
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2009-09-01
- Volume
- 80
- Issue
- 9
- Pages
- 094901-094901
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2036784309
- Cited by
- 543
- References
- 23
- Citations by year
- 2026: 67 · 2025: 73 · 2024: 67 · 2023: 50 · 2022: 48 · 2021: 35 · 2020: 43 · 2019: 33 · 2018: 25 · 2017: 26 · 2016: 14 · 2015: 12 · 2014: 12 · 2013: 17 · 2012: 9
- FWCI
- 3.39
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Review of Scientific Instruments (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Mechanical Engineering › Mechanical and Thermal Properties Analysis
- Keywords
- frequency-domain thermoreflectance, thermal conductivity, heat capacity, thermal diffusivity, through-plane thermal conductivity, in-plane thermal conductivity, thermal boundary conductance, crystalline quartz, thermal properties measurement
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
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