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A frequency-domain thermoreflectance method for the characterization of thermal properties
Abstract
A frequency-domain thermoreflectance method for measuring the thermal properties of homogenous materials and submicron thin films is described. The method can simultaneously determine the thermal conductivity and heat capacity of a sample, provided the thermal diffusivity is ≳3×10−6 m2/s, and can also simultaneously measure in-plane and cross-plane thermal conductivities, as well the thermal boundary conductance between material layers. Two implementations are discussed, one based on an ultrafast pulsed laser system and one based on continuous-wave lasers. The theory of the method and an analysis of its sensitivity to various thermal properties are given, along with results from measurements of several standard materials over a wide range of thermal diffusivities. We obtain specific heats and thermal conductivities in good agreement with literature values, and also obtain the in-plane and cross-plane thermal conductivities for crystalline quartz.
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“The transient thermoreflectance technique can be implemented as both the TDTR method 22, 24, 25 and the frequency-domain thermoreflectance (FDTR) method 93, 94 (see Section III(A) for more details of FDTR).”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [93]
In the citing paper
“By holding the delay stage at a fixed location, an ultrafast-laser-based TDTR can also be implemented as FDTR. 93”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [93]
In the citing paper
“With the advancement of pico-and femtosecond pulsed laser after 1980, this technique has been widely used for studying non-equilibrium electron-phonon interaction [89,90], detecting coherent phonon transport [91][92][93] and thermal transport across interfaces [94][95][96] .”
From Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016) · cites this paper as [96]
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Metadata
- Authors
- Schmidt, A. J., Cheaito, R., & Chiesa, M.
- Affiliations
- Masdar Institute of Science and Technology (AE)
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2009-09-01
- Volume
- 80
- Issue
- 9
- Pages
- 094901-094901
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2036784309
- Cited by
- 543
- References
- 23
- Citations by year
- 2026: 67 · 2025: 73 · 2024: 67 · 2023: 50 · 2022: 48 · 2021: 35 · 2020: 43 · 2019: 33 · 2018: 25 · 2017: 26 · 2016: 14 · 2015: 12 · 2014: 12 · 2013: 17 · 2012: 9
- FWCI
- 3.39
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Review of Scientific Instruments (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Mechanical Engineering › Mechanical and Thermal Properties Analysis
- Keywords
- frequency-domain thermoreflectance, thermal conductivity, heat capacity, thermal diffusivity, through-plane thermal conductivity, in-plane thermal conductivity, thermal boundary conductance, crystalline quartz, thermal properties measurement
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