The DOI matches its Crossref record; 30 of the 30 references it cites were found in a registry or an index.
Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films
Abstract
The thermal conductivity of thin films and interface thermal conductance of dissimilar materials play a critical role in the functionality and the reliability of micro/nanomaterials and devices. The ultrafast laser-based thermoreflectance techniques, including the time-domain thermoreflectance (TDTR) and the frequency-domain thermoreflectance (FDTR) techniques are excellent approaches for the challenging measurements of interface thermal conductance of dissimilar materials. Both TDTR and FDTR signals on a trilayer structure which consists of a thin film metal transducer, a target thin film, and a substrate are studied by a thermal conduction model. The sensitivity of TDTR signals to the thermal conductivity of thin films is analyzed to show that the modulation frequency needs to be selected carefully for a high precision TDTR measurement. However, such a frequency selection, which is closely related to the unknown thermal properties and consequently hard to make before TDTR measurement, can be avoided in FDTR measurement. We also found out that in FDTR method, the heat transport in a trilayer structure could be divided into three regimes, and the thermal conductivity of thin films and interface thermal conductance can be obtained subsequently by fitting the data in different frequency range of one FDTR measurement, based on the regime map. Both TDTR and FDTR measurements are then conducted along with the analysis to obtain the thermal conductivity of SiO2 thin films and interface thermal conductance between SiO2 and Si. FDTR measurement results agree well with the TDTR measurements, but promises to be a much easier implementation than TDTR measurements.
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In the citing paper
“Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces.”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [25]
In the citing paper
“Both the two-tint and the two-color approach can effectively filter the reflected pump beam but at a significant sacrifice of the laser power.”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [25]
In the citing paper
“The transient thermoreflectance technique can be implemented as both the TDTR method 22, 24, 25 and the frequency-domain thermoreflectance (FDTR) method 93, 94 (see Section III(A) for more details of FDTR).”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [25]
In the citing paper
“The transient thermoreflectance technique can be implemented as both time-domain thermoreflectance (TDTR) method [104,105] and frequency-domain thermoreflectance (FDTR) method [98,106].”
From Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016) · cites this paper as [104]
Citations
Cites
Carslaw, H. S., & Jaeger, J. C. (1947) · International Linear Collider · Cited by 19,877
Cahill, D. G., Ford, W. K., Goodson, K. E., Mahan, G. D., Majumdar, A., Maris, H. J., Merlin, R., & Phillpot, S. R. (2003) · Journal of Applied Physics · doi:10.1063/1.1524305 · Cited by 2,825
Encyclopedia of Nanoscience and Nanotechnology
(2013) · Chemical & Engineering News · doi:10.1021/cen-09136-ad11 · Cited by 2,546
Encyclopedia of nanoscience and nanotechnology
(2005) · Choice Reviews Online · doi:10.5860/choice.42-2552a · Cited by 2,113
Thermal conductivity measurement from 30 to 750 K: the 3ω method
Cahill, D. G. (1990) · Review of Scientific Instruments · doi:10.1063/1.1141498 · Cited by 1,928
Analysis of heat flow in layered structures for time-domain thermoreflectance
Cahill, D. G. (2004) · Review of Scientific Instruments · doi:10.1063/1.1819431 · Cited by 1,543
Ultralow Thermal Conductivity in Disordered, Layered WSe 2 Crystals
Chiritescu, C., Cahill, D. G., Nguyen, N., Johnson, D., Bodapati, A., Keblinski, P., & Zschack, P. (2007) · Science · doi:10.1126/science.1136494 · Cited by 854
Thermal conductivity of amorphous solids above the plateau
Cahill, D. G., & Pohl, R. O. (1987) · Physical Review B · doi:10.1103/physrevb.35.4067 · Cited by 813
Heat transport in thin dielectric films
Lee, S.-M., & Cahill, D. G. (1997) · Journal of Applied Physics · doi:10.1063/1.363923 · Cited by 732
Schmidt, A. J., Chen, X., & Chen, G. (2008) · Review of Scientific Instruments · doi:10.1063/1.3006335 · Cited by 655
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Foss, C. J. (2021) · ScholarWorks@UMassAmherst (University of Massachusetts Amherst) · doi:10.7275/12767285 · Cited by 1
Experimental study of ultrafast carrier dynamics in polycrystalline ZnTe nanofilm
Lin, J. H., Dawei, T., & Xing, Z. (2015) · Acta Physica Sinica · doi:10.7498/aps.64.087802
Effects of the thermal annealing on the thermoelectric properties of Ga-doped ZnO thin films
Nguyen, N. H., Lê, T. N. B., & Phan, T. B. (2019) · Science and Technology Development Journal - Natural Sciences · doi:10.32508/stdjns.v2i4.823
Quantitative Thermal Transport Measurements in Nanostructures
Spièce, J. (2019) · Springer theses · doi:10.1007/978-3-030-30813-1_4
Effects of Ultrathin Interlayers on Thermal Boundary Conductance at Metal-Dielectric Interfaces
Oommen, S. M. (2019) · York University Digital Library (York University)
Nonequilibrium Energy Transfer in Nanostructures
Zhang, Z. M. (2020) · Mechanical engineering series · doi:10.1007/978-3-030-45039-7_7
Materials issues in thermal modeling of thin film electrocaloric solid-state refrigerators
Suchaneck, G., Felsberg, L., & Gerlach, G. (2020) · Izvestiya Vysshikh Uchebnykh Zavedenii Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering · doi:10.17073/1609-3577-2020-1-57-70
Upper limits to thermal conductance across gallium nitride interfaces: Predictions and measurements
OLSON, D. H. L., Giri, A., Tomko, J. A., Gaskins, J. T., Ahmad, H., Doolittle, W. A., & Hopkins, P. E. (2022) · Elsevier eBooks · doi:10.1016/b978-0-12-821084-0.00004-4
Yu, Y., & Nagayama, G. (2022) · Proceedings of International Exchange and Innovation Conference on Engineering & Sciences (IEICES) · doi:10.5109/5909104
Qu, F., Fu, J., Huang, P., Lu, Y., Wang, X., & Chen, D. (2023) · Journal of Micromechanics and Microengineering · doi:10.1088/1361-6439/acb958
Direct Measurement of In-Plane Thermal Conductivity of Suspended Thin Films Using a Novel 3ω MethodPreprint
Wang, J., Ren, C., Ma, S., Xu, R., Liu, Y., & Zhang, Y. (2023) · SSRN Electronic Journal · doi:10.2139/ssrn.4535906
Yu, J., Hanafusa, H., & Higashi, S. (2023) · IEEE China International Youth Conference on Electrical Engineering (CIYCEE) · doi:10.1109/ciycee59789.2023.10401430
Verma, S. K., Chae, S., & Kandadai, N. (2024) · Frontiers in Optics · doi:10.1364/fio.2024.jtu5a.10
Tanjaya, N. K., Bisignano, I., & Ishii, S. (2025) · Optics & Laser Technology · doi:10.1016/j.optlastec.2025.113292
Direct thermal resistance measurment of a single ripplocation in graphitePreprint
Bai, T., Zhang, T., Pei, S., Mao, R., Liu, F., Li, J., Shi, R., Du, J., Xian, L., Ren, W., et al. (2025) · Research Square · doi:10.21203/rs.3.rs-7433026/v1
Steady State Temperature Influence on Modulated Photothermal Radiometry
Corona, J., & Kandadai, N. (2025) · IEEE Open Journal of Instrumentation and Measurement · doi:10.1109/ojim.2025.3643076
Light propagation and heat conduction across multilayered structures in pump-probe thermoreflectance
Guo, X., Yang, H., Yao, Y., Liu, T., Yang, R., & Qian, X. (2026) · Materials Today Physics · doi:10.1016/j.mtphys.2026.102018 · Cited by 1
Self-citationWu, J., Lee, F.-S., Lee, C.-H., & Zhu, Y. (2026) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2026.128475
Munde, R., Chuang, H.-R., & Islam, R. (2026) · Journal of Applied Physics · doi:10.1063/5.0312015
Transport de chaleur dans les nano-couches minces excitées par une source laser d'intensité modulée
Alaili, K. (2019) · theses.fr (ABES) · doi:10.70675/9c339fc3z4bdfz4e3aza119zbcfb670f678b
Theoretical investigation of thermal transport in novel semiconductors with point defects
Fava, M. (2021) · theses.fr (ABES) · doi:10.70675/09341999z077cz4d24zac88zd1b4cff52fb4
Mozafarifard, M., & Wang, Y. (2026) · International Journal of Thermal Sciences · doi:10.1016/j.ijthermalsci.2026.111090
Hasegawa, K., Hirai, T., Ando, F., Takahashi, R., Takahara, N., & Uchida, K. (2026) · Annual IEEE Semiconductor Thermal Measurement and Management Symposium/Proceedings · doi:10.23919/semi-therm71268.2026.11573126
Liu, T., Chen, F., Li, J., & Tong, C. (2026) · Advanced Scientific Instruments · doi:10.1016/j.asi.2026.100037
Wilson, R. W., Kelleher-Ferguson, J., Wu, E. C., & Schwartz, B. J. (2026) · Chemistry of Materials · doi:10.1021/acs.chemmater.6c01465
Interfacial thermal transport spectroscopy: a review of theory and experiment
Xu, Y., Xiang, X., Liu, W., Zhu, Y., Hu, Y., Li, M., Ma, H., Cao, B., & Zhou, Y. (2026) · Physical Chemistry Chemical Physics · doi:10.1039/d6cp02619b
Wang, Z., Fu, L., Zhu, J., & Tang, D. (2026) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2026.129548
Self-citationInfrared phonon thermoreflectance in polar dielectrics
Anonymous, Hutchins, W. D., Hirt, D., Golightly, E., & Hopkins, P. E. (2026) · Physical review. B./Physical review. B · doi:10.1103/y7mq-qc1r
Chen, Y., Li, H., Liang, G., Shang, Y., Fang, Z., Zhang, J., Zhong, L., Chen, H., Dai, J., Yu, X., et al. (2026) · Surfaces and Interfaces · doi:10.1016/j.surfin.2026.110696
Kim, H., Park, H. M., Joo, K.-N., & Oh, D. (2026) · Case Studies in Thermal Engineering · doi:10.1016/j.csite.2026.108547
Anisotropic Thermal Properties of Electrically Insulating Thin Films and Sheets: A Review
Sripada, S., Davis, C. R., Gaitonde, A. U., & Marconnet, A. M. (2026) · Small Methods · doi:10.1002/smtd.71012
Metadata
- Authors
- Zhu, J., Tang, D., Wang, W., Liu, J., Holub, K. W., & Yang, R.
- Affiliations
- University of Colorado Boulder (US)
- Chinese Academy of Sciences (CN)
- University of Colorado at Boulder 1 Department of Mechanical Engineering, , Colorado 80309, USA
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2010-11-01
- Volume
- 108
- Issue
- 9
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W1998608423
- Cited by
- 232
- References
- 30
- Citations by year
- 2026: 20 · 2025: 22 · 2024: 23 · 2023: 24 · 2022: 28 · 2021: 16 · 2020: 17 · 2019: 18 · 2018: 15 · 2017: 12 · 2016: 11 · 2015: 9 · 2014: 6 · 2013: 7 · 2012: 1
- FWCI
- 1.73
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Applied Physics (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Mechanics of Materials › Thermoelastic and Magnetoelastic Phenomena
- Keywords
- time-domain thermoreflectance, frequency-domain thermoreflectance, thermal conductivity, interface thermal conductance, thin films, three-layer structure, SiO2 thin films, Si/SiO2 interface, thermal conduction model
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