Cited by 18Neuroscience and Neural EngineeringAdvanced MEMS and NEMS Technologies3D IC and TSV technologies

A low-profile three-dimensional neural probe array using a silicon lead transfer structure

Open access
Cheng, Ming-Yuan, Je, Minkyu, Tan, Kwan Ling, Tan, Ee Lim, Lim, Ruiqi, Yao, Lei, Li, Peng, Park, Woo-Tae +3 more·2013·Journal of Micromechanics and Microengineering

Abstract

This paper presents a microassembly method for low-profile three-dimensional probe arrays for neural prosthesis and neuroscience applications. A silicon (Si) lead transfer structure, Si interposer, is employed to form electrical connections between two orthogonal planes—the two dimensional probes and the dummy application-specific integrated circuit (ASIC) chip. In order to hold the probe array and facilitate the alignment of probes during assembly, a Si platform is designed to have through-substrate slots for the insertion of probes and cavities for holding the Si interposers. The electrical interconnections between the probes and the dummy ASIC chip are formed by solder reflow, resulting in greatly improved throughput in the proposed assembly method. Moreover, since the backbone of the probe can be embedded inside the cavity of the Si platform, the profile of the probe array above the cortical surface can be controlled within 750 µm. This low-profile allows the probe array not to touch the skull after it is implanted on the brain. The impedance of the assembled probe is also measured and discussed.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1088/0960-1317/23/9/095013

Cites

25 of 25 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

Research works printed but not linked: 1

  1. Lee K, Singh A, He J P, Massia S, Kim B and Raupp G 2004 Polyimide based neural implants with stiffness improvement Sensors Actuators B 102 67-72 · DOI

Cited by

Sorted by citations

Authors
Cheng, M.-Y., Je, M., Tan, K. L., Tan, E. L., Lim, R., Yao, L., Li, P., Park, W.-T., Phua, E. J. R., Gan, C. L., & Yu, A.
Affiliations
  • Agency for Science, Technology and Research (SG)
  • Seoul National University of Science and Technology (KR)
  • Nanyang Technological University (SG)
Corresponding author
Cheng, Ming-Yuan
Venue
Journal of Micromechanics and Microengineering
Published
2013-08-06
Volume
23
Issue
9
Pages
095013
ISSN
  • 0960-1317 (ISSN-L)
  • 1361-6439
OpenAlex
W2143885441
Cited by
18
References
25
Citations by year
2025: 1 · 2024: 1 · 2023: 1 · 2021: 1 · 2020: 1 · 2019: 2 · 2018: 1 · 2017: 3 · 2016: 3 · 2015: 2 · 2014: 2
FWCI
1.14
Type
journal article
Language
en
Open access
Locations
  • Journal of Micromechanics and Microengineering (publishedVersion)
  • DR-NTU (Nanyang Technological University) (submittedVersion)
Funders
Agency for Science, Technology and Research
Topics
  • Life Sciences › Neuroscience › Cellular and Molecular Neuroscience › Neuroscience and Neural Engineering
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced MEMS and NEMS Technologies
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › 3D IC and TSV technologies
Keywords
silicon interposer, microassembly, neural prosthesis, probe impedance, application-specific integrated circuits, neural implants

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review