The DOI matches its Crossref record; 56 of the 58 references it cites were found in a registry or an index.
WinCLIP: Zero-/Few-Shot Anomaly Classification and Segmentation
Open accessAbstract
Visual anomaly classification and segmentation are vital for automating industrial quality inspection. The focus of prior research in the field has been on training custom models for each quality inspection task, which requires task-specific images and annotation. In this paper we move away from this regime, addressing zero-shot and few-normal-shot anomaly classification and segmentation. Recently CLIP, a vision-language model, has shown revolutionary generality with competitive zero-/few-shot performance in comparison to full-supervision. But CLIP falls short on anomaly classification and segmentation tasks. Hence, we propose window-based CLIP (WinCLIP) with (1) a compositional ensemble on state words and prompt templates and (2) efficient extraction and aggregation of window/patch/image-level features aligned with text. We also propose its few-normal-shot extension Win-CLIP+, which uses complementary information from normal images. In MVTec-AD (and VisA), without further tuning, WinCLIP achieves 91.8%/85.1% (78.1%/79.6%) AU-ROC in zero-shot anomaly classification and segmentation while WinCLIP + does 93.1%/95.2% (83.8%/96.4%) in 1-normal-shot, surpassing state-of-the-art by large margins.
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Deep Industrial Image Anomaly Detection: A Survey
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Metadata
- Authors
- Jeong, J., Zou, Y., Kim, T., Zhang, D., Ravichandran, A., & Dabeer, O.
- Affiliations
- Korea Advanced Institute of Science and Technology (KR)
- Amazon (United States) (US)
- Venue
- 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
- Publisher
- IEEE
- Published
- 2023-06
- Pages
- 19606-19616
- ISSN
- 1063-6919 (ISSN-L)
- OpenAlex
- W4386065385
- Semantic Scholar
- aa207668318fec38d60b79f407fb64982e46fce9
- Cited by
- 585
- References
- 58
- Citations by year
- 2026: 286 · 2025: 206 · 2024: 89 · 2023: 4
- FWCI
- 253.73
- Type
- conference paper
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- arXiv (Cornell University)
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
- Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
- Keywords
- anomaly segmentation, zero-shot learning, few-shot learning, CLIP, vision-language models, prompt templates, industrial inspection, MVTec AD, Visa
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